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采用XPS与接触角法研究氟聚合物表面结构与性能
引用本文:张庆华,刘龙孝,陈丰秋,詹晓力. 采用XPS与接触角法研究氟聚合物表面结构与性能[J]. 高等学校化学学报, 2006, 27(4): 790-792
作者姓名:张庆华  刘龙孝  陈丰秋  詹晓力
作者单位:浙江大学化工系,杭州,310027;浙江大学化工系,杭州,310027;浙江大学化工系,杭州,310027;浙江大学化工系,杭州,310027
基金项目:国家自然科学基金(批准号:20376070),浙江省自然科学基金(批准号:404295)资助
摘    要:
本文采用接触角和变角XPS方法对FA共聚物的表面能、 表面微相结构做了进一步的研究.

关 键 词:氟聚合物  表面能  接触角  X射线光电子能谱
文章编号:0251-0790(2006)04-0790-03
收稿时间:2005-04-05
修稿时间:2005-04-05

Surface Structure and Properties of Fluorocopolymers Studied by XPS and Contact Angle
ZHANG Qing-Hua,LIU Long-Xiao,CHEN Feng-Qiu,ZHAN Xiao-Li. Surface Structure and Properties of Fluorocopolymers Studied by XPS and Contact Angle[J]. Chemical Research In Chinese Universities, 2006, 27(4): 790-792
Authors:ZHANG Qing-Hua  LIU Long-Xiao  CHEN Feng-Qiu  ZHAN Xiao-Li
Affiliation:Department of Chemical Engineering, Zhejiang University, Hangzhou 310027, China
Abstract:
The surface composition and properties of the copolymer miniemulsions containing fluorinated acrylate(FA) were investigated by X-ray photoelectron spectroscopy(XPS) and contact angle measurements.The surface energy of these copolymers was calculated by the harmonic equation from the static contact angles.The surfaces of the copolymers are very hydrophobic even with a low content of FA due to the surface enrichment of FA segments.The surface energy of copolymers decreases drastically with the increase of FA content and can reach 11.6 mN/m when the concentration of FA in copolymerization increases to 17.54%.The element composition and surface segregation of the fluorinated component as a function of depth of fluorocopolymer thick films were investigated by angle-dependent XPS.The content of fluorine on the surface of copolymers was higher than the calculated value according to the feeds.Our analyses demonstrate that the side groups containing fluorine tend to enrich on the copolymer-air interface.The surface segregation is enhanced when the samples are annealed,which results in further decrease of surface energy.
Keywords:Fluorocopolymer  Surface energy  Contact angle  X-ray photoelectron spectroscopy  
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