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Comparative studies on Zn0.95Co0.05O thin films on C- and R-sapphire substrates
Authors:Peng Ying-Zi  Thomas Liew  Song Wen-Dong  Chong Tow Chong
Affiliation:[1]Data Storage Instit u re, DSI Building, 5 Engineering Drive 1, Singapore 117608 [2]Electrical and Computer Engineering Department, National University of Singapore, Singapore 119260 [3]School of Science, Hangzhou Dianzi University, Hangzhou 310018, China
Abstract:Zn_0.95Co_0.05O precipitate-free single crystalthin films were synthesized by a dual beam pulsed laser depositionmethod. The films form a wurtzite structure whose hexagonal axis isperpendicular or parallel to the plane of the surface depending onthe C-plane (0001) or R-plane (11bar 20) sapphire substrate. Basedon the results of high-resolution transmission electron microscopyand x-ray diffraction, C-plane films show larger lattice mismatch.The films exhibit magnetic and semiconductor properties at roomtemperature. The coercivity of the film is about 8000 A/m at roomtemperature. They are soft magnetic materials with small remanentsquareness S for both crystal orientations. There is no evidence toshow that the anisotropy is fixed to the hexagonal axis (C-axis) forthe wurtzite structure.
Keywords:Co-doped ZnO thin films   diluted magnetic semiconductor  anisotropy
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