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Role of long-range shear stresses in the plastic deformation of epitaxial films
Authors:A.?S.?Ilin,A.?V.?Kolesnikov,E.?M.?Trukhanov  author-information"  >  author-information__contact u-icon-before"  >  mailto:trukh@isp.nsc.ru"   title="  trukh@isp.nsc.ru"   itemprop="  email"   data-track="  click"   data-track-action="  Email author"   data-track-label="  "  >Email author,I.?D.?Loshkarev
Affiliation:1.Rzhanov Institute of Semiconductor Physics, Siberian Branch,Russian Academy of Sciences,Novosibirsk,Russia
Abstract:The dependence of elastic energy on relaxation parameters ρ x and ρ y varying in limits from 0 to 1 is analyzed for near-surface layers of an In0.1Ga0.9As epitaxial film on a GaAs (001) substrate whose thickness exceeds the distance between neighboring misfit dislocations.
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