Effect of molecular orientation distribution and crystallinity on the measurement of the crystal lattice modulus of nylon 6 by x-ray diffraction

The crystal lattice modulus of nylon 6 (-type) was measured by x-ray diffraction using nylon 6 films drawn up to five times. The measured crystal lattice modulus was 173–175 GPa for all specimens whose crystallinity and the Young's modulus were beyond 46% and 3.75 GPa, respectively. These results indicate that a state of homogenous stress can be achieved. In contrast, the values were scattered for the speciments whose crystallinity and Young's modulus are less than the above values. To study the origin, a numerical calculation of the crystal lattice modulus, as measured by x-ray diffraction, was carried out by considering effects on the orientation factors of molecular chains and crystallinity. In this calculation, a previously introduced model was employed, in which oriented crystalline layers are surrounded by oriented amorphous phases so that the strains of the two phases at the boundary are identical. The theoretical results calculated by the introduced model indicated that the crystal lattice modulus by x-ray diffraction is almost equal to the intrinsic crystal modulus if the morphology of the test specimen can be represented as a series model. In contrast, if a parallel model is more appropriate, the difference between the measured modulus and the intrinsic value can be pronounced. Such morphological dependence was found to be less pronounced with increasing high degree of molecular orientation and crystallinity.