Trace Analysis by Heavy Ion Induced X-Ray Emission |
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Authors: | Klaus H Ecker Hans-Peter Weise Karl L Merkle |
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Institution: | (1) Federal Institute of Materials-Research and Testing (BAM), D-12205 Berlin, Germany, DE;(2) Materials Science Division, Argonne National Laboratory (ANL), Argonne, Illinios, USA, US |
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Abstract: | Various K-, L- and M-shell X-ray production cross sections are measured for heavy ion impact on elements in the range Z
2 = 13 to 83. The ion species range from Z
1 = 10 to 36, and ion energies from 1 to 16 MeV are used. Enhanced cross sections are observed when the projectile K- or L-
binding energy is similar to the energy of the target K-, L- or M-shell. This effect is used to improve the analysis sensitivity
for selected elements. As an example trace analysis of Fe in glass with V, Mn, Co and Ni ions is investigated. Results are
compared with proton induced X-ray emission analysis on the same samples. In these samples Fe-Kα X-ray production is similar for irradiation with 3 MeV protons and 14 MeV Ni ions. However the signal to background ratio
is four times higher for the irradiation with Ni ions as compared to irradiation with protons. Advantages and drawbacks of
heavy ion induced X-ray emission for quantitative analysis compared to proton induced X-ray emission analysis are discussed. |
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Keywords: | : PIXE heavy ion X-ray production cross sections trace analysis PACS: 32 80Hd |
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