Single-electron transistor spectroscopy of InGaAs self-assembled quantum dots |
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Authors: | K. D. Osborn Mark W. Keller R. P. Mirin |
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Affiliation: | National Institute of Standards and Technology, Boulder, CO 80305-3337, USA |
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Abstract: | A single-electron transistor (SET) is used to detect tunneling of single electrons into individual InGaAs self-assembled quantum dots (QDs). By using an SET with a small island area and growing QDs with a low density we are able to distinguish and measure three QDs. The bias voltage at which resonant tunneling into the dots occurs can be shifted using a surface gate electrode. From the applied voltages at which we observe electrons tunneling, we are able to measure the electron addition energies of three QDs. |
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Keywords: | Author Keywords: Self-assembled InGaAs Quantum dot Single-electron transistor |
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