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Investigation of Correlation of Test Sequences for Reliability Testing of Digital Physical System Components |
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| Authors: | Kushik N. G. López J. E. Yevtushenko N. V. |
| Affiliation: | 1.National Research Tomsk State University, Tomsk, Russia ;2.Telecom Sud Paris, évry, France ; |
| Abstract: | Russian Physics Journal - The topical problem of effective verification of digital circuits of different physical systems remains a hot topic. Devices ranging from embedded components to perform... |
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