| Institution: | 1. Unité de Spectroscopie Raman, Faculté des Sciences de Tunis, ElManar1, 2092 Tunis, Tunisia;2. Groupe d’Etude de la Matière Condensée (GEMAC), CNRS-Université de Versailles St Quentin, 45 avenue des Etats-Unis, 78035Versailles Cedex, France;3. Physics Department, Faculty of Sciences - King Abdulaziz University (Jeddah North Branch), P. O. Box 15758, Jeddah 21454, Saudi Arabia;1. Unité de Recherche 99/UR12-30, Faculté des Sciences de Bizerte, Université de Carthage, 7021 Jarzouna, Tunisia;2. Laboratoire des Sciences des Procédés et Matériaux, LSPM, CNRS, UPR 3407, Université Paris XIII, 99 Avenue J.B. Clément, 93430 Villetaneuse, France;3. Département de Chimie des Matériaux Inorganiques, IPCMS, UMR 7504, CNRS–UDS, 23, rue du Loess, BP 43, Strasbourg Cedex 2, France;4. Institut des Matériaux Jean Rouxel (IMN)-UMR 6502, Université de Nantes, CNRS, 2 rue de la Houssinière, BP 32229, 44322 Nantes Cedex 3, France;5. LCMCP, Chimie-Paristech, UPMC, Collège de France, UMR CNRS 7574, 11 rue Pierre et Marie Curie, 75005 Paris, France;1. Department of Materials Science and Engineering, National Cheng Kung University, Tainan 701, Taiwan;2. National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan;1. School of Science, Shandong University of Technology, Zibo 255049, China;2. Laiwu Vocational and Technical College, Laiwu 271100, China;3. Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, China;4. College of Physics and Electronics, Shandong Normal University, Jinan 250014, China;1. School of Electronic and Information Engineering, South-Central University for Nationalities, Wuhan 430074, China;2. School of Electronic and Electrical Engineering, Wuhan Textile University, Wuhan 430073, China;3. School of Science, Xi''an Polytechnic University, Xi''an 710048, China;4. Soft-Impact China (Harbin), Ltd., Harbin 150001, China;5. Harbin Institute of Technology, Harbin 150001, China |
