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Atom Microscopy via Dual Resonant Superposition
Abstract:An M-type Rb~(87) atomic system is proposed for one-dimensional atom microscopy under the condition of Electromagnetically Induced Transparency.Super-localization of the atom in the absorption spectrum while its delocalization in the dispersion spectrum is observed due to the dual superposition effect of the resonant Reids.The observed minimum uncertainty peaks will find important applications in Laser cooling,creating focused atom beams,atom nanolithography,and in measurement of the center-of-mass wave function of moving atoms.
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