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Optical Characterization of β-FeSi2 Thin Films Prepared by Femtosecond Laser Ablation 总被引:3,自引:0,他引:3 下载免费PDF全文
Iron disilicide thin films are prepared on fused quartz using femtosecond laser deposition (FsPLD) with a FeSi2 alloy target. X-ray diffraction results indicate the films are single-phase, orthorhombic, β-FeSi2. Field scanning electron microscopy, high resolution transmission electron microscopy, UV-VIS-NIR spectroscopy and Raman microscope are used to characterize the structure, composition, and optical properties of the β-FeSi2 films. Normal incidence spectral transmittance and reflectance data indicate a minimum, direct energy gap of 0.85 eV. The two most intense lines of Raman scattering peaked at 181.3 cm^-1 and 235.6cm^-1 for the film on fused quartz, and at 191.2cm^-1 and 243.8cm^-1 for the film on Si (100), are observed. 相似文献
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研究了镓填充二氧化硅纳米管的电子束诱导的膨胀现象, 确认微球系统中镓液体在电子束辐照下存在反常膨胀现象. 首先分析了相关的实验过程和现象, 指出此膨胀过程可以视为准静态过程; 然后根据傅里叶热传导定律, 在准静态热力学的框架下定量讨论了该系统在电子束辐 照下微球中镓液体相对体积随温度变化规律, 进一步确定系统的相对膨胀率和系统的膨胀系数, 发现反常膨胀系数是正常热膨胀系数的5-9倍. 最后指出这种反常膨胀是由系统的电离效应和残存效应共同引起的, 两者造成系统的粒子数密度急剧增加, 从而导致系统的内部压强急剧增加, 产生体积反常膨胀. 相似文献
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