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Electron beam evaporation deposition of cadmium sulphide and cadmium telluride thin films: Solar cell applications7 下载免费PDF全文
Cadmium sulphide (CdS) and cadmium telluride (CdTe) thin films are deposited by electron beam evaporation. Atomic force microscopy (AFM) reveals that the root mean square (RMS) roughness values of the CdS films increase as substrate temperature increases. The optical band gap values of CdS films increase slightly with the increase in the substrate temperature, in a range of 2.42-2.48 eV. The result of Hall effect measurement suggests that the carrier concentration decreases as the substrate temperature increases, making the resistivity of the CdS films increase. CdTe films annealed at 300 ℃ show that their lowest transmittances are due to their largest packing densities. The electrical characteristics of CdS/CdTe thin film solar cells are investigated in dark conditions and under illumination. Typical rectifying and photovoltaic properties are obtained. 相似文献
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根据振动与波的原理,把样品上某点温度随时间的周期性变化看作一种振动,把这种温度变化向外传播的过程看作波动,引进温度波,说明样品上各点温度随时间、距离的变化;采用一维模型,写出温度波的传播方程.考虑到样品(铜棒)散热,引进衰减系数,描述温度幅度随频率及传播距离的变化关系.利用傅里叶变换分析实验数据,得到温度波幅度与角频率、位置的对应关系.根据温度幅度衰减公式拟合数据,算出基频及倍频对应的衰减系数.结果说明:衰减系数与温度波的频率相关,温度波的频率越高,衰减系数越大,温度幅度衰减得越快. 相似文献
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