聚苯胺/凹凸棒石黏土纳米纤维复合材料对溶液中痕量Cr(Ⅵ)的吸附性能

采用原位聚合法合成了盐酸掺杂聚苯胺/凹凸棒石黏土(PANI/ATP)纳米纤维复合材料.研究了它对含痕量Cr(Ⅵ)废水的吸附,考察了物料配比、投料质量、吸附时间、吸附温度和pH值对其吸附性能的影响.结果表明,复合材料中的物料配比为m(An):m(ATP)=2:1,用暈为0.4 g,50 min时对Cr(Ⅵ)的吸附量达到99.8%,符合Langmuir等温吸附方程.该复合材料充分发挥了有机和无机吸附材料的协同作用,具有成本低、再生性能良好的特点.     

B_4C/Mo/Si high reflectivity multilayer mirror at 30.4 nm

The B4C/Mo/Si high reflectivity multilayer mirror was designed for He-Ⅱradiation (30.4 nm) using the layer-by-layer method. The theoretical peak reflectivity was up to 38.2% at the incident angle of 5℃. The B4C/Mo/Si multilayer was fabricated by direct current magnetron sputtering and measured at the National Synchrotron Radiation Laboratory (NSRL) of China. The experimental reflectivity of the B4C/Mo/Si multilayer at 30.4 nm was about 32.5%. The promising performances of the B4C/Mo/Si multilayer mirror could be used for the construction of solar physics instrumentation.     

单能电子在聚酯薄膜(PET)中射程的测量

聚酯薄膜(PET)作为由C，H，O三种元素组成的有机物，与生物组织的组成较为相似，测量单能电子在PET中的射程在放射性防护方面有一定的价值，本文在RES系列相对论效应实验谱仪平台上测量了单能电子在PET中的射程，给出了相应的实验方法和数据处理方法，实现了在普通实验室进行单能电子射程的测量。     

Determination of Tungsten Layer Profiles in Bilayer Structures Using X-Ray Reflectivity Method

An effectual method is presented to determine the profiles of a tungsten （W） layer, such as the density, the thickness and the roughness in the multilayer structures, using the x-ray reflectivity technique. To avoid oxidation effects of tungsten, a B4 C capping layer is deposited onto to the W layer. To observe the profiles of the tungsten layer with different thicknesses, three groups of W/B4 C bilayers with different thicknesses are prepared by using ultra high vacuum dc magnetron sputtering and measured by an x-ray diffractometer. A type of genetic algorithm called the differential evolution is used to simulate the measurement data so as to obtain the parameters of bilayers. According to the simulation, it is shown that the W layer density varies from 95.26% to 97.51% compared to the bulk. In our experiment, the deposition rate is 0.044 nm/s, and the thickness is varied in the range of 9.8-19.4 nm.     

4.48 nm正入射软X射线激光用Cr/C多层膜高反射镜的研制

针对4.48nm类镍钽软X射线激光及其应用实验,设计制备了工作于这一波长的近正入射多层膜高反射镜。选择Cr/C为制备4.48nm高反射多层膜的材料对,通过优化设计,确定了多层膜的周期、周期数以及两种材料的厚度比。模拟了多层膜非理想界面对高反射多层膜性能的影响。采用直流磁控溅射方法在超光滑硅基片上实现了200周期Cr/C多层膜高反射镜的制备。利用X射线衍射仪测量了多层膜结构,在德国BessyⅡ同步辐射上测量了在工作波长处多层膜反射率,测量的峰值反射率达7.5%。对衍射仪测量的掠入射反射曲线和同步辐射测量的反射率曲线分别进行拟合,得到的粗糙度和厚度比的结果相近。测试结果表明,所制备的Cr/C多层膜样品结构良好,在指定工作波长处有较高的反射峰,达到了设计要求。     

30.4 nm波长SiC/Mg多层膜反射镜

波长30.4 nm的He-II谱线是极紫外天文观测中最重要的谱线之一,空间极紫外太阳观测光学系统需要采用多层膜作为反射元件。为此研究了SiC/Mg、B4C/Mg、C/Mg、C/Al、Mo/Si、B4C/Si、SiC/Si、C/Si、Sc/Si等材料组合的多层膜在该波长处的反射性能。基于反射率最大与多层膜带宽最小的设计优化原则,选取了SiC/Mg作为膜系材料。采用直流磁控溅射技术制备了SiC/Mg多层膜,用X射线衍射仪测量了多层膜的周期厚度,用国家同步辐射计量站的反射率计测量了多层膜的反射率,在入射角12°时,实测30.4 nm处的反射率为38.0%。     

软X射线激光用自支撑Zr滤光膜的制备及测量

 利用直流磁控溅射方法制备了质量厚度为200 μg·cm^-2，直径为20 mm的自支撑金属Zr滤光膜。用同步辐射光源和紫外可见分光光度计分别测量了滤光膜在软X射线和可见光波段的透射率，用俄歇电子能谱（AES）分析了膜中的元素含量。结果表明:Zr膜在13.9 nm波长的透射率达19%， 对可见光的抑制性能达43 dB。杂质、膜层氧化及表面污染是影响滤光膜软X射线光谱透射率的主要因素。