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Observing Nanometre Scale Particles with Light Scattering for Manipulation Using Optical Tweezers 下载免费PDF全文
Nanometre-scale particles can be manipulated using optical tweezers, but cannot be directly observed. We present a simple method that nanoparticles can be directly observed using optical tweezers combined with dark field microscopy. A laser beam perpendicular to a tightly focused laser beam for trap illuminates specimen and does not enter objective, nanoparticles in focal plane all can be directly observed in dark field because of light scattering. It is implemented that the polystyrene beads of diameter lOOnm can be directly observed and trapped. 相似文献
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介绍了自行设计的测量“弯曲-压缩”位移量的仪器与材料试验机的联要应用,该系统可测得精确的位移量,并可自动绘图,开发了原仪器设备的功能,提高了它的利用率和效率。 相似文献
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