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硅烯:一种新型的二维狄拉克电子材料   总被引:1,自引:0,他引:1  
陈岚  吴克辉 《物理》2013,(9):604-612
要硅烯是单原子层的硅薄膜,其结构与石墨烯类似,由于其奇特的物理性质特别是狄拉克—费米特性,在近年来引起了人们的关注。文章简要介绍了硅烯这一全新的二维体系在实验上的一些进展,包括实现硅烯在表面上的外延生长,重构的结构表征和相变,狄拉克电子特性的证实,以及可能具有的超导转变等。  相似文献
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研究了热历史对四方相钛酸钡陶瓷弛豫性质的影响。结果表明,不同热历史的钛酸钡试样在四方相温区都出现弛豫内耗峰,但不同热历史的试样具有不同性质的弛豫过程。从立方相降温测得的四方相陶瓷的弛豫激活能为0.61eV;而从单斜相升温测得的四方相陶瓷的弛豫激活能为1.12eV,相差几近一倍。用氧缺位的分布和弛豫热力学选择定则提出了四方相的弛豫机理,计算了不同热处理后处于不同对称位置氧缺位的浓度。  相似文献
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研究了热历史对四方相钛酸钡陶瓷弛豫性质的影响.结果表明,不同热历史的钛酸钡试样在四方相温区都出现弛豫内耗峰,但不同热历史的试样具有不同性质的弛豫过程.从立方相降温测得的四方相陶瓷的弛豫激活能为0.61 eV;而从单斜相升温测得的四方相陶瓷的弛豫激活能为1.12 eV,相差几近一倍.用氧缺位的分布和弛豫热力学选择定则提出了四方相的弛豫机理,计算了不同热处理后处于不同对称位置氧缺位的浓度.  相似文献
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Growth of high-quality ultra-thin Ag film is of great interest from both scientific and technological viewpoints. First, ultra-thin metal fihns are model systems utilized to investigate quantum size effects (QSE). When the film thickness is comparable to the Fermi wavelength of an electron, quantized energy lev- els known as quantum well states are produced in the surface normal direction. High-quality metal films with uniform thickness can effectively suppress in- homogeneous broadening of the thickness-dependent quantum levels to manifest quantum size effects. Secondly, Ag is the most widely used material for sur- face plasmonic devices, and high-quality Ag films have already shown the capability of supporting surface plasmon propagation fbr an extremely long distance. Moreover, ultra-thin Ag films can act as an excel- lent substrate for integrating various nano and low- dimensional structures. For instance, silicene, which is a two-dimensional (2D) sheet composed of silicon similar to graphene, has recently attracted intense attention. Ag (111) surface is widely recognized as the most important substrate suitable for the growth of silicene, while Ag films are much more cost-effective candidates for expensive single crystal Ag(111) sub- strates.  相似文献
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We report a direct measurement of the imaginary part of the surface tension of water through a dynamic scheme using a thin vertical glass fiber of diameter of 3 tun with one end glued onto a cantilever beam and the other end touching a water-air interface. The frequency dependence of the dissipation factor experienced by the glass fiber is exactly calculated through measuring the phase delay with various frequencies when the glass fiber is forced to oscillate vertically. We find the same intercept at the dissipation factor axis for different frequency dependences of the dissipation factor for different depths by which the glass fiber is dipped into water. This nonzero dissipation factor at zero frequency presents direct evidence of the existence of the imaginary part of surface tension of water and yields a complex surface tension of water σ^* = 0.073 + i(0.017 ± 0.002) N/m at room temperature.  相似文献
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