首页 | 本学科首页   官方微博 | 高级检索  
文章检索
  按 检索   检索词:      
出版年份:   被引次数:   他引次数: 提示:输入*表示无穷大
  收费全文   116篇
  免费   1篇
  国内免费   1篇
化学   43篇
晶体学   10篇
力学   1篇
数学   4篇
物理学   60篇
  2023年   1篇
  2021年   1篇
  2020年   1篇
  2019年   2篇
  2018年   3篇
  2017年   4篇
  2016年   8篇
  2015年   4篇
  2014年   7篇
  2013年   18篇
  2012年   8篇
  2011年   4篇
  2010年   2篇
  2009年   8篇
  2008年   6篇
  2007年   2篇
  2006年   3篇
  2005年   8篇
  2004年   4篇
  2003年   3篇
  2002年   5篇
  2001年   1篇
  2000年   1篇
  1999年   2篇
  1998年   1篇
  1995年   2篇
  1994年   1篇
  1993年   2篇
  1992年   1篇
  1989年   1篇
  1985年   1篇
  1984年   3篇
排序方式: 共有118条查询结果,搜索用时 15 毫秒
1.
Thin films of Ga10Se80Hg10 have been deposited onto a chemically cleaned Al2O3 substrates by thermal evaporation technique under vacuum. The investigated thin films are irradiated by 60Co γ-rays in the dose range of 50–150 kGy. X-ray diffraction patterns of the investigated thin films confirm the preferred crystallite growth occurs in the tetragonal phase structure. It also shows, the average crystallite size increases after γ-exposure, which indicates the crystallinity of the material increases after γ-irradiation. These results were further supported by surface morphological analysis carried out by scanning electron microscope and atomic force microscope which also shows the crystallinity of the material increases with increasing the γ-irradiation dose. The optical transmission spectra of the thin films at normal incidence were investigated in the spectral range from 190 to 1100 nm. Using the transmission spectra, the optical constants like refractive index (n) and extinction coefficient (k) were calculated based on Swanepoel’s method. The optical band gap (Eg) was also estimated using Tauc’s extrapolation procedure. The optical analysis shows: the value of optical band gap of investigated thin films decreases and the corresponding absorption coefficient increases continuously with increasing dose of γ-irradiation.  相似文献   
2.
3.
4.
5.
In this note, we generalize some theorems on zero-sums with weights from [1], [4] and [5] in two directions. In particular, we consider ℤ p d for a general d and subgroups of Z* p as weights.  相似文献   
6.
A series of samples of HoFe1?x Ni x O3 (x = 0.0, 0.1, 0.3) were prepared using the solid-state reaction technique to understand the structural, dielectric and conductivity properties before and after gamma irradiation of accumulated dose of 625 KGy. The X-ray diffraction confirms that all the samples exist in single-phase orthorhombic structure having space group Pbnm. With increasing dopant Ni, the unit cell volume and lattice parameters undergo small change. X-ray analysis show change in the interplanar spacing and full width at half maximum values after gamma irradiation. The Raman spectra of the samples show modifications after gamma irradiation. It can be easily seen that after gamma irradiation intensity, peak width are completely altered by gamma-absorbed dose. Measurement of dielectric loss and dielectric constant at room temperature was performed before and after gamma irradiation in the frequency range of 20 Hz–1 MHz. It is observed that the value of dielectric constant decreases after irradiation. The ac conductivity is estimated from the dielectric constant and loss tangent. Exposure to gamma radiation results in substantial modification in the physical properties of the Ni-doped Ho-based orthoferrites.  相似文献   
7.
Room-temperature multiferroic properties in Mg-doped ZnO samples are reported wherein Mg replaces Zn in the ZnO matrix and retains hexagonal wurtzite structure. The saturation magnetisation is increased from ~2×10?4 emu/g to 3×10?4 emu/g for the dilute doping of 2 % Mg in pure ZnO and the ferroelectricity is also increased. Higher concentration of Mg does not lead to a significant enhancement in the magnetisation but improves the ferroelectric properties. An X-ray absorption spectroscopic study shows an enhancement in O vacancies with dilute doping of Mg. The origin of the multiferroic behaviour is understood based on their crystal and electronic structures.  相似文献   
8.
Similarity reductions of the generalized Burgers equation     , where α, β, and γ are non-negative constants, n a positive integer and   j = 0, 1, 2  , are obtained by the direct method of Clarkson and Kruskal [ 1 ]. This is the first work to report the similarity variables as an incomplete gamma function and also as a power of     , and to provide a perturbation solution of an Euler–Painlevé transcedent.  相似文献   
9.
The electrical switching behaviour of As45Te55-xInx (5≤x≤15) and As50Te50-xInx (2.5≤x≤11.5) has been studied over a wide range of compositions. These glasses are found to exhibit threshold switching. The composition dependence of switching voltage (Vt) has been found to exhibit a change in slope and a local minimum at compositions x=10 and 12.5 for As45Te55-xInx and x=7.5 and 10.8 for As50Te50-xInx, respectively. The slope change in Vt verses x and the local minimum have been identified using two network topological effects, namely the rigidity percolation threshold and the chemical threshold. Received: 23 August 2001 / Accepted: 27 August 2001 / Published online: 11 February 2002  相似文献   
10.
X-ray absorption spectroscopic measurements have been used to compare the electronic structures of swift heavy ions (100 MeV Si ions) irradiated and pristine Ni-Al nanocrystalline films. Results from X-ray diffraction (XRD), X-ray absorption near-edge structure (XANES) spectra at Al K-, and Ni L(2,3)-edges and extended X-ray absorption fine structure (EXAFS) at Ni K-edges are discussed. The observed XRD peaks indicate the improvement of crystalline nature and Al(111) clustering after the swift heavy ion interactions. While the XANES spectra at Ni L(2,3)-edges show decrease in the intensity of white line strength, the Al K-edge shows increase in intensity after irradiation. Above results imply that swift heavy ions induce low Z (i.e., Al) ion mass transport, changes in Al sp-Ni-d hybridization, and charge transfer. EXAFS results show that crystalline nature is improved after swift heavy irradiation which is consistent with XRD results.  相似文献   
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号