Theoretical study on the improvement of the doping efficiency of Al in 4H-SiC by co-doping group-IVB elements

The p-type doping efficiency of 4H silicon carbide (4H-SiC) is rather low due to the large ionization energies of p-type dopants. Such an issue impedes the exploration of the full advantage of 4H-SiC for semiconductor devices. In this study, we show that co-doping group-IVB elements effectively decreases the ionization energy of the most widely used p-type dopant, i.e., aluminum (Al), through the defect-level repulsion between the energy levels of group-IVB elements and that of Al in 4H-SiC. Among group-IVB elements Ti has the most prominent effectiveness. Ti decreases the ionization energy of Al by nearly 50%, leading to a value as low as ~0.13 eV. As a result, the ionization rate of Al with Ti co-doping is up to ~5 times larger than that without co-doping at room temperature when the doping concentration is up to 10¹⁸ cm^-3. This work may encourage the experimental co-doping of group-IVB elements such as Ti and Al to significantly improve the p-type doping efficiency of 4H-SiC.     

Effect of oxygen on regulation of properties of moderately boron-doped diamond films

Regulation of oxygen on properties of moderately boron-doped diamond films is fully investigated. Results show that, with adding a small amount of oxygen (oxygen-to-carbon ratio < 5.0%), the crystal quality of diamond is improved, and a suppression effect of residual nitrogen is observed. With increasing ratio of O/C from 2.5% to 20.0%, the hole concentration is firstly increased then reduced. This change of hole concentration is also explained. Moreover, the results of Hall effect measurement with temperatures from 300 K to 825 K show that, with adding a small amount of oxygen, boron and oxygen complex structures (especially B₃O and B₄O) are formed and exhibit as shallow donor in diamond, which results in increase of donor concentration. With further increase of ratio of O/C, the inhibitory behaviors of oxygen on boron leads to decrease of acceptor concentration (the optical emission spectroscopy has shown that it is decreased with ratio of O/C more than 10.0%). This work demonstrates that oxygen-doping induced increasement of the crystalline and surface quality could be restored by the co-doping with oxygen. The technique could achieve boron-doped diamond films with both high quality and acceptable hole concentration, which is applicable to electronic level of usage.     

激光实验诊断集成管控系统中人工智能技术应用

针对激光聚变实验中诊断系统种类多、原理各异、排布变换频繁等特点，发展了基于流程驱动的诊断集成管控系统。对控制节点中依赖经验以及人工判读的测量系统参数配置、系统瞄准、多诊断系统空间干涉等操作流程，开展基于深度学习技术的示波器量程智能化设置、自动瞄准以及空间干涉预警技术等诊断系统智能化控制方法的初步探索。     

惯性约束聚变实验中空间干涉检测与预警系统设计

针对惯性约束聚变实验中多诊断系统在有限空间同时作业引发碰撞风险的问题，设计了基于碰撞目标检测和空间距离测算方法的空间干涉检测与预警系统，分析了真空靶室特定环境下不同实现方法的适用条件和可行性。实验室条件下模拟验证结果表明，基于结构光深度图像获取方法可获得较好的碰撞距离测量精度，在靶室半径探测距离内空间测距误差不大于3cm，为靶室空间干涉检测与预警提供了一种可行的解决方案。     

中空介孔SiO2纳米球的制备、改性及其对Al3+荧光识别研究

中空介孔SiO2由于中空多孔的结构而常用作功能材料的基底.将中空介孔SiO2进行官能团修饰,并应用为荧光传感材料是中空介孔SiO2一个重要的研究领域.本论文采用聚丙烯酸(PAA)为中空模板,聚醚F127为造孔剂,正硅酸乙酯(TEOS)为硅源,氨水为催化剂在乙醇体系中制备了中空介孔SiO2纳米球.系统研究了搅拌速度和聚醚F127引入量对中空介孔SiO2纳米球形貌及比表面积的影响.通过透射电镜、N2-等温吸附脱附曲线等表征说明该合成方法具有很好的普适性,通过调节F127的引入可以实现对比表面积的有效控制.通过氨基化、席夫碱反应进行荧光修饰,进一步研究表明荧光修饰后的中空介孔SiO2纳米球在水溶液中能够实现对Al3+的有效检测,检测限为1.19×10 -7M.     

膦酸化氧化石墨烯-壳聚糖复合材料对Eu(Ⅲ)的富集性能

本文定向合成了一种新型的膦酸化氧化石墨烯(GO)-壳聚糖(CS)复合材料(GO-CS-P),并将其应用于水体中三价Eu(Ⅲ)的高效富集.宏观实验结果显示,这一复合材料对Eu(Ⅲ)的吸附在5 min内即可达到平衡,在pH5.5和293 K条件下的最大吸附容量(106.14 mg/g)高于先前文献中报道的一系列吸附材料.此外, GO-CS-P能够高效、选择性地从高盐度和多组分金属离子共存的水溶液中捕获Eu(Ⅲ). X射线衍射(X-ray diffraction, XRD)、傅里叶变换红外光谱(Fourier transform infrared spectrometry, FTIR)、X射线吸收光谱(X-ray absorption spectroscopy,XAS)和X射线光电子能谱(X-ray photoelectron spectroscopy, XPS)的分析结果表明, Eu(Ⅲ)与GO-CS-P表面的膦酸酯基团和羧基发生共价结合,形成稳定的内层络合物.基于本文的研究发现, GO-CS-P复合材料在修复被三价镧系/锕系元素污染的地下水方面具有很大的应用潜力.     

磁场下有原子自旋轨道耦合的各向异性量子点的精确解析传播子

量子力学中很少有系统能够精确地计算传播子, 特别是在考虑了自旋轨道耦合效应的情况下. 利用相空间的群论方法, 首先导出了有原子自旋轨道耦合的各向异性量子点传播子的精确解析表达式. 随后利用传播子来计算自旋高斯波包的演化与相应的概率密度, 并研究了原子自旋轨道耦合效应和磁场强度对距离期望值的影响.     

Direct visualization of structural defects in 2D semiconductors

Direct visualization of the structural defects in two-dimensional (2D) semiconductors at a large scale plays a significant role in understanding their electrical/optical/magnetic properties, but is challenging. Although traditional atomic resolution imaging techniques, such as transmission electron microscopy and scanning tunneling microscopy, can directly image the structural defects, they provide only local-scale information and require complex setups. Here, we develop a simple, non-invasive wet etching method to directly visualize the structural defects in 2D semiconductors at a large scale, including both point defects and grain boundaries. Utilizing this method, we extract successfully the defects density in several different types of monolayer molybdenum disulfide samples, providing key insights into the device functions. Furthermore, the etching method we developed is anisotropic and tunable, opening up opportunities to obtain exotic edge states on demand.     

Sensitivity improvement of aluminum-based far-ultraviolet nearly guided-wave surface plasmon resonance sensor

An aluminum (Al) based nearly guided-wave surface plasmon resonance (NGWSPR) sensor is investigated in the far-ultraviolet (FUV) region. By simultaneously optimizing the thickness of Al and dielectric films, the sensitivity of the optimized Al-based FUV-NGWSPR sensor increases from 183°/RIU to 309°/RIU, and its figure of merit rises from 26.47 RIU^-1 to 32.59 RIU^-1 when the refractive index of dielectric increases from 2 to 5. Compared with a traditional FUV-SPR sensor without dielectric, the optimized FUV-NGWSPR sensor can realize simultaneous improvement of sensitivity and figure of merit. In addition, the FUV-NGWSPR sensor with realistic materials (diamond, Ta₂O₅, and GaN) is also investigated, and 137.84%, 52.70%, and 41.89% sensitivity improvements are achieved respectively. This work proposes a method for performance improvement of FUV-SPR sensors by exciting nearly guided-wave, and could be helpful for the high-performance SPR sensor in the short-wavelength region.     

改进的PNC方法及其在非线性偏微分方程多解问题中的应用

2017年，李昭祥等提出了一种偏牛顿-校正法（Partial Newton-Correction Method，简记为PNC方法），并利用它成功地计算出了三类非线性偏微分方程的多重不稳定解.本文在PNC方法的基础上，提出并发展了一种改进的PNC方法.首先，利用Nehari流形$\mathcal{N}$与零平凡解的可分离性，建立并证明了$\mathcal{N}$的某特殊子流形$\mathcal{M}$上的全局分离定理及其推广（即局部分离定理）.全局分离定理只跟非线性偏微分算子或相应的非线性泛函本身有关，而与具体的计算方法无关.对一些典型的非线性偏微分方程多解问题（比如，Henon方程问题），该全局分离定理的分离条件，经验证是成立的.另一个方面，通过修改或补充原辅助变换的定义，去掉了原辅助变换的奇异性；接着建立并证明了某些非线性偏微分方程问题的新未知解与该非线性偏微分算子零核空间的密切关系；在证明中，去掉了在原奇异变换下所需的标准收敛（standard convergence）假设.最后，计算实例与数值结果验证了改进的PNC方法的可行性和有效性；同时表明子流形$\mathcal{M}$与已知解的可分离性是PNC方法和本文新方法能成功找到多解的关键.