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碳滑板电滑动温升及其对滑板磨损影响的试验研究 总被引:2,自引:1,他引:1
使用高速载流摩擦磨损试验机,研究了碳滑板与接触线电滑动摩擦时接触压力、相对滑动速度、电流和电弧放电能量变化对碳滑板温升的影响,比较了不同温升时碳滑板的磨损形貌.结果表明:滑板的温升随滑动速度、电流、电弧放电能量的增加而增加,随接触压力的增加而减小.碳滑板的磨损形貌观察显示:碳滑板的温升会显著影响滑板的磨损形貌,随着温升的增加,碳滑板的磨损就越严重.碳滑板的不同温升对应着不同的磨损机制:温升50℃左右时,碳滑板表面以片状剥离的机械磨损为主;温升90℃左右时,碳滑板表面以机械磨损为主,并出现少量的烧蚀区域;温升在180~200℃左右时,碳滑板表面出现大量的烧蚀区域,以电弧烧蚀磨损为主;温升在300℃左右时,碳滑板易出现疲劳裂纹,以电弧烧蚀磨损为主. 相似文献
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Microscopic degradation mechanism of polyimide film caused by surface discharge under bipolar continuous square impulse voltage 下载免费PDF全文
Polyimide (PI) film is an important type of insulating material used in inverter-fed motors. Partial discharge (PD) under a sequence of high-frequency square impulses is one of the key factors that lead to premature failures in insulation systems of inverter-fed motors. In order to explore the damage mechanism of PI film caused by discharge, an aging system of surface discharge under bipolar continuous square impulse voltage (BCSIV) is designed based on the ASTM 2275 01 standard and the electrical aging tests of PI film samples are performed above the partial discharge inception voltage (PDIV). The chemical bonds of PI polymer chains are analyzed through Fourier transform infrared spectroscopy (FTIR) and the dielectric properties of unaged and aged PI samples are investigated by LCR testers HIOKI 3532-50. Finally, the micro-morphology and micro-structure changes of PI film samples are observed through scanning electron microscopy (SEM). The results show that the physical and chemical effects of discharge cut off the chemical bonds of PI polymer chains. The fractures of ether bond (C-O-C) and imide ring (C-N-C) on the backbone of a PI polymer chain leads to the decrease of molecular weight, which results in the degradation of PI polymers and the generation of new chemical groups and materials, like carboxylic acid, ketone, aldehydes, etc. The variation of microscopic structure of PI polymers can change the orientation ability of polarizable units when the samples are under an AC electric field, which would cause the dielectric constant e to increase and dielectric loss tan ~ to decrease. The SEM images show that the degradation path of PI film is initiated from the surface and then gradually extends to the interior with continuous aging. The injection charge could result in the PI macromolecular chain degradation and increase the trap density in the PI oolvmer bulk. 相似文献
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