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Cs^+-K^+ ion exchanges are performed on z-cut KTiOPO4 crystals with chromium coating covered. The temperature of ion exchange is 430℃, and the time range from 15min to 30min. The dark mode spectra of the samples are measured by the prism coupling method. The channel structures on the samples are observed by a microscope and the near field pattern of the channel waveguides are measured by the end-fire coupling method. The refractive index of the samples increases and the increments at surface are modulated due to the existence of Cr film. In the region covered by Cr film, the refractive index of the samples at the surface increases dramatically in a shallow layer. The results of energy dispersive x-ray spectra indicate that in the region covered with Cr film, Cr ions participate in the ion exchange process, and enhance the refractive index. The results may provide a possibility that achieves index enhancement and Cr doping synchronically. 相似文献
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糖葫芦状二氧化钛纳米线阵列的制备及其光催化性能 总被引:1,自引:0,他引:1
采用溶胶-电泳技术,在多孔阳极氧化铝(PAA)模板的有序孔洞中制备了高度取向的糖葫芦状TiO2纳米线阵列光催化剂,通过扫描电镜(SEM)和X射线衍射对样品进行了表征. 结果表明, TiO2纳米线为锐钛矿晶型,纳米线直径与PAA模板的孔径一致,且分布均匀. 纳米线取向性极好,每根纳米线都具有周期性凹凸,形似糖葫芦,因此命名为糖葫芦状TiO2纳米线阵列. 以甲基橙的降解反应评价了光催化剂的活性,与相同条件下制备的TiO2/玻璃膜相比, TiO2纳米线阵列在光照1 h时对甲基橙的降解率达到93.6%, 比前者提高了40.2%, 具有很好的光催化活性. 相似文献
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反相微乳液法制备纳米氧化铝 总被引:4,自引:0,他引:4
采用由环己烷、聚乙二醇辛基苯基醚(TritonX-100)、正丁醇与水溶液构成的反相微乳液体系, 合成了纳米Al2O3粉体. 采用X射线衍射、扫描电子显微镜、透射电子显微镜、比表面积分析仪等表征手段, 分别对产物的结构、形貌、比表面积和孔容进行了表征, 该纳米Al2O3比表面积约450 m2·g-1(随反应参数不同发生变化), 均属γ-Al2O3, 粒径均匀, 颗粒直径小于10 nm. 考察了微乳液体系中水与表面活性剂的物质的量之比r0、表面活性剂与助表面活性剂的体积比φ、焙烧温度等关键因素对产物比表面积等物理性质的影响. 结果表明, 当r0=20, φ=0.5, 焙烧温度为500 ℃时, 可以得到大比表面积、高孔容、分散性好及粒径分布均匀的γ-Al2O3粉体. 相似文献
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采用真空冷冻干燥技术结合反相微乳液法, 于环己烷/聚乙二醇辛基苯基醚(曲拉通X-100)-十六烷基三甲基溴化铵(CTAB)/正丁醇/水溶液体系中, 合成了纳米Al2O3粉体. 采用扫描电子显微镜(SEM)、透射电子显微镜(TEM)、X射线衍射(XRD)及比表面积与孔隙度分析仪对产物的形貌、结构、比表面积、孔容与孔径进行了表征. 经过煅烧, 该纳米Al2O3比表面积约550.0 m2·g-1(随反应参数不同而变化), 属γ-Al2O3晶型, 粒径均匀, 颗粒直径小于10.0 nm. 考察了不同的干燥方式(电热鼓风干燥、普通真空干燥、真空冷冻干燥)以及真空冷冻干燥过程中主要参数对产物比表面积、孔容、平均孔径等物理性质的影响. 结果表明, 采用真空冷冻干燥法制备的纳米Al2O3的比表面积和孔容远高于采用另外两种干燥方式制备的纳米Al2O3. 采用真空冷冻干燥法制备纳米Al2O3时, 降温速率、预冻时间、冻干时间等参数对最终制备的产物比表面积与孔结构有显著影响. 相似文献
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Analysis and Determination of Refractive Index Profiles of O^2+ Ion-Implanted LiNbO3 Planar Waveguide Using Etching and Ellipsometry Techniques 下载免费PDF全文
The refractive index profiles of 3 MeV O^2+ ion-implanted planar waveguides in lithium niobate are reconstructed based on etching and ellipsometry techniques. SRIM2003 code is used to simulate the damage distribution in waveguide. It is demonstrated that the index profile of this kind of waveguide, extending to several micrometres in depth, can be determined by etching in combination with following ellipsometric measurements. A good agreement is found between the simulated damage distributions in waveguide and the index profiles based on experimental data, and the width of refractive index barrier is wider than the result of SRIM2003. 相似文献
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