Measurements of AC losses in different former materials

A high temperature superconducting cable may be based on a centrally located cylindrical support, a so-called former. If electrically conductive, the former can contribute to the AC losses through eddy current losses caused by unbalanced axial and tangential magnetic fields. With these measurements we aim at investigating the eddy current losses of commonly used former materials. A one layer cable conductor was wound on a glass fibre reinforced polymer (GFRP) former. By inserting a variety of materials into this, it was possible to measure the eddy current losses of each of the former candidates separately; for example copper tubes, stainless steel braid, copper braid, corrugated stainless steel tubes, etc. The measured data are compared with the predictions of a theoretical model. Our results show that in most cases, the losses induced by eddy currents in the former are negligible. However, for materials with a low resistivity the eddy current losses may become significant, e.g., for high purity Cu or Al.     

HREM study of the YBCO/MgO interface on an atomic scale

The film-substrate interface of c oriented YBCO thin films grown by sputtering or laser ablation on (001) MgO substrate has been investigated with high-resolution electron microscopy. The first atomic plane of the YBCO lattice is a CuO chain layer. Two interface configurations occur: (1) the YBCO lattice and the MgO lattice continue up to the interface (this configuration is occasionally associated with some periodic strain in the MgO lattice; (2) the YBCO lattice and the MgO lattice are separated by an (almost) amorphous layer with a thickness of the order of two atomic layers. This amorphous layer is found to lead to the absence of strain. In some cases the surface roughness coincided with misoriented grains but most of the steps in the MgO substrate were accommodated by steps in the YBCO of one or more complete unit cells in height and some lattice bending in the YBCO film.     

Adaptive contrast enhancement of two-dimensional electrophoretic protein gel images facilitates visualization, orientation and alignment

2-DE is a powerful technique to discriminate post-translationally modified protein isoforms. However, all steps of 2-DE preparation and gel-staining may introduce unwanted artefacts, including inconsistent variation of background intensity over the entire 2-DE gel image. Background intensity variations limit the accuracy of gel orientation, overlay alignment and spot detection methods. We present a compact and efficient denoising algorithm that adaptively enhances the image contrast and then, through thresholding and median filtering, removes the gray-scale range covering the background. Applicability of the algorithm is demonstrated on immunoblots, isotope-labeled gels, and protein-stained gels. Validation is performed in contexts of (i) automatic gel orientation based on Hough transformation, (ii) overlay alignment based on cross correlation and (iii) spot detection. In gel stains with low background variability, e.g. Sypro Ruby, denoising will lower the spot detection sensitivity. In gel regions with high background levels denoising enhances spot detection. We propose that the denoising algorithm prepares images with high background for further automatic analysis, without requiring manual input on a gel-to-gel basis.     

TEM investigation of YBa2Cu3O7 thin films on SrTiO3 bicrystals

YBa₂Cu₃O₇ films in c-axis orientation on bicrystalline SrTiO₃ substrates are investigated by TEM. The films and the substrates are examined in cross-section and in plane view. The grain boundary of the bicrystal substrate contains (110) faceted voids, but is otherwise straight on a nanometer scale. Contrary to this, the film grain boundary is not straight grain boundary can be up to 100 nm for a 100 nm thick film. The deviation from the intended position of the YBCO grain boundary can already occur at the film/substrate interface where it can be as much as ±50 nm.     

TEM analysis of planar defects induced by Ti doping in Bi-2212 single crystals

An electron microscopy study is performed on Ti doped Bi-2212 single crystals. High resolution electron microscopy reveals that the Ti doping leads to incorporation of (010) planar defects in the Bi-2212 lattice. These defects consist of pairs of antiphase boundaries, which are separated along the b-axis by one modulation distance. The atomic shift at the boundary is such that one of the two CuO₂ planes is continuous throughout the defect. Energy dispersive X-ray analysis clearly reveals the presence of Ti in the planar defects, whereas no Ti could be detected in defect free areas. This evidences the fact that these defects are induced by the Ti doping.     

AC losses in circular arrangements of parallel superconducting tapes

The DC and AC properties of superconducting tapes connected in parallel and arranged in a single closed layer on two tubes (corresponding to power cable conductor models with infinite pitch) with different diameters are compared. We find that the DC properties, i.e., the critical currents of the two arrangements, scale with the number of tapes and hence appear to be independent of the diameter. However, the AC loss per tape (for a given current per tape) appears to decrease with increasing diameter of the circular arrangement. Compared to a model for the AC loss in a continuous superconducting layer (Monoblock model) the measured values are about half an order of magnitude higher than expected for the small diameter arrangement. When compared to the AC loss calculated for N individual superconducting tapes using a well known model (Norris elliptical) the difference is slightly smaller.