On the Generation of Intense Cs K X-Rays upon Electron Excitation of a Mo Target Heat Treated in Cs and O2 Vapors

JETP Letters - The possibility of stable generation of intense characteristic Cs radiation upon electronic excitation of a Mo anode target heat treated in Cs and O2 vapors is demonstrated. The...     

The energy dispersive scheme of X‐ray fluorescence analysis with a crystal polarizer and polycapillary optics

The efficiency of the polarization scheme based on polycapillary optics and a diamond crystal polarizer was demonstrated. The scheme provides suppression of the background of scattered radiation in measuring X‐ray fluorescence spectra. A quasi‐parallel X‐ray beam with an angular divergence of 4.2 mrad was formed by a microfocus source with a copper anode and polycapillary half‐lens. Simultaneous polarization and monochromatization of radiation was obtained with a crystal of natural diamond, which was set at the diffraction reflection (113). The degree of polarization of CuK_α1 spectral line and the maximum radiation flux were respectively equal to 99.86% and 5 · 10⁶ photon/s. In the direction orthogonal to the plane of diffraction, the maximum attenuation of the background was up to 19 dB.     

Band-reject-filtering X-ray spectra by mosaic structures of pyrolytic graphite

The possibility of effective band-reject filtration of intense spectral lines in X-ray spectra and the creation of deep spectral valleys in the continuous spectrum by diffraction extinction was shown. Optimum material for band-reject filters in the energy range E > 6 keV is highly oriented pyrolytic graphite (HOPG). The filtering scheme in the form of an echelon arrangement of HOPG films is proposed, which suppresses the negative effect of multiple reflections due to diffraction extinction. The full width at half minimum of the spectral valleys can vary from tens of electronvolt to several kiloelectron volt depending on the HOPG mosaic spread, HOPG filters arrangement, and rejected energy region. At the energy range E of ~10 keV, the spectral density attenuation value may be of order 10⁻³ and lower. The obtained results can be used in various fields of X-ray spectrometry, as well as in static energy dispersive diffractometry and reflectometry.     

Formation of Spectral Valleys in the Hard X-Ray Spectrum by Diffraction Band Reject Filtering

JETP Letters - The possibility of forming deep spectral valleys in the polychromatic spectrum of X rays with an energy of E ≥ 15 keV using diffraction band rejection is demonstrated....