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van den Brand JF Ent R Anthony PL Arnold RG Arrington J Beise EJ Belz JE Bosted PE Bulten H Chapman MS Coulter KP Dietrich FS Epstein M Filippone BW Gao H Gearhart RA Geesaman DF Hansen J Holt RJ Jackson HE Jones CE Keppel CE Kinney ER Kuhn S Lee K Lorenzon W Lung A Makins NC Margaziotis DJ McKeown RD Milner RG Mueller B Napolitano J Nelson J O'Neill TG Papavassiliou V Petratos GG Potterveld DH Rock SE Spengos M Szalata ZM Tao LH van Bibber K Wasson DA White JL Zeidman B 《Physical review D: Particles and fields》1995,52(9):4868-4871
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Makins NC Ent R Chapman MS Hansen J Lee K Milner RG Nelson J Arnold RG Bosted PE Keppel CE Lung A Rock SE Spengos M Szalata ZM Tao LH White JL Coulter KP Geesaman DF Holt RJ Jackson HE Papavassiliou V Potterveld DH Zeidman B Arrington J Beise EJ Belz E Filippone BW Gao H Lorenzon W Mueller B McKeown RD O'Neill TG Epstein M Margaziotis DJ Napolitano J Kinney E Anthony PL van Bibber K Dietrich FS Gearhart RA Patratos GG Kuhn SE van den Brand JF Bulten H Jones CE 《Physical review letters》1994,72(13):1986-1989
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Belz J Cousins RD Diwan MV Eckhause M Ecklund KM Hancock AD Highland VL Hoff C Hoffmann GW Irwin GM Kane JR Kettell SH Klein JR Kuang Y Lang K Martin R May M McDonough J Molzon WR Riley PJ Ritchie JL Schwartz AJ Trandafir A Ware B Welsh RE White SN Witkowski MT Wojcicki SG Worm S 《Physical review letters》1996,76(18):3277-3280
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A method (laser raster microscopy with thermal excitation, LRMTE) for characterizing high-T
c thin-film superconductors (HTSC) with microscopic resolution is described. By means of spatially resolved laser excitation and subsequent monitoring of the time dependence of the film resistivity at a base temperature near the transition temperature T
c, spatial variations of the transition temperature (T
c), of the temperature coefficient of the resistivity (dQ/dT), of the heat conductivity and heat capacity of the film and of the heat conductivity between film and substrate can be detected with high spatial resolution (15 m have been achieved so far). 相似文献
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Arisaka K Auerbach LB Axelrod S Belz J Biery KA Buchholz P Chapman MD Cousins RD Diwan MV Eckhause M Ginkel JF Guss C Hancock AD Heinson AP Highland VL Hoffmann GW Horvath J Irwin GM Joyce D Kaarsberg T Kane JR Kenney CJ Kettell SH Kinnison WW Knibbe P Konigsberg J Kuang Y Lang K Lee DM Margulies J Mathiazhagan C McFarlane WK McKee RJ Melese P Milner EC Molzon WR Ouimette DA Riley PJ Ritchie JL Rubin P Sanders GH Schwartz AJ Sivertz M Slater WE Urheim J Vulcan WF Wagner DL Welsh RE Whyley RJ 《Physical review letters》1993,71(24):3910-3913
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Ohne Zusammenfassung 相似文献
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The investigation of structural and electronic properties of the novel family of fullerenes depends on the existence of pure reference materials. Sublimation of the van-der Waals solids is a suitable purification method. Little attention has been paid to the question about the air stability of such sublimed samples in form of crystals or thin films. A combination of thermal desorption spectroscopy, thermal analysis and diffuse reflectance FT-IR spectroscopy is used to show the extent to which oxygen from dry air is intercalated into fullerenes and which detrimental reactivity occurs from attempts to thermally remove (nneal) air-exposed samples. The conclusion is that any fullerene sample exposed to air will be transformed in part into a polymeric non-fullerene carbon upon thermal treatment to above 400 K irrespective of its initial purity.Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthday 相似文献
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