Spectral response modeling and analysis of p-n-p In_(0.53)Ga_(0.47)As/InP HPTs

We report our results on the modeling of the spectral response of the near-infrared(NIR) lattice-matched p-n-p In_(0.53)Ga_(0.47)As/InP heterojunction pbototransistors(HPTs).The spectral response model is developed from the solution of the steady state continuity equations that dominate the excess optically generated minority-carriers in the active regions of the HPTs with accurate boundary-conditions.In addition,a detailed optical-power absorption profile is constructed for the device modeling.The calculated responsivity is in good agreement with the measured one for the incident radiation at980 nm,1310 nm,and 1550 nm.Furthermore,the variation in the responsivity of the device with the base region width is analyzed.     

p-i-nInP/In_(0.53)Ga_(0.47)As/InP探测器结构优化

利用半导体仿真工具Silvaco对p-i-n InP/In_(0.53)Ga_(0.47)As/InP近红外光探测器进行优化仿真.参考实际器件对红外探测器进行建模,并将其暗电流、光谱响应仿真结果与实验结果进行拟合,保证仿真结果的有效性.以减小探测器的暗电流为目的,优化其结构.针对探测器吸收层厚度和吸收层掺杂浓度对暗电流、光响应的影响进行研究,发现当吸收层厚度大于0.3μm后,暗电流不再上升,但光响应随着吸收层厚度的增加而增大;当吸收层掺杂浓度不断上升时,器件暗电流不断降低,当掺杂浓度上升到2×1017/cm3时,暗电流达到最低值.本文还研究了p-i-n型探测器的瞬态响应,探究了响应速度与反偏电压之间的关系,发现提高反偏电压能减小探测器响应时间.