Alloying by high dose ion implantation of iron into magnesium and aluminium

Alloys of the systems Fe–Al (mixable over the whole concentration range) and Fe–Mg (insoluble with each other) were produced by implantation of Fe ions into Al and Mg, respectively. The implantation energy was 200 keV and the ion doses ranged from 1 × 10₁₄ to 9 × 10₁₇cm^-2The obtained implantation profiles were determined by Auger electron spectroscopy depth profiling. Maximum iron concentrations reached were up to 60 at.% for implantation into Al and 94 at.% for implantation into Mg. Phase analysis of the implanted layers was performed by conversion electron Mössbauer spectroscopy and X‐ray diffraction. For implantation into Mg, two different kinds of Mössbauer spectra were obtained: at low doses paramagnetic doublets indicating at least two different iron sites and at high doses a dominant ferromagnetic six‐line‐pattern with a small paramagnetic fraction. The X‐ray diffraction pattern concluded that in the latter case a dilated αiron lattice is formed. For implantation into Al, the Mössbauer spectra were doublet structures very similar to those obtained at amorphous Fe–Al alloys produced by rapid quenching methods. They also indicated at least two different main iron environments. For the highest implanted sample a ferromagnetic six‐line‐pattern with magnetic field values close to those of Fe₃Al appeared.     

Program explanations and causal relevance

Frank Jackson and Philip Pettit have defended a non-reductive account of causal relevance known as the ‘program explanation account’. Allegedly, irreducible mental properties can be causally relevant in virtue of figuring in non-redundant program explanations which convey information not conveyed by explanations in terms of the physical properties that actually do the ‘causal work’. I argue that none of the possible ways to spell out the intuitively plausible idea of a program explanation serves its purpose, viz., defends non-reductive physicalism against Jaegwon Kim’s Causal Exclusion Argument according to which non-reductive physicalism is committed to epiphenomenalism because irreducible mental properties are ‘screened off’ from causal relevance by their physical realizers. Jackson and Pettit’s most promising explication of a program explanation appeals to the idea of invariance of effect under variation of realization, but I show that invariance of effect under variation of realization is neither necessary nor sufficient for causal relevance.     

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Fold‐2‐covering triangular embeddings

For a graph G and a positive integer m, G_(m) is the graph obtained from G by replacing every vertex by an independent set of size m and every edge by m² edges joining all possible new pairs of ends. If G triangulates a surface, then it is easy to see from Euler's formula that G_(m) can, in principle, triangulate a surface. For m prime and at least 7, it has previously been shown that in fact G_(m) does triangulate a surface, and in fact does so as a “covering with folds” of the original triangulation. For m = 5, this would be a consequence of Tutte's 5‐Flow Conjecture. In this work, we investigate the case m = 2 and describe simple classes of triangulations G for which G₍₂₎ does have a triangulation that covers G “with folds,” as well as providing a simple infinite class of triangulations G of the sphere for which G₍₂₎ does not triangulate any surface. © 2003 Wiley Periodicals, Inc. J Graph Theory 43: 79–92, 2003     

Complex backflow dynamics in nematic liquid crystals

Received December 31, 2001 / Published online May 21, 2002     

Quantification problems in depth profiling of pwr steels using Ar+ ion sputtering and XPS analysis.

The oxide scales of AISI 304 formed in boric acid solutions at 300 degrees C and pH = 4.5 have been studied using X-ray photoelectron spectroscopy (XPS) depth profiling. The present focus is depth profile quantification both in depth and chemical composition on a molecular level. The roughness of the samples is studied by atomic force microscopy before and after sputtering, and the erosion rate is determined by measuring the crater depth with a surface profilometer and vertical scanning interferometry. The resulting roughness (20-30 nm), being an order of magnitude lower than the crater depth (0.2-0.5 microm), allows layer-by-layer profiling, although the ion-induced effects result in an uncertainty of the depth calibration of a factor of 2. The XPS spectrum deconvolution and data evaluation applying target factor analysis allows chemical speciation on a molecular level. The elemental distribution as a function of the sputtering time is obtained, and the formation of two layers is observed-one hydroxide (mainly iron-nickel based) on top and a second one deeper, mainly consisting of iron-chromium oxides.