Program explanations and causal relevance

Frank Jackson and Philip Pettit have defended a non-reductive account of causal relevance known as the ‘program explanation account’. Allegedly, irreducible mental properties can be causally relevant in virtue of figuring in non-redundant program explanations which convey information not conveyed by explanations in terms of the physical properties that actually do the ‘causal work’. I argue that none of the possible ways to spell out the intuitively plausible idea of a program explanation serves its purpose, viz., defends non-reductive physicalism against Jaegwon Kim’s Causal Exclusion Argument according to which non-reductive physicalism is committed to epiphenomenalism because irreducible mental properties are ‘screened off’ from causal relevance by their physical realizers. Jackson and Pettit’s most promising explication of a program explanation appeals to the idea of invariance of effect under variation of realization, but I show that invariance of effect under variation of realization is neither necessary nor sufficient for causal relevance.     

Complex backflow dynamics in nematic liquid crystals

Received December 31, 2001 / Published online May 21, 2002     

Quantification problems in depth profiling of pwr steels using Ar+ ion sputtering and XPS analysis.

The oxide scales of AISI 304 formed in boric acid solutions at 300 degrees C and pH = 4.5 have been studied using X-ray photoelectron spectroscopy (XPS) depth profiling. The present focus is depth profile quantification both in depth and chemical composition on a molecular level. The roughness of the samples is studied by atomic force microscopy before and after sputtering, and the erosion rate is determined by measuring the crater depth with a surface profilometer and vertical scanning interferometry. The resulting roughness (20-30 nm), being an order of magnitude lower than the crater depth (0.2-0.5 microm), allows layer-by-layer profiling, although the ion-induced effects result in an uncertainty of the depth calibration of a factor of 2. The XPS spectrum deconvolution and data evaluation applying target factor analysis allows chemical speciation on a molecular level. The elemental distribution as a function of the sputtering time is obtained, and the formation of two layers is observed-one hydroxide (mainly iron-nickel based) on top and a second one deeper, mainly consisting of iron-chromium oxides.     

Texture and electronic activity of grain boundaries in Cu(In,Ga)Se2 thin films

The influence of different film textures on the electronic properties of polycrystalline Cu(In,Ga)Se₂ absorbers is studied by measuring the laterally resolved optoelectronic properties of differently textured Cu(In,Ga)Se₂ films with Kelvin probe force microscopy and cathodoluminescence. The grain boundaries in (112)- and (220/204)-textured films behave differently. The work-function profile measured with the Kelvin probe across a grain boundary in (112)-textured films shows a dip indicating positive charges at the grain boundaries. In panchromatic cathodoluminescence mappings in a transmission electron microscope, such grain boundaries appear dark, i.e. the strongly reduced luminescence indicates that the grain boundaries represent strong non-radiative recombination centers. In contrast, grain boundaries in (220/204)-textured films give rise to a dip or a step in the work function indicating slightly negative charge or neutrality. Cathodoluminescence is reduced at such grain boundaries, but less dramatically than in the (112)-textured case. However, when Na is present in the (220/204)-textured films, the grain boundaries are almost invisible in cathodoluminescence mappings. This strong passivating action of Na occurs only in the (220/204)-textured films, due to a particular grain-boundary population. In (112)-textured films and films without pronounced texture, this passivation effect is much less noticeable. PACS 73.50.Gr; 73.61.Ga; 78.60.Hk; 87.64.Dt     

Spreading Code Design Using a Global Optimization Method

The performance of a code division multiple access system depends on the correlation properties of the employed spreading code. Low cross-correlation values between spreading sequences are desired to suppress multiple access interference and to improve bit error performance. An auto-correlation function with a distinct peak enables proper synchronization and suppresses intersymbol interference. However, these requirements contradict each other and a trade-off needs to be established. In this paper, a global two dimensional optimization method is proposed to minimize the out-of-phase average mean-square aperiodic auto-correlation with average mean-square aperiodic cross-correlation being allowed to lie within a fixed region. This approach is applied to design sets of complex spreading sequences. A design example is presented to illustrate the relation between various correlation characteristics. The correlations of the obtained sets are compared with correlations of other known sequences.     

Compact coaxial driver for small-size Z-pinch

The presented one-capacitor pinch driver, designed as a compact coaxial structure (including spark-gap and discharge section) consistent with the capacitor output, generates a current of 200 kA with 700 ns quarter-period, suitable for studying the optimization of Z-pinch radiative characteristics. The driver is described, measurements of its parameters summarized, and relations to our previous and future activities briefly reviewed.This work was supported in part by the Grant Agency of the Czech Republic under contract No. 202/93/1023.     

Ultra'soft X-ray diagnostics of short-living plasmas

Ultrasoft X-ray plasma diagnostics in IPP is realized by using X-ray diodes with Al photocathodes and submicrometer nitrocellulose filters. The X-ray detections system is suitable for measurements in a relatively broad range of radiation intensities in the spectral interval of (10–1000) eV with the time resolution of (1–10) ns under various plasma conditions. Construction, calibration and characteristic properties of the measuring apparatus are described. To illustrate its use, some results of the diagnostics of REB-heated plasma are presented.We would like to acknowledge Dr. P. unka for many helpful discussions and Dr. J. Ullschmied for cooperation in REB-heated plasma diagnostics interpretation.