Sol–Gel SiO2-ZrO2 Coatings for Optical Applications

SiO₂-ZrO₂ based nanostructured multilayers films have been prepared by sol–gel processing from metallorganic precursors by low temperature inorganic polymerization reactions. Simultaneous gelation of both precursors was realized. Homogeneous and transparent films were obtained at room temperature by dip- and spin-coating on glass and silicon wafer substrates. Samples with successively deposited layers (1–3 layers) and successive thermal treatments have been also studied. Each deposited layer was thermally treated for 1 h at 300°C. The coatings were characterized by XRD, spectroellipsometry (SE), UV-VIS spectroscopy and AFM methods. The influence of substrates, number of coatings and number of thermal treatments on the optical and structural properties of the films was established. The thickness of three deposited SiO₂-ZrO₂ layers is about 496 nm on glass substrates and 413 nm on the silicon wafer substrate. The films deposited on glass are more porous than those deposited on silicon. The properties of optical waveguide prepared from SiO₂-ZrO₂ layers on silicon substrates will be discussed.     

Comparative study of the thermal behavior of Sr–Cu–O gels obtained by sol–gel and microwave-assisted sol–gel method

Journal of Thermal Analysis and Calorimetry - In the literature data, several papers reported the synthesis by various chemical or physical methods of the SrCu2O2 (SCO) having possible applications...     

Hybrid Inorganic-Organic Sol–Gel Coatings in the SiO2-TiO2 System

In the present work, the influence of substituted Si-alkoxides on the structural and optical properties of films obtained in the SiO₂-TiO₂ system was studied. Methyltriethoxysilane (MTEOS) and 3-(tri-methoxysilyl)propyl methacrylate (TSPM) were used as SiO₂ sources and Ti(OBu)₄ was used as TiO₂ source. Acetylacetone was added to the Ti(OBu)₄ as chelating agent and the synthesis was carried out in acid medium. The films were deposited on oxidized Si-wafers by spin-coating. The films were characterized by XRD, spectro-ellipsometry (SE), and atomic force microscopy (AFM). The results obtained have shown that in the case of hybrid films the desired thickness could be obtained in a single deposition step. The thickness of the films and the optical properties are controlled by the bulkiness of the organic substitute bounded to Si. Among other optical applications, the potential use of such films as optical waveguides is proposed.     

LaCoO3 formation from precursors obtained by water-based sol–gel method with citric acid

In the present work the LaCoO₃ formation from gel precursors obtained by water-based sol–gel method with citric acid was studied. As precursors La and Co nitrates were used. The obtained gels were analyzed by TG/DTA and TG/AGE. The decomposition of the gels takes place in two main steps with the evolution of the same volatile compounds (H₂O, CO₂ si NO₂) leading to the conclusion that two types of bonding of the components in the gels occurred. The decomposition of the gels takes place up to 400 °C. The gels thermally treated at 600 °C lead to single pure perovskite rhombohedral phase of lanthanum cobalt oxide (LaCoO₃).     

SiO x -P2O5 films—promising components in photonic structure

We intend to prepare periodic multilayered structures for photonic applications. With this goal we have performed a study of some characteristics of SiO _x -P₂O₅ films deposited by the sol–gel method on glass and ITO (InSnO _x )-coated glass. The as prepared films were annealed to different temperatures (150 and 200°C). The chemical composition of the samples was determined by X-ray Photoelectron Spectroscopy (XPS). The XPS results revealed the presence of P in the as-deposited films. The structural an optical properties were examined by Fourier Transform Infrared Spectroscopy (FTIR), Spectroellipsometry (SE) and UV Transmission Spectroscopy. IR spectra of the deposited films attest the interaction of an amorphous SiO₂ with the H₃PO₄ used as a P-precursor. Refractive indices for individual SiO _x -P₂O₅ determined from SE measurements show a densification of the layer structure with the increasing temperature in the thermal treatment. The UV transmission spectra revealed a lower transmission for the sol-gel SiO _x -P₂O₅ films as compared to ITO/glass substrate. AFM images proved the densification of the films with annealing in agreement with the ellipsometric results. The work was originally presented at “Physics of Photonic Crystals and Metamaterials (PPCM)” Workshop, Brussels, 12–15 June, 2006.     

Thermal behaviour of the TiO<Subscript>2</Subscript>-based gels obtained by microwave-assisted sol–gel method

This work aims to elucidate whether the hypothesis of zero oxygen at the mixture layer when flame takes place is assumable for every kind of material. For that purpose, we investigated the oxygen concentration there by cone calorimeter tests. A modified holder was developed in order to collect oxygen in this mixture layer. In addition, thermogravimetric tests were carried out so as to relate the possible effects of the presence of oxygen in the atmosphere where the pyrolysis process takes place, since the cone calorimeter does not allow to control the oxygen level of the atmosphere during the experiment. The reaction rates and per cent of residue in the cone calorimetric tests were measured and compared with the results from thermogravimetric tests. Six products were analysed which can be classified in three main groups: lignocellulosic, thermoplastic polymers and thermoset polymers. Cone calorimetric results showed that for some of the materials analysed (PET, Nylon and PUR foam) the oxygen level at mixture layer decreased until values close to zero. The comparison of reaction rates between cone calorimetric and thermogravimetric tests revealed the char layer created in cone calorimetric tests over the exposed face for brushed fir, Nylon and PET established an important heat barrier that modifies the thermal behaviour of these materials.     

Influence of the substrate type on the microstructural,optical and electrical properties of sol–gel ITO films

Indium tin oxide (ITO) is recognized as the best transparent and conductive material [transparent conducting oxide (TCO)] until now and its properties are dependent on the preparation method. In the present work ITO films with In:Sn atomic ratio 9:1 were prepared by a sol–gel route on different substrates (microscope glass slides, microscope glass covered with one layer of SiO₂ and Si wafers) for TCO applications. The multilayer ITO films were obtained by successive deposition by the dip-coating method and the films were characterized from the structural, morphological, optical, and electrical points of view using X-ray diffraction, scanning electron microscopy, atomic force microscopy, spectroscopic ellipsometry and by Hall effect measurements, respectively. The results showed that the thickness, optical constants and carrier numbers depend strongly on the type of substrate, number of deposited layers and sol concentration. The optical properties of ITO films are closely related to their electrical properties. The enhancement of the conductivity was possible with the increase of crystallite size (which occurred after thermal treatment) and with the reduction of surface roughness.