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运用等离子体发射光谱,分析衬底温度对氮化锌薄膜制备过程中各等离子体活性基团的影响,随着温度升高,N*2第一正系B3Πg→A3Σ+u,N*2第二正系C3Πu→B3Πg,N+*2第一负系B2Σ+u→X2Σ+g,Zn*以及Zn+*活性基团等离子体发射光谱特征谱线强度逐渐增强;由于衬底温度升高,腔室中各离子动能增加,使得碰撞电离加剧,导致N*2,N+*2,Zn*以及Zn+*活性基团的等离子体离子密度增加;等离子体发射光谱分析结果表明衬底温度在一定范围内升高有利于氮化锌薄膜生长。采用离子源辅助磁控溅射技术在Al薄膜上制备Zn3N2薄膜;X射线衍射图谱(XRD)分析结果表明:室温下,反应生长出单一择优取向面(321)氮化锌薄膜;随着温度的升高,在Al膜上反应生长的氮化锌薄膜择优取向面逐渐丰富,出现(222),(400),(600),(411),(332),(431)以及(622)择优取向面,体现出随着衬底温度的升高,薄膜的结晶度逐渐增加。XP-1台阶仪分析的结果表明,随着衬底温度的升高,氮化锌薄膜的沉积率逐渐增大。场效应扫描电子显微镜(SEM)图表明氮化锌薄膜晶粒尺寸随着衬底温度的升高逐渐变小,表面结构更加致密,晶粒排列更加有序;SEM断面扫描显示Al膜和氮化锌薄膜结合非常紧密。衬底温度影响薄膜性能实验分析结果与等离子体发射光谱分析的结果基本一致,体现出等离子体发射光谱了解等离子体内在特性的有效、快捷性。 相似文献
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STUDY ON THE OPTICAL PROPERTIES AND HYDROGEN CONTENT OF THE SILICON NITRIDE THIN FILM 总被引:2,自引:0,他引:2 下载免费PDF全文
The Si3N4 thin films have been manufactured by electron cyclotron resonance plasma enhanced chemical vapour deposition technology on the KBr and (111) monocrystal Si sub-strates, The infrared optical properties of the Si3N4 film have been studied by analysing its IR spectrum. The results show that the Si3N4 film can be used as an antireflexion and an-tireflectiug film of Si surface, The H content of Si3N4 thin film has been estimated from the infrared absorption area. It is obtained that the H content of the Si3N4 film deposited on the KBr substrate is lower than that deposited on Si substrate, and it derceases with increasing deposition temperature. The Raman spectra of the Si3N4 film deposited at 360℃ has also been measured. 相似文献
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由偏心静电单探针诊断了电子回旋共振等离子体增强化学汽相沉积(ECR-PECVD)反应室内等离子体密度的空间分布规律.结果表明在轴向位置Z=50cm处,直径Φ12cm范围内等离子体密度分布非常均匀.分析了等离子体密度径向均匀性对沉积速率均匀性和薄膜厚度均匀性的影响.讨论了沉积制备一定薄膜厚度的Si3N4薄膜的工艺重复性.研究了各种沉积工艺参数与Si3N4薄膜沉积速率的相互关系.得到了ECR-PECVD技术在沉积薄膜时的工
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对电子回旋共振低温等离子体化学气相沉积工艺(ECR-PECVD)沉积GaN薄膜过程中的氮气和三甲基镓有机金属气体(TMG)混合气体等离子体发射光谱进行分析。结果表明TMG 在等离子体自加热条件下就发生离解,N2/TMG混合气体ECR等离子体主要以Ga气体粒子和亚稳态氮分子为主。发射光谱特征谱线随微波功率变化分析表明:当微波功率高于400 W时,亚稳态氮分子浓度随着微波功率的增加而增加,而高激发态氮分子以及氮分子离子浓度却随着减少。 相似文献
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INVESTIGATION ON THE COMPOSITION AND STRUCTURE OF SILICON NITRIDE FILM PREPARED BY ECR-PECVD 总被引:2,自引:0,他引:2 下载免费PDF全文
In this paper, the effect of temperature on the composition and structure of the Si3N4 thin film is investigated. X-ray diffraction pattern and transmission electron microscope (TEM) analyses show that the Si3N4 film undergoes the transition from amorphous to crystalline phase with increasing deposition temperature. Infra-red qualitative analysis shows that the content of hydrogen decreases with increasing deposition temperature.The stoichiometric of Si3N4 is investigated by X-ray photoelectron spectroscopy or electron spectroscopy for chemical analysis. 相似文献