电离辐射环境下的部分耗尽绝缘体上硅n型金属氧化物半导体场效应晶体管可靠性研究

随着半导体技术的进步, 集成小尺寸绝缘体上硅器件的芯片开始应用到航空航天领域, 使得器件在使用中面临了深空辐射环境与自身常规可靠性的双重挑战. 进行小尺寸器件电离辐射环境下的可靠性试验有助于对器件综合可靠性进行评估. 参照国标GB2689.1-81恒定应力寿命试验与加速寿命试验方法总则进行电应力选取, 对部分耗尽绝缘体上硅n型金属氧化物半导体场效应晶体管进行了电离辐射环境下的常规可靠性研究. 通过试验对比, 定性地分析了氧化物陷阱电荷和界面态对器件敏感参数的影响, 得出了氧化物陷阱电荷和界面态随着时间参数的变化, 在不同阶段对器件参数的影响. 结果表明, 总剂量效应与电应力的共同作用将加剧器件敏感参数的退化, 二者的共同作用远大于单一影响因子.     

(1+2)维各向同性介质中的旋转椭圆空间光孤子

从(1+2)维非局域非线性薛定谔方程出发, 通过坐标变换得到了旋转坐标系下的非局域非线性薛定谔方程. 假设响应函数为高斯型, 用虚时间法数值求解了旋转坐标系下的非局域非线性薛定谔方程的静态孤子解, 迭代出了不同非局域程度条件下的静态椭圆孤子数值解. 最后采用分步傅里叶算法, 以迭代的孤子解作为初始输入波形, 模拟了在不同的非局域程度条件下, (1+2)维椭圆空间光孤子的旋转传输特性. 强非局域时, 椭圆光孤子的长轴方向和短轴方向波形都是高斯型, 其他的非局域程度下, 不是高斯型. 由此表明：(1+2)维椭圆光孤子对非局域程度依赖性很强. 旋转角速度和功率均与非局域程度以及孤子的椭圆度有关.     

电荷耦合器件在质子辐照下的粒子输运仿真与效应分析

应用蒙特卡洛方法计算了质子在科学级电荷耦合器件(charge-coupled device, CCD) 结构中的能量沉积, 并结合该CCD的质子辐照试验及退火试验数据, 分析了器件的辐射损伤机理. 仿真计算体硅内沉积的位移损伤剂量和栅氧化层的电离损伤剂量, 辐照与退火试验过程中主要考察暗信号、电荷转移效率两个参数的变化规律. 研究结果显示, 暗信号和电荷转移效率的变化规律与位移、电离损伤剂量一致; 退火后暗信号大幅度降低, 辐照导致的表面暗信号增加占总暗信号增加的比例至少为80%; 退火后电荷转移效率恢复较小, 电荷转移效率降低的原因主要为体缺陷. 通过总结试验规律, 推导出了电荷转移效率退化程度的预估公式及其损伤因子k_damage.     

基于PREF的扫描磁铁电源设计与实现

PREF装置是中国科学院新疆理化技术研究所与近代物理研究所联合设计建造的10～60 MeV质子同步加速器,属于国内唯一的位移损伤效应模拟试验专用装置。针对该装置的扫描磁铁电源输出电流频率200 Hz、跟踪误差小于≤±5×10^-3的技术要求,采用三组H桥串联拓扑方案,通过移相控制,基于脉宽调制实现技术要求。经仿真与测试结果表明：电源能够输出峰-峰值为±420 A,幅值与频率均连续可调的高精度三角波电流,满足工程应用要求。     

Propagation of optical vortex solitons due to the Gouy phase in strongly nonlocal nonlinear media

In this paper,we present a study on the propagation of the symmetrical optical vortices formed by two collinear Laguerre-Gauss solitons in strongly nonlocal nonlinear media.The optical vortices,which move along the beam axis as the light propagates,result in a rotation of the beam’s transverse profile.This physical reason of the rotation is the Gouy phase acquired by the component beams.     

Bias Dependence of Radiation-Induced Narrow-Width Channel Effects in 65 nm NMOSFETs

The bias dependence of radiation-induced narrow-width channel effects(RINCEs) in 65-nm n-type metal-oxidesemiconductor field-effect transistors(NMOSFETs) is investigated. The threshold voltage of the narrow-width65 nm NMOSFET is negatively shifted by total ionizing dose irradiation, due to the RINCE. The experimental results show that the 65 nm narrow-channel NMOSFET has a larger threshold shift when the gate terminal is kept in the ground, which is contrary to the conclusion obtained in the old generation devices. Depending on the three-dimensional simulation, we conclude that electric field distribution alteration caused by shallow trench isolation scaling is responsible for the anomalous RINCE bias dependence in 65 nm technology.     

A study on the real-time radiation dosimetry measurement system based on optically stimulated luminescence

The optically stimulated luminescent (OSL) radiation dosimeter technically surveys a wide dynamic measurement range and a high sensitivity. Optical fiber dosimeters provide capability for remote monitoring of the radiation in the locations which are difficult-to-access and hazardous. In addition, optical fiber dosimeters are immune to electrical and radio-frequency interference. In this paper, a novel remote optical fiber radiation dosimeter is described. The optical fiber dosimeter takes advantage of the charge trapping materials CaS:Ce, Sm that exhibit OSL. The measuring range of the dosimeter is from 0.1 to 100 Gy.     

A novel technique for predicting ionizing radiation effects of commercial MOS devices

A nondestructive selection technique for predicting ionizing radiation effects of commercial metal-oxide-semiconductor (MOS) devices has been put forward. The basic principle and application details of this technique have been discussed. Practical application for the 54HC04 and 54HC08 circuits has shown that the predicted radiation-sensitive parameters such as threshold voltage, static power supply current and radiation failure total dose are consistent with the experimental results obtained only by measuring original electrical parameters. It is important and necessary to choose suitable information parameters. This novel technique can be used for initial radiation selection of some commercial MOS devices.     

双光学孤子脉冲的传输特性

本文首先指出了算法分裂步骤(split-step)Fourier法和光束传播(propagating-beam)法的等价性.利用这种算法,数字地模拟了可变等振幅孤子脉冲对在无耗光纤中的传输过程,结果证明:提高振幅可使孤子的相互作用大大减小.