Multiple ionization of argon accompanied by electron loss and capture of 0.22-6.35 MeV C^q＋ ions

In this paper a projectile ions recoil ions coincidence technique is employed to investigate the target ionization and projectile charge state changing processes in the collision of 0.22-6.35 MeV Cq^＋ （q = 1 - 4） ions with argon atoms. The partial cross section ratios of the double, triple, quadruplicate ionization to the single ionization （or the single capture） of argon associated with single electron loss （or single electron capture） by the projectile are measured and compared with the previous experimental results. In the present experiment, it is observed that the ratios of ionization cross sections R associated with single loss and single capture depend strongly on the projectile charge state and vary significantly with different reaction channels as impact energy increases. In addition, this paper gets empirical scaling laws for the ionization cross section ratios R corresponding to the projectile single loss and finds that the ratios of the double ionization to the single ionization associated with single electron capture remain constant in the present energy range.     

Double Electron Processes in Collisions of Partially Stripped Ions C^q＋ （q = 1-4） with Helium

The multi-electron processes are investigated for 17.9-120 keV/u C^1＋, 30-323 keV/u C^2＋, 120-438 keV/u ^C3＋, 287-480 keV/u C^4＋ incident on a helium target. The cross-section ratios of double electron （DE） process to the total of the single electron （SE） and the double electron process （i.e. SE＋DE）, the direct double electron （DDI） to the direct single ionization （DSI） as well as the contributions of DDI to DE and of TI to DE are measured using coincidence techniques. The energy and charge state dependences of the measured cross-section ratios are studied and discussed.