Numerical analysis of plasma arc physical characteristics under additional constraint of keyhole

The physical characteristics of a plasma arc affect the stability of the keyhole and weld pool directly during keyhole plasma arc welding(KPAW). There will be significant change for these characteristics because of the interaction between the keyhole weld pool and plasma arc after penetration. Therefore, in order to obtain the temperature field, flow field, and arc pressure of a plasma arc under the reaction of the keyhole, the physical model of a plasma arc with a pre-set keyhole was established. In addition, the tungsten and base metal were established into the calculated domain, which can reflect the effect of plasma arc to weld pool further. Based on magneto hydrodynamics and Maxwell equations, a two-dimensional steady state mathematical model was established. Considering the heat production of anode and cathode, the distribution of temperature field, flow field, welding current density, and plasma arc pressure were solved out by the finite difference method. From the calculated results, it is found that the plasma arc was compressed a second time by the keyhole. This additional constraint results in an obvious rise of the plasma arc pressure and flow velocity at the minimum diameter place of the keyhole, while the temperature field is impacted slightly. Finally, the observational and metallographic experiments are conducted, and the shapes of plasma arc and fusion line agree with the simulated results generally.     

基于标准温度法的电弧高温区自动判别研究

在电弧等离子体的光谱诊断中,标准温度法测温原理与目前先进的图像传感技术相结合,通过特征谱图像完成电弧全场温度信息采集,因其良好的时、空分辨率而被广泛应用于电弧温度测量。但是谱线的发射系数与等离子体温度不是单调变化关系,传统标准温度法选取一条ArⅠ谱线完成对电弧等离子体的测量,在电弧内部的高温电离区域产生谱线辐射强度降低的现象,需要人为判定电弧不同位置所处的温度区间才能完成温度的计算,整个过程无法通过软件自主完成。针对此问题,根据电弧等离子体的局部热力学平衡条件,探索一种基于双特征谱线的标准温度法测温原理,通过融合电弧在外层低温区域聚集的Ar原子发出的ArⅠ谱线发射系数场,和在高温区域的Ar一次电离离子所发出的ArⅡ特征谱线发射系数场,将达到ArⅠ谱线标准温度的位置处的ArⅡ谱线发射系数作为电弧不同温度区域的判定依据,完成电弧等离子体高温区域的自动判别,继而应用ArⅠ谱线发射系数与温度对应关系在电弧高、低温区域分别计算电弧温度,消除单一的ArⅠ谱线发射系数场暗区给计算带来的不利影响;设计并搭建了一种镜前分幅采集系统,其中分光镜将弧光等能量分成两束,利用两组反射镜和窄带滤光片建立起两路光学通道,使CMOS在一次曝光中完成两组电弧特征谱图像的采集,并且两幅图像的采集时刻、焦距、光圈等拍摄参数完全一致,达到良好的时间、空间一致性,从而减小谱线融合时误差的输出,满足了原位获取两组电弧特征谱图像的需求;为验证测量系统可行性以及后期的电弧图像提取,以黑白棋盘为标靶,用Harris算子对系统采集的图像进行扫描,根据角点坐标证明系统所采集的两幅图像具有良好的一致性,并且据此将两幅图像做归一化处理,以便后期的电弧特征谱图像的提取;通过假设所测电弧等离子具有轴对称属性,以CMOS所采集的特征谱图像亮度信息作为电弧发射系数场在不同角度下的投影依据,经过中值滤波降噪后,利用ML-EM迭代重建算法求解电弧的三维发射系数分布。实验中,选择受自吸收效应影响较小的ArⅠ696.5 nm谱线和ArⅡ480.6 nm谱线为测量目标,并且在696.5 nm谱线的光通路中加入OD0.4的中性减光片,使两幅特征谱图像的最高亮度值保持一致。选取150A焊接等离子弧为测量对象,经ML-EM法三维还原后,将两条谱线发射系数场等像素融合,在ArⅠ谱线发射系数达到最大值的像素点位置处,ArⅡ谱线发射系数达到ε_rp,判定ArⅡ谱线发射系数大于ε_rp的像素点位置为电弧高温区域,其余位置为低温区域,最终在不同温度区域自动完成焊接等离子弧的温度计算。实验结果表明696.5 nm谱线和480.6 nm谱线发射系数场融合后可以自动识别电弧高温区域,继而完成电弧等离子体的自动测量,为电弧温度实时监测的实现提供更多可能。