类比法剖析毛细现象的能量分配

毛细现象的能量来源曾经有过激烈的讨论,但能量分配并未解释清楚.将毛细管中液柱上升运动与盘曲链条升降运动进行类比,通过受力及做功分析,明确了毛细现象中能量的分配问题,即毛细恒力做功与液柱重力势能变化、动能损失、滞阻损失之间的关系,并进行了实验验证.     

拉脱法测表面张力系数测量值不稳定的原因分析与验证

拉脱法测量液体表面张力系数实验中,采用薄壁(0.6 mm)吊环和标准(1.0 mm)吊环,测量值相对稳定;但对于较厚壁(1.5,2.0,2.5 mm)吊环,每次测量值差别很大.通过手机拍摄视频,对不同时刻的液膜形状进行理论和实验分析,发现测量值不稳定的主要原因是颈缩突变,即拉伸过程中,液膜收缩从吊环外壁突变到内壁的程度不同,导致后续液膜断裂点的位置相差非常大,造成测量值的起伏不定.因此需将吊环平均直径替换为断裂时的液膜直径,对测量值进行修正.结果表明：修正后的表面张力系数与理论值的误差减小到了4.0%以内,验证了理论分析的正确性.     

Structural evolution of a-Si:H/SiO2 multilayers upon step by step thermal annealing

a-Si:H/SiO_2 multilayers were prepared by alternatively changing plasma enhanced chemical vapour deposition of a-Si:H layers and in situ plasma oxidation process. Subsequently, as-grown samples were annealed at temperatures from 350℃ to 1100℃ in N_2 ambient with an increment of 100℃. The evolution of bonding configurations and structures with annealing treatments was systematically investigated by Fourier-transform infrared spectroscopy. The peak position of Si－O stretching vibration of SiO_2 layers shift to 1087cm^{-1} after annealing at 1100℃, which demonstrates that the SiO_2 films fabricated by plasma oxidation after high temperature annealing can have similar properties to the thermal grown ones. A Si－O vibration from interfacial SiO_x was identified: the value x was found to increase as increasing the annealing temperature, which is ascribed to the cooperation of hydrogen effusion and reordering of the oxygen bond in SiO_x networks. The H-related bonds were observed in the form of H－Si－O_3 and H－Si－Si_{3-n}O_n (n=1－2) configurations, which are supposed to be present in SiO_2 and interfacial SiO_x layers, respectively. The H atoms bonded in different bonding configurations effuse at different temperatures due to their different desorption energies.     

盘曲链条升降运动分析

研究发现,静止于桌面足够长的盘曲链条,被竖直向上的恒力F拉起,链条将做上下升降运动,其周期最终为■（a为平衡位置高度,g为重力加速度）.链条的速度最大值和动能最大值没有同时出现,也并非在振动平衡位置.能量损耗随着周期数的增加逐渐减小,最终损耗总量为拉力做功的■.该运动的实例可以通过链条在水中受到恒定浮力来展现.