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1.
The multilayer Laue lens (MLL) is a novel diffraction optics which can realize nanometer focusing of hard X-rays with high efficiency. In this paper, a 7.9 μm-thick MLL with the outmost layer thickness of 15 nm is designed based on dynamical diffraction theory. The MLL is fabricated by first depositing the depth-graded multilayer using direct current (DC) magnetron sputtering technology. Then, the multilayer sample is sliced, and both cross-sections are thinned and polished to a depth of 35-41 μm. The focusing property of the MLL is measured at the Shanghai Synchrotron Facility (SSRF). One-dimensional (1D) focusing resolutions of 205 nm and 221 nm are obtained at E=14 keV and 18 keV, respectively. It demonstrates that the fabricated MLL can focus hard X-rays into nanometer scale.  相似文献   
2.
Aperiodic molybdenum/silicon (Mo/Si) multilayer designed as a broadband reflective mirror with mean reflectivity of 10% over a wide wavelength range of 12.5-28.5 nm at incidence angle of 5° is developed using a numerical optimized method. The multilayer is prepared using direct current magnetron sputtering technology. The reflectivity is measured using synchrotron radiation. The measured mean reflectivity is 7.0% in the design wavelength range of 12.5-28.5 nm. This multilayer broadband reflective mirror can be used in extreme ultraviolet measurements and will greatly simplify the experimental arrangements.  相似文献   
3.
基于多层膜技术的劳厄(Laue)透镜能实现硬X射线纳米级聚焦,在X射线微纳分析领域具有重要的应用前景.基于衍射动力学理论,分析了X射线在多层膜劳厄透镜中的传播,计算了不同结构的多层膜劳厄透镜对8 keVX射线的聚焦性能.结果表明,最外层厚度为5 nm的倾斜多层膜劳厄透镜可获得5.7 nm的聚焦光斑和26%的平均衍射效率...  相似文献   
4.
周期多层膜Kirkpatrick-Baez显微镜成像性质分析   总被引:1,自引:1,他引:0       下载免费PDF全文
 分析了Kirkpatrick-Baez(KB)显微镜的成像性质与周期多层膜元件间的关系。基于分辨力和集光效率要求,设计了KB显微镜的光学结构,模拟了KB系统的成像质量,用W/B4C周期多层膜反射镜进行了X射线成像实验,在±100 μm视场内得到优于5 μm的空间分辨力结果。实验与模拟结果的对比表明,加工精度和球差是影响中心视场分辨力的关键因素,有效视场的大小受多层膜角度带宽的限制。  相似文献   
5.
基于多层膜技术的硬X射线Laue透镜衍射效率的理论研究   总被引:1,自引:0,他引:1  
采用耦合波理论分析了X射线在多层膜Laue透镜中的传播,选择Cu的Kα线作X射线光源,计算了多层膜Laue透镜的衍射效率.材料为WSi2/Si,最外层宽度为10 nm,深度为8 500 nm的多层膜Laue透镜,倾斜情况下外层区域局部光栅的衍射效率可达59%,理论上证明了多层膜Laue透镜是实现X射线聚焦的有效手段.  相似文献   
6.
The multilayer (ML) mirror with high-reflectivity (HR) at a specific emission line of 19.5 nm (Fe line) and low-reflectivity (LR) at 30.4 nm (He line) is needed to be designed and fabricated for observing the image of sun. Based on a variety of optimizations utilized different structures, the design is performed and the final results demonstrate that the reflectivity at 30.4 nm does not achieve minimum value when the reflectivity at 19.5 nm reaches the maximum value. The tradeoff should be done between the HR at 19.5 nm and LR at 30.4 nm. One optimized mirror is fabricated by direct current magnetron sputtering and characterized by grazing-incident X-ray diffraction (XRD) and synchrotron radiation (SR). The experimental results demonstrate that the ML achieves the reflectivity of 33.3% at 19.5 nm and of 9.6× 10-4 at 30.4 nm at the incident angle of 13°.  相似文献   
7.
采用直流磁控溅射技术制备了厚度约100 nm的W,WSi2,Si单层膜和周期约为20 nm,Si膜层厚度与周期的比值为0.5的W/Si,WSi2/Si周期多层膜.利用台阶仪对镀膜前后基底表面的面形进行了测试,计算并比较了不同膜系的应力值.结果表明:W单层膜表现出较大的压应力,而W/Si周期膜则表现为张应力.WSi2单层...  相似文献   
8.
在北京同步辐射装置(BSRF)的3W1B软X射线光束线上利用自行研制的同步辐射软X射线综合偏振测量装置对Ni的M2,3边附近(60—70 eV)进行了软X射线磁光(magneto-optical)法拉第效应(Faraday effect)的偏转测量,实验装置主要由起偏器,检偏器,样品架,圆形钕铁硼永磁铁和MCP探测器组成,偏振元件(起偏元件和检偏元件)均采用反射式非周期性Mo/Si宽带多层膜.实验采用反射起偏和反射检偏的模式,得到一系列能量范围在60—70 eV间的法拉第偏转角结果, 关键词: 软X射线 磁光Faraday效应 综合偏振测量装置 宽带多层膜  相似文献   
9.
The B4C/Mo/Si high reflectivity multilayer mirror was designed for He-Ⅱradiation (30.4 nm) using the layer-by-layer method. The theoretical peak reflectivity was up to 38.2% at the incident angle of 5℃. The B4C/Mo/Si multilayer was fabricated by direct current magnetron sputtering and measured at the National Synchrotron Radiation Laboratory (NSRL) of China. The experimental reflectivity of the B4C/Mo/Si multilayer at 30.4 nm was about 32.5%. The promising performances of the B4C/Mo/Si multilayer mirror could be used for the construction of solar physics instrumentation.  相似文献   
10.
液体表面的遮光效应及其应用   总被引:5,自引:3,他引:2  
首次发现了液体介质表面的遮光效应,讨论了遮光半径与液体介质性质的关系.基于这一发现,建立了一种测量液体折射率的新方法,该方法具有实时、自动化、高精度等特点.  相似文献   
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