Dopant diffusion and surface morphology of vanadium implanted 4H-silicon carbide

The diffusion behaviours of vanadium implanted p- and n-type 4H-SiC are investigated by using the secondary ion mass spectrometry （SIMS）. Significant redistribution, especially out-diffusion of vanadium towards the sample surface is not observed after 1650 ℃annealing for both p- and n-type samples. Atomic force microscopy （AFM） is applied to the characterization of surface morphology, indicating the formation of continuous long furrows running in one direction across the wafer surface after 1650 ℃ annealing. The surface roughness results from the evaporation and re-deposition of Si species on the surface during annealing. The chemical compositions of sample surface axe investigated using x-ray photoelectron spectroscopy （XPS）. The results of C ls and Si 2p core-level spectra axe presented in detail to demonstrate the evaporation of Si from the wafer and the deposition of SiO2 on the sample surface during annealing.     

热退火对Mn离子注入非故意掺杂GaN微结构、光学及磁学特性的影响

通过Mn离子注入非故意掺杂GaN外延层制备了GaN:Mn薄膜,并研究了退火温度对GaN:Mn薄膜的微结构、光学及磁学特性的影响.对不同退火温度处理后的GaN:Mn薄膜的拉曼谱测试显示,出现了由与离子注入相关的缺陷的局域振动(LV)和(Ga,Mn)N中Mn离子的LV引起的新的声子模.在GaN:Mn薄膜的光致发光谱中观察到位于2.16,2.53和2.92 eV处的三个新发光峰(带),其中位于2.16 eV处的新发光带不能排除来自Mn相关辐射复合的贡献.对GaN:Mn薄膜的霍尔测试显示,退火处理后样品表现出n型体材料特征.对GaN:Mn薄膜的振动样品磁强计测试显示,GaN:Mn薄膜具有室温铁磁性,其强弱受Mn相关杂质带中参与调节磁相互作用的空穴浓度的影响.     

Study of （Ga,Mn）N prepared by Mn-ion implantation using optical techniques

This paper reports that （Ga, Mn）N is prepared using implantation of 3at.% Mn Ions into undoped GaN. Structural characterization of the crystals was performed using x-ray diffraetion（XRD）. Detailed XRD measurements have revealed the characteristic of Mn-ion implanted GaN with a small contribution of other compounds. With Raman spectroscopy measurements, the spectra corresponding to the intrinsic GaN layers demonstrate three Raman active excitations at 747, 733 and 566 cm-1 identified as EI（LO）, A1 （LO） and E~, respectively. The Mn-doped GaN layers exhibit additional excitations at 182, 288, 650 725, 363, 506cm^-1 and the vicinity of E~ mode. The modes observed at 182, 288, 650 725em 1 are assigned to macroscopic disorder or vacancy-related defects caused by Mn-ion implantation. Other new phonon modes are assigned to Mnx-Ny, Gax-Mny modes and the local vibrational mode of Mn atoms in the （Ga, Mn）N, which are in fair agreement with the standard theoretical results.     

红霉素琥珀酸乙酯与茜素磺酸钠的荷移反应研究

研究了红霉素琥珀酸乙酯与茜素磺酸钠的荷移反应 ,建立了一种测定红霉素琥珀酸乙酯的方便、快捷的荷移分光光度法。红霉素琥珀酸乙酯与茜素磺酸钠在乙醇 -水介质中发生电荷转移反应 ,荷移络合物在波长 5 30 nm处有最大吸收 ,表观摩尔吸光系数为 7.90× 10 3 L· mol-1·cm-1,该络合物的组成为 1∶ 1,稳定常数是 1.3× 10 5。药物浓度在 10— 10 0 mg/L范围内服从比耳定律。当红霉素琥珀乙酯浓度为 5 0 mg/L时 ,6次测定结果的相对标准偏差为 1.33%。回收率 >98%。本法测定了红霉素琥珀酸乙酯片中有效成分的含量与药典法比较 ,二者结果吻合。     

Raman scattering studies on manganese ion-implanted GaN

This paper reports that the Raman spectra have been recorded on the metal-organic chemical vapour deposition epitaxially grown GaN before and after the Mn ions implanted. Several Raman defect modes have emerged from the implanted samples. The structures around 182 cm-1 modes are attributed to the disorder-activated Raman scattering, whereas the 361 cm-1 and 660 cm-1 peaks are assigned to nitrogen vacancy-related defect scattering. One additional peak at 280 cm-1 is attributed to the vibrational mode of gallium vacancy-related defects and/or to disorder activated Raman scattering. A Raman-scattering study of lattice recovery is also presented by rapid thermal annealing at different temperatures between 700°C and 1050°C on Mn implanted GaN epilayers. The behaviour of peak-shape change and full width at half maximum (FWHM) of the A1(LO) (733 cm-1) and E2H (566 cm-1) Raman modes are explained on the basis of implantation-induced lattice damage in GaN epilayers.     

不同价态Mn掺杂InN电子结构、磁学和光学性质的第一性原理研究

采用密度泛函理论体系下的广义梯度近似GGA+U平面波超软赝势方法,在构建了纤锌矿结构的InN超胞及三种不同有序占位Mn~(2+),Mn~(3+)价态分别掺杂InN超胞模型,并进行几何优化的基础上,计算了掺杂前后体系的电子结构、能量以及光学性质.计算结果表明:Mn掺杂后体系总能量和形成能降低,稳定性增加,并在费米能级附近引入自旋极化杂质带,体系具有明显的自旋极化现象.掺杂不同价态的Mn元素对体系电子结构和磁学性质产生了不同的影响.电子结构和磁性分析表明掺杂体系的磁性来源于p-d交换机制和双交换机制的共同作用,Mn~(3+)价态掺杂有利于掺杂体系的居里温度达到室温以上.与未掺杂InN相比,不同价态Mn元素掺杂后体系的静态介电函数显著增大,掺杂体系介电函数虚部和吸收光谱在低能区域出现了较强的新峰,分析认为这些新峰主要来自与费米能级附近自旋极化杂质带相关的跃迁.