Expected reliability of communication protocols

We consider the problem of sending a message from a sender $s$ to a receiver $r$ through an unreliable network by specifying in a protocol what each vertex is supposed to do if it receives the message from one of its neighbors. A protocol for routing a message in such a graph is finite if it never floods $r$ with an infinite number of copies of the message. The expected reliability of a given protocol is the probability that a message sent from $s$ reaches $r$ when the edges of the network fail independently with probability $1?p$.We discuss, for given networks, the properties of finite protocols with maximum expected reliability in the case when $p$ is close to 0 or 1, and we describe networks for which no one protocol is optimal for all values of $p$. In general, finding an optimal protocol for a given network and fixed probability is challenging and many open problems remain.     

Delay of terminal current in systems with abruptly changed Hamiltonian

The current response for the parameter change of a mesoscopic system is a practical issue for future's circuit design. Nowadays most considered cases are various types of bias modulation, while the effect of change of conductor Hamiltonian is seldom addressed. In this paper, we investigate the response of ballistic transport induced by a sudden change of the conductor Hamiltonian. We formulize the terminal current in language of non-equilibrium Green's function. Our method is applied to one-dimensional tight-binding chains and we find that the terminal current has a delay to the Hamiltonian change. The amount of delay is not determined by the velocity of incident electrons in the bias window, but depends on the tight-binding hopping energy γ. The delay of current response at the detecting point away from where the Hamiltonian changes is $C{\gamma }^{?1}$, where C is a constant independent of the system.     

应力为SGBVE分布强度为指数分布下结构可靠度的估计

考虑了应力服从SGBVE分布,强度服从指数分布的应力—强度模型,分别在应力参数未知和部分强度参数未知的情形下给出了该模型可靠度的估计,并讨论了其性质.     

High throughput N-modular redundancy for error correction design of memristive stateful logic

Memristive stateful logic is one of the most promising candidates to implement an in-memory computing system that computes within the storage unit. It can eliminate the costs for the data movement in the traditional von Neumann system. However, the instability in the memristors is inevitable due to the limitation of the current fabrication technology, which incurs a great challenge for the reliability of the memristive stateful logic. In this paper, the implication of device instability on the reliability of the logic event is simulated. The mathematical relationship between logic reliability and redundancy has been deduced. By combining the mathematical relationship with the vector-matrix multiplication in a memristive crossbar array, the logic error correction scheme with high throughput has been proposed. Moreover, a universal design paradigm has been put forward for complex logic. And the circuit schematic and the flow of the scheme have been raised. Finally, a 1-bit full adder (FA) based on the NOR logic and NOT logic is simulated and the mathematical evaluation is performed. It demonstrates the scheme can improve the reliability of the logic significantly. And compared with other four error corrections, the scheme which can be suitable for all kinds of R-R logics and V-R logics has the best universality and throughput. Compared with the other two approaches which also need additional complementary metal-oxide semiconductor (CMOS) circuits, it needs fewer transistors and cycles for the error correction.     

具有N策略和负顾客的反馈抢占型M/G/1重试可修排队模型解的渐近行为

研究具有N策略和负顾客的反馈抢占型M/G/1重试可修排队模型的时间依赖解的渐近行为.当初步服务的失效率函数η(x),主要服务的失效率函数μ(x)和修理时间的失效率函数ψ(x)满足0η≤η(x)≤η∞,0μ≤μ(x)≤μ∞,0ψ≤ψ(x)≤ψ∞并且η(x)是Lipschitz连续函数时,证明模型的时间依赖解指数稳定.     

数学模型在高校领军人才评审中的应用

教育评估的可靠性决定了评估结果的可信性,影响着教育评估的声誉和发展.结合高校领军人才评审探讨了数学可靠性模型在教育评估中的应用,通过建立数学可靠性模型,计算评审系统的可靠性,并结合可靠性计算结果分析了影响评审系统可靠性的因素.