排序方式: 共有82条查询结果,搜索用时 15 毫秒
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建立一种利用高效液相色谱结合荧光检测器准确测定2-噁唑烷酮含量的方法。样品中的2-噁唑烷酮和占吨氢醇在60℃的条件下衍生70 min后,直接进样分析。采用月旭XB-C18色谱柱,流动相为0.02 mol/L乙酸钠水溶液和乙腈,检测器波长为λex=213 nm,λem=308 nm,流速1.0 mL/min,柱温35℃的条件下。2-噁唑烷酮浓度在0.5~50.0mg/mL时,线性关系良好(R2=0.9995),检测限和定量限分别为0.005 mg/L、0.016 mg/L。该方法准确、灵敏、快速,适用于2-噁唑烷酮含量的检测。 相似文献
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光纤布喇格光栅沉降传感器 总被引:2,自引:1,他引:1
根据光纤布喇格光栅的光学传感原理,提出了一种基于悬臂梁及金属弹性膜片的光纤布喇格光栅沉降传感器结构,对其传感特性进行了实验研究.实验通过产生水的液位差来模拟地基沉降,分析结果显示,光纤布喇格光栅中心反射波长漂移对液位差呈现良好的线性关系,线性度高于0.999,灵敏度可达-2.11 pm/mm.通过改变悬臂梁厚度和有效长度,可以对传感器测量范围和灵敏度进行调整,以满足各种应用场合.综合实验结果,该传感器在桥梁、铁路地基等沉降监测方面具有重要意义. 相似文献
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As part of the design and machining of the RFQ accelerator in the Compact Pulsed Hadron Source (CPHS) project at Tsinghua University, the design process of the undercuts and dipole stabilizer rods is presented in this paper. In particular, the relationship between the inter-vane voltage slope and the local frequency of the undercut section is described quantitatively. With the identification of modes existing in the cavity, the specific parameters are optimized by the SUPERFISH and MAFIA codes. In addition, the water-cooling requirement of the dipole stabilizer rods is briefly discussed. 相似文献
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基于金属-氧化物-半导体-场效应管(MOSFET)辐射损伤的微观机理,推导出了MOSFET经历辐照之后氧化层空穴俘获与阈值电压漂移之间关系的表达式.又根据MOSFET中1/f噪声产生的微观机理,建立了辐照之前MOSFET的1/f噪声功率谱幅值与阈值电压漂移量之间的定量关系,并通过实验予以验证.结果表明,辐照之前的1/f噪声功率谱幅值与辐照之后的阈值电压漂移量存在正比例关系,阈值电压漂移量可以反映出MOSFET内部的潜在缺陷的退化程度,因此,该模型有助于利用1/f噪声参量来表征MOSFET内部潜在缺陷的数量和严重程度. 相似文献
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Grain boundary plays a key role in electromigration process of polycrystal interconnection. We take a free volume to represent a ’vacancy-ion complex’ as a function of grain boundary specific resistivity, and develop a new characterisation model for grain boundary noise. This model reveals the internal relation between the boundary scattering section and electromigration noise. Comparing the simulation result with our experimental result, we find the source as well as the form of noise change in the electromigration process. In order to describe the noise enhancement at grain boundary quantitatively, we propose a new parameter-grain boundary noise enhancement factor, which reflects that the grain boundary noise can characterise the electromigration damage sensitively. 相似文献
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基于氧化层空穴俘获和质子诱导界面陷阱电荷形成物理机制的分析,分别建立了MOS结构电离辐射诱导氧化层陷阱电荷密度、界面陷阱电荷密度与辐射剂量相关性的物理模型.由模型可以得到,在低剂量辐照条件下辐射诱导产生的两种陷阱电荷密度与辐射剂量成线性关系,在中到高辐射剂量下诱导陷阱电荷密度趋于饱和,模型可以很好地描述这两种陷阱电荷与辐射剂量之间的关系.最后讨论了低剂量辐照下,两种辐射诱导陷阱电荷密度之间的关系,认为低辐射剂量下两者存在线性关系,并用实验验证了理论模型的正确性.该模型为辐射环境下MOS器件辐射损伤提供了更
关键词:
MOS结构
辐射
界面陷阱
氧化层陷阱 相似文献