Microstructural Exploration of the High Capacitance in RuO_2-ZrO_2 Coating

A high capacitance RuO₂-ZrO₂ coating was prepared by thermal decomposition method.Extended X-ray absorption fine structure(EXAFS),X-ray diffraction(XRD),high-resolution transmission electron microscope(HRTEM)and ab initio calculations were applied to understand the role of the microstructure in the acquisition of high specific capacitance of RuO₂-based oxides.The results show that the RuO₂-ZrO₂ oxide prepared at critical crystallization temperature can be considered to be quasi-amorphous or microcrystalline(A short-range ordered crystal structure can be seen from the TEM image,but no diffraction peaks can be seen from the XRD diffraction patterns).And this RuO₂-ZrO₂ was identified as a solid solution with high solid solubility.It referred to herein as a quasi-amorphous solid solution.Such a special microstructure was conducive for"synergistic catalysis"owing to the cationic interaction and thus could gain high"active site density"and high"active surface",thus developing high specific capacitance.     

退火温度对Ti/IrO2-CeO2电极组织结构与电容性能的影响

采用热分解法制备了钛基IrO2-CeO2二元氧化物涂层电极(Ti/IrO2-CeO2)。通过X射线荧光衍射(XRD),(SEM),循环伏安和交流阻抗等方法研究了退火温度对Ti/IrO2-CeO2涂层电极组织结构与电容性能的影响。结果表明,随退火温度升高,IrO2-CeO2涂层由非晶态向晶态转变,晶化程度逐渐升高;在460~480℃高温退火,IrO2-CeO2涂层中仍含有约28%的非晶态组织,说明CeO2有抑制IrO2晶化的作用。当退火温度为380℃时,电极的晶化程度约为25%,比电容达到最大值,并具有良好的循环稳定性。电极的电荷转移电阻取决于电极的晶化程度,随退火温度升高呈阶梯下降趋势。