Mathematical topographical correction of XPS images using multivariate statistical methods

For rough heterogeneous samples, the contrast observed in XPS images may result from both changes in elemental or chemical composition and sample topography. Background image acquisition and subtraction are frequently utilized to minimize topographical effects so that images represent concentration variations in the sample. This procedure may significantly increase the data acquisition time. Multivariate statistical methods can assist in resolving topographical and chemical information from multispectral XPS images. Principal component analysis (PCA) is one method for identification of the highest correlation/variation between the images. Topography, which is common to all of the images, will be resolved in the first most significant component. The score of this component contains spatial information about the topography of the surface, whereas the loading is a quantitative representation of the topography contribution to each elemental/chemical image. The simple‐to‐use self‐modelling mixture analysis (Simplisma) method is a pure variable method that searches for the source of most differences in the data and therefore has the potential to distinguish between chemical and topographical phases in images. The mathematical background correction scheme is developed and validated by comparing results to the experimental background correction for samples with differing degrees of topography. Copyright © 2004 John Wiley & Sons, Ltd.     

Capture of an Ensemble of Microparticles in the Field of Laser Multibeam Interference

Capture of an ensemble of polymeric microspheres in a water suspension under the action of optical gradient forces in the field of interfering laser beams has been investigated for the case of two-, three-, and four-beam interference. The self-diffraction and diffraction of radiation on induced ordered spatial distribution of particles have been obtained.     

摄像型等厚干涉实验仪器的研究

介绍了“摄像型等厚干涉实验仪”的构造及等厚干涉实验新的测量方法。     

数码相机原理与系统设计研究

介绍了数码相机的工作原理 ,分析了数码相机的系统结构 ,提出了设计数码相机的处理流程。典型的数码相机系统有镜头、闪光灯、光学取景器、LCD显示屏、图像数据存储扩展设备接口、图像数据传输接口、供电系统以及核心处理器等八个主要模块。数码相机的数据流向从图像传感器开始 ,止于图像数据的存储和传输。数据流的处理主要包括模数转换、光学黑电平钳位、针对镜头的边缘畸变的运算修正、坏像素处理、白平衡处理、伽马校正、色彩合成处理、边缘检测 (锐度检测 )和伪彩色检测 (伪彩色抑制 )、JPEG压缩和图像存储器等模块     

用频域法实现圆环形目标物的计数

研究了用频域法实现圆环形目标物计数的方法。对空域中含有圆环形目标物的二值图像，经傅里叶变换后在频域内进行滤波，再经傅里叶反变换后取一阈值进行处理，则对应于圆环形目标物即变为一个实心体，然后对实心体进行计数即可实现对圆环形目标物的计数。对该方法进行了数学描述，并分别用模拟图像和实际图像进行了实验。结果表明，该方法消除噪声的效果好，对部分封闭圆的检测同样有效，且可用于目标物有粘连的情况。该方法对圆环形目标物的尺寸相差不大的情况更为有效。     

透镜初级球差的横向剪切干涉条纹研究

利用玻璃平行平板构成简单的横向剪切干涉仪可以观察到单薄透镜形成的准直光束的剪切干涉条纹,由干涉条纹分布求出对应的几何像差和离焦量.用焦距为190 mm的单薄透镜做实验,实验结果与计算机模拟结果符合,说明可以从剪切干涉条纹的分布求出透镜的轴向调整误差和初级球差.     

一类非线性方程解的存在和唯一性及在图像中的应用

本文我们给出一个修正的非线性扩散方程模型，与Cotte Lions和Morel的模型相比该模型有许多实质上的优点。主要的想法是把原来去噪声部分：卷积Gauss过程替代为解一个有界区域上的线性抛物方程问题，因此避开了对初始数值如何全平面延拓的问题。我们从数学上的证明该问题解的存在性和适定性，同时给出对矩形域情况的解的级数形式。最后我们给基于本模型的数值计算差分模型，并且给出几个具体图像在该模型下处理结果。     

A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy

An apparatus has been designed and implemented to measure the elastic tensile properties (Young's modulus and tensile strength) of surface micromachined polysilicon specimens. The tensile specimens are “dog-bone” shaped ending in a large “paddle” for convenient electrostatic or, in the improved apparatus, ultraviolet (UV) light curable adhesive gripping deposited with electrostatically controlled manipulation. The typical test section of the specimens is 400 μm long with 2 μm×50 μm cross section. The new device supports a nanomechanics method developed in our laboratory to acquire surface topologies of deforming specimens by means of Atomic Force Microscopy (AFM) to determine (fields of) strains via Digital Image Correlation (DIC). With this tool, high strength or non-linearly behaving materials can be tested under different environmental conditions by measuring the strains directly on the surface of the film with nanometer resolution.     

多元线性回归应用于近代物理实验

本文介绍非线性方程转化直线性方程和多元线性回归法来分析近代物理实验中塞曼效应分裂干涉圆环多处选点测量的处理过程。     

表面粗糙度测量的磁光位相调制和锁相干涉

提出了一种表面粗糙度测量的新方法，该方法采用了微分偏振干涉的原理，利用由法拉第磁光调制器所组成的调制系统对偏振干涉光路的位相进行调制，利用锁相干涉原理对位相进行探测，该方法可实现无参考面快速非接触测量，在普通实验条件下，也可保持良好的稳定恶性循环 ，实验装置即可给出表面的轮廓又可给出其它统计数据，其横向分辨率为１．２μｍ纵向为２ｎｍ。