CCD辅助测量凸透镜焦距的一种新方法

本文针对凸透镜主点及物像平面难以精确定位的问题,提出了一种以理想光学系统的物像关系为理论基础,基于高斯公式,用CCD摄像机辅助的精确测量凸透镜焦距新方法,这种方法也可以在焦距未知的情况下,求共轭距。     

光学焦距测量误差分布的实验研究

为解决光学检测中的误差分布问题 ,提出了用实验方法验证其分布 ,而不是简单地依据经验估计其分布为均匀分布、三角分布或正态分布。通过人眼目视测量与CCD光电测试 ,分析比较大量的采样数据 ,通常人为操作因素及仪器机械精度是目视光学检测中的一个主要误差源 ,进而得到目视测焦距的误差分布 ,并进行拟合性检验     

用于DVD光学头的刻环型双焦点物镜的设计

首先介绍了DVD读出系统对像差的要求 ,然后针对DVD光学头兼容CD盘片的要求介绍了刻环型双焦点物镜的基本结构和工作原理。详细介绍了适当的球面近轴参数的选取 ,包括使制造偏心灵敏度最小的物镜中心厚度的选取 ,物镜所需校正的像差种类以及如何选择优化变量等内容。最后给出了利用计算机设计的双焦点非球面物镜的设计结果 ,并讨论了刻环宽度选取的方法     

Impact of wavelength and spot size on laser depth of focus: Considerations for mass spectrometry imaging of non-flat samples

Biospecimens with nearly flat surfaces on a flat stage are typically required for laser-based mass spectrometry imaging (MSI) techniques. However, sampling stages are rarely perfectly level, and accounting for this and the need to accommodate non-flat samples requires a deeper understanding of the laser beam depth of focus. In ablation-based MSI methods, a laser is focused on top of the sample surface, ensuring that the sample is at the focal point or remains within depth of focus. In general, the depth of focus of a given laser is related to the beam quality (M²) and the wavelength (λ). However, because laser is applied on a biological sample, other variables can also impact the depth of focus, which could affect the robustness of the MSI techniques for diverse sample types. When the height of a sample ranges outside of the depth of focus, ablated area and the corresponding ion abundances may vary as well, increasing the variability of results. In this tutorial, we examine the parameters and equations that describe the depth of focus of a Gaussian laser beam. Additionally, we describe several approaches that account for surface roughness exceeding the depth of focus of the laser.     

反射式飞行时间质谱仪结合纳升电喷雾电离源研究金属簇合物

An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-of-flight mass spectrometer. Taking advantage of the nano-electrospray ionization source, polyvalent ions are usually produced in the “ionization” process and the obtained mass resolution of the equipment is over 8000. The molecular ion peaks of metal cluster compounds [Au₂₀(PPhpy₂)₁₀Cl₂](SbF₆)₄, where PPhpy₂=bis(2-pyridyl)phenylphosphine, and [Au₆Ag₂(C)L₆](BF₄)₄, where L=2-(diphenylphosphino)-5-methylpyridine, are distinguished in the respective mass spectrum, accompanied by some fragment ion peaks. In addition, the mass-to-charge ratios of the parent ions are determi-nated. Preliminary results suggest that the device is a powerful tool for the study of metal cluster compounds. It turns out that the information obtained by the instrumentation serves as an essential supplement to single crystal X-ray diffraction for structure characterization of metal cluster compounds.     

抛物线的一些性质

近年,在研究射影几何在二次曲线上的运用中,发现有些平面几何问题用射影几何研究更自然、条理更清楚,而用平面几何方法处理则有难度.将二次曲线中的抛物线放在拓广平面上,借助射影几何中的Pascal定理、Steiner定理,给出了抛物线一些有趣的性质.     

Synthesis of TiN/a-Si3N4 thin film by using a Mather type dense plasma focus system

A 2.3 kJ Mather type pulsed plasma focus device was used for the synthesis of a TiN/a-Si3N4 thin film at room temperature. The film was characterized using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), and atomic force microscopy (AFM). The XRD pattern confirms the growth of polycrystalline TiN thin film. The XPS results indicate that the synthesized film is non-stoichiometric and contains titanium nitride, silicon nitride, and a phase of silicon oxy-nitride. The SEM and AFM results reveal that the surface of the synthesized film is quite smooth with 0.59 nm roughness (root-mean-square).     

The effect of TiN nanoparticles deposition with different number of shots on SS316L by plasma focus device

In this paper, we present the result of TiN nanocrystalline deposition on SS316L, using a 4 kJ plasma focus (PF) device for 10, 20, and 30 focus shots. The effect of different number of focus shots on micro-structural changes of thin film is characterized by field emission scanning electron microscope. Existence of grains in different size confirms the formation of TiN nanocrystals on the surface of SS316L substrate. X-ray diffraction (XRD) reveals the formation of a nanocrystalline titanium nitride coating on the surface of SS316L samples. The crystalline size of TiN obtained from XRD data is strongly dependent on the number of focus shots. Thickness of the elements found on the surface of the treated sample that obtain by Rutherford backscattering spectroscopy (RBS) analysis is in the range of 150×10¹⁵?200×10¹⁵ atoms/cm². All the existence elements in the coated samples are identified by Particle Induced X-ray Emission (PIXE) spectra. Investigation on the corrosion resistance of TiN coatings was performed using an electrochemical potentiodynamic polarization. Our results suggest that TiN nanocrystalline implantation with proper ion fluences using PF can significantly improve the corrosion resistance of SS316L.     

Radiolysis of ferrous ammonium sulphate in alkali nitrate and alkali halide matrices

Radiolysis of ferrous ammonium sulphate (FAS) dispersed in (a) alkali nitrates [KNO₃, NaNO₃, Ba(NO₃)₂, CO(NH₃)₆(NO₃)₃] (b) alkali halides [KCl, KBr] and (c) binary mixtures of above [KNO₃ + KCl, Ba(NO³)₂ + BaCl₂) has been extensively investigated. FAS becomes oxidized and Fe³⁺ formation seems to depend upon the nitrate concentration and gamma dose but is independent of halide concentration. Mossbauer studies confirm these findings and it appears that basic ferric sulphate may be formed during the oxidation process.     

准随机点阵二值化Gabor波带片聚焦特性的数值计算

 Fresnel波带片有多个焦点,作为单色器波长选择元件使用时会受到高级衍射的影响。而Gabor波带片只有一个焦点,有更好的聚焦特性,但制作难度较大,准随机点阵二值化Gabor波带片概念的提出则解决了这个问题。介绍了准随机点阵二值化Gabor波带片的设计,并利用优化的程序分别对Fresnel波带片和准随机点阵二值化Gabor波带片的聚焦特性进行了模拟计算,通过对计算结果进行分析比较,发现准随机点阵二值化Gabor波带片具有抑制高阶衍射的特性。