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21.
B‐doped Si multiple delta‐layers (MDL) were developed as certified reference materials (CRM) for secondary ion mass spectrometry (SIMS) depth profiling analysis. Two CRMs with different delta‐layer spacing were grown by ion beam sputter deposition (IBSD). The nominal spacing of the MDL for shallow junction analysis is 10 nm and that for high energy SIMS is 50 nm. The total thickness of the film was certified by high resolution transmission electron microscopy (HR‐TEM). The B‐doped Si MDLs can be used to evaluate SIMS depth resolution and to calibrate the depth scale. A consistency check of the calibration of stylus profilometers for measurement of sputter depth is another possible application. The crater depths measured by a stylus profilometer showed a good linear relationship with the thickness measured from SIMS profiling using the calibrated film thickness for depth scale calibration. The sputtering rate of the amorphous Si thin film grown by sputter deposition was found to be the same as that of the crystalline Si substrate, which means that the sputtering rate measured with these CRMs can be applied to a real analysis of crystalline Si. Copyright © 2005 John Wiley & Sons, Ltd.  相似文献   
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This paper mainly studies the problem of designing a hybrid state feedback D-admissible controller for a class of linear and nonlinear singular systems. Based on the relationship between singular discrete systems and singular delta operator systems, several necessary and sufficient conditions for a linear singular delta operator system to be D-admissible (i.e. regular, causal and all finite poles lie in a prescribed circular region) with different representations are derived. Then, the existence conditions and explicit expressions of a desirable D-admissible controller are given by means of matrix inequalities and strict linear matrix inequalities, respectively. We further extend the obtained results to singular delta operator systems with Lipschitz nonlinear perturbations, and the design methods of hybrid controller are presented for the nonlinear case as well. Finally, numerical examples as well as simulations are provided to illustrate the effectiveness of the theoretical outcomes obtained in the paper.  相似文献   
24.
We study the deconvolution of the secondary ion mass spectrometry (SIMS) depth profiles of silicon and gallium arsenide structures with doped thin layers. Special attention is paid to allowance for the instrumental shift of experimental SIMS depth profiles. This effect is taken into account by using Hofmann's mixing‐roughness‐information depth model to determine the depth resolution function. The ill‐posed inverse problem is solved in the Fourier space using the Tikhonov regularization method. The proposed deconvolution algorithm has been tested on various simulated and real structures. It is shown that the algorithm can improve the SIMS depth profiling relevancy and depth resolution. The implemented shift allowance method avoids significant systematic errors of determination of the near‐surface delta‐doped layer position. Copyright © 2013 John Wiley & Sons, Ltd.  相似文献   
25.
李学民  贾光群  曹彦忠  张进杰  王蕾  孙会媛 《色谱》2013,31(12):1201-1205
采用液相色谱-同位素比质谱(LC-IRMS)技术建立了同时测定葡萄酒中甘油和乙醇δ13C值的分析方法。优化了葡萄酒中影响甘油和乙醇色谱分离的条件。方法的精密度和准确度分别为0.15‰~0.26‰和0.11‰~0.28‰。对40个葡萄酒样品进行了测定,甘油和乙醇的δ13 C值分别为-26.87‰~-32.96‰、-24.06‰~-28.29‰,两者具有较强的相关性(R=0.82)。该方法不需要复杂的样品预处理,在相同条件下同时测定甘油和乙醇的δ13C值,较传统方法简单、快速。  相似文献   
26.
In this article, we are concerned with the interactions of delta shock waves with contact discontinuities for the relativistic Euler equations for Chaplygin gas by using split delta functions method. The solutions are obtained constructively and globally when the initial data consists of three piecewise constant states. The global structure and large time‐asymptotic behaviors of the solutions are analyzed case by case. During the process of the interaction, the strengths of delta shock waves are computed completely. Moreover, it can be found that the Riemann solutions are stable for such small perturbations with special initial data by letting perturbed parameter ε tends to zero. Copyright © 2014 John Wiley & Sons, Ltd.  相似文献   
27.
We report on building a novel chemical vapor deposition (CVD) reactor for diamond delta‐doping. The main features of our reactor are: a) the use of rapid gas switching system, (b) the reactor design providing the laminar gas flow. These features provide the creation of ultra‐sharp interfaces between doped and undoped material and minimize the prolonged ”tails” formation in the doping profile. It is proved by optical emission spectroscopy that gas switching time is not more than 10 seconds. Using the novel reactor we have grown the nanometer‐thin layers of boron doped diamond. The FWHM of boron concentration profile is about 2 nm which is proved by SIMS. It is shown that the both single delta‐layer and multiple delta‐layers could be grown using the novel CVD reactor. In principle, the reactor could be used for diamond delta doping with other dopants, like nitrogen, phosphorus etc. (© 2016 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)  相似文献   
28.
A real valued function defined on a real interval is called -convex if it satisfies


The main results of the paper offer various characterizations for -convexity. One of the main results states that is -convex for some positive and if and only if can be decomposed into the sum of a convex function, a function with bounded supremum norm, and a function with bounded Lipschitz-modulus. In the special case , the results reduce to that of Hyers, Ulam, and Green obtained in 1952 concerning the so-called -convexity.

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29.
A 'chaos expansion' of the intersection local time functional of two independent Brownian motions in R d is given. The expansion is in terms of normal products of white noise (corresponding to multiple Wiener integrals). As a consequence of the local structure of the normal products, the kernel functions in the expansion are explicitly given and exhibit clearly the dimension dependent singularities of the local time functional. Their L p -properties are discussed. An important tool for deriving the chaos expansion is a computation of the 'S-transform' of the corresponding regularized intersection local times and a control about their singular limit.  相似文献   
30.
In the paper we consider a random linear model for observations provided by spatially located sensors measuring signals coming from one source. For this model a set of sufficient and complete statistics are found, and it is shown that the maximum likelihood estimators of unknown parameters (characteristics of the source) are functions of those statistics. The problem of nonnegative estimators of variance components of the model is shortly discussed. Comparisons of the mean squared errors of several estimators are given. Numerical example concerning hunting for defects in solar cells is considered in details.  相似文献   
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