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71.
本底会对光谱分析结果产生很大的干扰作用,为获取特征峰的有效信息,必须首先去除本底。该文提出了一种基于小波变换的本底扣除算法,通过对光谱及后续光谱迭代进行小波变换,利用逼近系数估计本底,直到本底收敛。提出了判断多次估计的本底最大误差是否足够小的收敛准则。利用该算法去除本底后,即可进行特征峰信息的提取。分别利用仿真光谱和实验能量色散X射线荧光光谱对算法进行了验证,并与传统小波变换和多项式拟合法进行了对比。结果表明,该算法能够更准确扣除光谱本底,对其他光谱的本底扣除也具有借鉴意义。 相似文献
72.
系统研究了各种多元分辨校正模型、方法及其应用,以模拟体系、病态体系有态体系为对象,考察了它们的多元校正能力与多元分辨效果,给我机多组份分析态体系实例。 相似文献
73.
74.
Y. Ladino-Ospina L. Giraldo-Gutierréz J. C. Moreno-Piraján 《Journal of Thermal Analysis and Calorimetry》2005,81(2):435-440
Summary This work shows the result of the study of the Pb(II) and Cr(VI) ions adsorption by means of a Calvet type calorimeter of heat conduction that can operate at 150şC. The calorimeter was electrically calibrated to establish its sensitivity and reproducibility, obtaining K=12.95±0.05 W V-1 and chemically it was examined with tris-(hydroxymethyl)-aminomethane (THAM)-HCl system, obtaining ΔH= -30.91±0.03 kJ mol-1. The activated carbon sample obtained from coffee husk and the calorimetric results obtained were related to other techniques used to perform this type of studies. 相似文献
75.
A. Gustavo González M. Ángeles Herrador Agustín G. Asuero 《Accreditation and quality assurance》2005,10(7):386-391
The uncertainty evaluation of mass measurements when using “in-house” calibrated analytical balances is revisited according
to the Guide to the expression of Uncertainty Measurement (GUM). The calibration of analytical balances is discussed according
to the guidelines of several bodies such as ASTM, UKAS and DKD/PTB. The remainder components of uncertainty can be estimated
from the balance data sheet specifications. 相似文献
76.
凝胶渗透色谱法测定聚丙烯腈共聚物分子量中宽分布校正法的应用 总被引:4,自引:0,他引:4
应用宽分布校正法对凝胶渗透色谱(GPC)进行了校正,将校正曲线用于聚丙烯腈(PAN)共聚物分子量的计算。对扣除色谱峰扩展效应前后的测试结果与乌氏粘度法测得的数据进行比较。结果表明,应用宽分布校正法时,必须扣除色谱峰扩展效应,才能得到较为准确的测试结果。 相似文献
77.
用重复卷积法求解物理宽化函数吴万国,林嘉 (福州大学中心实验室,福州350002)(中国(福建)对外贸易中心集团,福州350001)关键词X射线衍射,晶粒度,晶格畸变,重复卷积粉末试样的X射线衍射谱线一般具有一定的宽度,引起话线宽化的主要原因有仪器致... 相似文献
78.
Interference-free determination of Sudan dyes in chilli foods using second-order calibration algorithms coupled with HPLC-DAD 总被引:1,自引:0,他引:1
This paper presents a new method for the determination of Sudan dyes contained in hot chilli samples. The method employs second-order calibration algorithms to handle the recorded data. The second-order calibration algorithms are based on the popular parallel factor analysis (PARAFAC), alternating trilinear decomposition (ATLD) and self-weighted alternating trilinear decomposition (SWATLD), respectively. These chemometric methodologies have the second-order advantage, which is the ability to get accurate concentration estimates of interested analytes even in the presence of uncalibrated interfering components. The results on a set of spiked chilli test shows that low contents of Sudan I and Sudan II in complex chilli mixtures can be accurately determined using the new method. The sample preparation was based on solvent extraction, and internal standard was not required. Quantification was carried out with simple mobile phase. 相似文献
79.
V. A. Drebushchak 《Journal of Thermal Analysis and Calorimetry》2005,79(1):213-218
One-point (Mettler) and many-point (Netzsch) heat flow calibration of a DSC is discussed. It is shown that the two types of calibration are the alternative extremes between quick but rough procedure and time-consuming but accurate one. One-point calibration compares a typical function k(T) at the melting point of indium with the measured value for particular DSC and multiplies k(T) by a scaling factor. Many-point calibration is based on general mathematical procedure, namely fitting a set of experimental values of sensitivity to a polynomial. The polynomial coefficients are evaluated by the method of least squares. Based on the relationship between the sensitivity of a thermocouple and calibration coefficient of a DSC sensor made from it, two-point heat flow calibration is suggested. This is an optimal calibration procedure, for the relationship contains only two unknown coefficients. An example of how to perform the two-point calibration with Netzsch-Proteus Software is described in the Appendix. 相似文献
80.
《Surface and interface analysis : SIA》2005,37(10):802-808
B‐doped Si multiple delta‐layers (MDL) were developed as certified reference materials (CRM) for secondary ion mass spectrometry (SIMS) depth profiling analysis. Two CRMs with different delta‐layer spacing were grown by ion beam sputter deposition (IBSD). The nominal spacing of the MDL for shallow junction analysis is 10 nm and that for high energy SIMS is 50 nm. The total thickness of the film was certified by high resolution transmission electron microscopy (HR‐TEM). The B‐doped Si MDLs can be used to evaluate SIMS depth resolution and to calibrate the depth scale. A consistency check of the calibration of stylus profilometers for measurement of sputter depth is another possible application. The crater depths measured by a stylus profilometer showed a good linear relationship with the thickness measured from SIMS profiling using the calibrated film thickness for depth scale calibration. The sputtering rate of the amorphous Si thin film grown by sputter deposition was found to be the same as that of the crystalline Si substrate, which means that the sputtering rate measured with these CRMs can be applied to a real analysis of crystalline Si. Copyright © 2005 John Wiley & Sons, Ltd. 相似文献