Accelerated glycosylation under frozen conditions

O-Glycosylations using thiomethyl glycosides as donors were compared under both frozen and unfrozen conditions. In the presence of MeOTf as a promoter, enormous rate acceleration was observed when the glycosylation was conducted in p-xylene below its freezing point.     

将SVRT模型应用到单原子多原子反应F+CH2D2→CH2D/CHD2+DF/HF中

由于含时波包方法具有经典的直观又不乏量子力学的准确 ,选择含时波包方法来处理F +CH2 D2 →CH2 D/CHD2 +DF/HF反应 .把半刚性振转子 (SVRT)模型应用到该反应体系中 ,研究了两个通道中该反应从基态反应物开始在修正过的J1(MJ1)势能面上计算出来了反应几率、积分截面、速率常数 .反应几率随能量变化的图的数值结果给出了振荡结构 ,这些振荡结构是可以和动力学振荡联系起来的 .而这些振荡结构在积分截面随着能量变化的图中就被反应几率求和后的平均结果所掩盖了 .速率常数和实验结果的比较也得到了较好的结果 .     

Au等离子体M带5f-3d跃迁的电子离子碰撞激发速率系数

电子离子碰撞激发速率系数在超组态碰撞辐射模型中真实模拟非局域热动力学平衡Au激光等离子体M带谱 5f 3d跃迁中各种复杂电荷态离子的电离态特性 (譬如离子的平均电离度 ,相对丰度和能级布居数 )是必不可少的。基于准相对论多组态Hartree Fock方法和扭曲波玻恩交换近似 ,采用自编的扭曲波程序ACDW (9)和Fit(9) ,从头计算了Au等离子体M带 5f 3d电子离子碰撞激发速率系数。结果表明 :在“神光II”实验装置诊断的电子温度约 2keV ,电子密度约 6× 10 2 1cm-3 范围内 ,这些电子离子碰撞激发参数有利于采用超组态碰撞辐射模型模拟Au的激光等离子体M带 5f～ 3d细致谱的平均电离度和电荷态分布。     

高速电视摄象系统的象质评价和动态计测精度

本文对高速摄象系统(包括电视摄象系统和光机式摄象系统)的象质评价方法予以讨论,并用实验方法对目前广泛使用的Kodak SP-2000、NAC HSV-200等高速电视摄象系统及我们自己开发的一维扫描电视摄象系统的象质,在新的定义下给出了评价,对它们的动态精度作了对比性测试,同时和光机式高速摄象系统作了比较。     

BNL/AGS10.7A GeV金核诱发作用中核碎裂与粒子产生

研究了在美国BNL/AGS上能量10.7AGeV的¹⁹⁷Au离子诱发核作用,报告了EMU–01国际合作实验关于射弹核碎裂和产生粒子密度等最新实验结果.     

A New Flow Instrument for Conductance Measurements at Elevated Temperatures and Pressures: Measurements on NaCl(aq) to 458 K and 1.4 MPa

A new flow electrical conductance instrument was constructed and tested on dilute NaCl solutions up to 458 K, and on more concentrated solutions (maximum 0.436 mol⋅kg⁻¹) at 373 K. The results of the new instrument agreed with those of previous authors within the estimated experimental errors. The model of Bernard et al. (J. Phys. Chem. 96, 3833–3840 (1992), MSA) was found to represent the high-temperature results without introducing an ion-pairing equilibrium constant. The Fuoss–Hsia conductance equation as given by Fernandez-Prini was found to represent the dilute concentrations with Λ° (NaCl) as the only adjustable parameter. It was found that Λ° (NaCl) could be expressed as a function of solvent viscosity and density by using three parameters found by regression of literature results between 278.15 and 523 K. This equation along with the FHFP theory permits the equivalent conductivity of dilute sodium chloride solutions to be calculated within the accuracy of the existing experimental measurements.     

高密度氩气的原子间相互作用与状态方程

本文从高密度气体的原子间相互作用出发进行思考,在修改范德瓦耳方程的基础上,提出了一种新的适用于高密度气体的状态方程,并用以对氩气临界区的等温压缩线进行计算,结果与实验值很符合.     

STS investigations of temperature dependence of Au(1 1 1) surface state energy position

High temperature scanning tunneling spectroscopy (HT-STS) was used to investigate the electronic structure of Au(1 1 1) at different temperatures in the energy range 0-1 eV below the Fermi level. We concentrated on the influence of temperature on the Shockley surface state (SS) appearing on noble metals surface due to a surface projected bulk bang gap in [1 1 1] direction. The influence of temperature on the projected band gap edge (BE) was also investigated. The experiment was carried out in the temperature range 294-580 K. As the result of the experiment a delicate shift of the SS and the BE in direction of the Fermi level was reported.     

CH3S CH2SH异化反应的理论研究

利用密度泛函理论(DFT)和从头算(ab initio)研究了CH3S←→CH2SH互异化的反应机理．采用HF、B3LYP、MP2理论水平和中等基组6-31(d)，计算了CH3S、CH2SH及其过渡态的结构参数、谐振频率、零点能(ZPF)、总能量和相对能量，并利用B3LYP／6-31(d)的方法计算了反应的内禀反应坐标(IRC)，给出了分子构型和自旋污染沿反应坐标的变化曲线，以及最小能量曲线(MEP)、绝热能量曲线．此外，利用传统过渡态理论(CTST)研究了该互异化反应的速率常数和平衡常数在200～1000K的变化．     

On the growth strain origin and stress evolution prediction during oxidation of metals

High temperature oxidation of metals leads to residual stresses in the metal and in the oxide. In this work, we try to predict the evolution of the residual stresses in the growing oxides layers, during isothermal oxidation. The origin of these stresses is based on the microstructural model of Clarke, however, another justification is proposed, assuming a proportional dependence of the growth strain with the oxide layer thickness. Using the mechanics of thin layers, as well as the analysis proposed to describe the growth strain, a system of equations are deduced that predict the stresses evolution with oxidation time. Numerical analysis is performed, leading to a set of theoretical curves.