Derivatization for electrospray ionization-mass spectrometry. 4. Alkenes and alkynes

A survey of derivatization strategies and prospective derivatization reactions for conversion of simple alkenes and alkynes to 'electrospray-active' species is presented. General synthetic strategies are discussed and illustrative examples of prospective derivatives prepared from model compounds are presented along with their electrospray ionization (ES) mass spectra. The identified derivatives of these neutral, nonpolar analytes are either ionic or are ionizable in solution through Bronsted acid/base chemistry, by Lewis acid/base chemistry, or by chemical or electrochemical electron-transfer chemistry. Once ionized, the derivatives are expected to be amenable to detection by electrospray ionization-mass spectrometry. Derivatives are identified for positive and negative ion analysis of both alkenes and alkynes. Copyright 2000 John Wiley & Sons, Ltd.     

Comparison of simulated X-ray conversion efficiency of laser produced iron plasma with experimental results

X-ray resonance lines between 11 Å and 17 Å emitted from iron plasmas created by a modest KrF laser have been simulated by modifying the atomic and hydrodynamic code EHYBRID. Free–free and free–bound emission from the Si-, Al-, Mg-, Na-, Ne- and F-like ions is calculated in the simulation. In the original experiments, a KrF laser (249 nm wavelength) with focused irradiances between 1×10¹² W/cm² and 1×10¹⁵ W/cm² was focused on iron targets. The laser pulse duration was varied between 10 ps and 20 ns. We have calculated X-ray conversion efficiencies to be, for example, 0.5% over 2 sr for 2×10¹³ W/cm² and 20 ns pulse duration, in good agreement with experimental measurements. The simulation of X-ray emission is also presented for an experiment where a train of eight 7 ps KrF laser pulses is incident onto an iron target. PACS 52.50.Jm; 52.38.Ph; 52.65.Kj; 52.30.Ex; 32.30.Rj     

Maximum material thickness for extreme ultra-violet and X-ray backlighter probing of dense plasma

Extreme ultra-violet (EUV) lasers, X-ray lasers and other backlighter sources can be used to probe high-energy density materials if their brightness can overcome self-emission from the material. We investigate the maximum plasma thickness of aluminum, silicon and iron that can be probed with EUV or X-ray photons of energy 89–1243 eV before self-emission from the plasma overwhelms the backlighter output. For a uniform plasma, backlighter transmission decreases exponentially with increasing thickness of the material following Beer's law at a rate dependent on the plasma opacity. We evaluate the plasma opacity with the Los Alamos TOPS opacity data. The self-emission is assumed to be either that of a black body to arise from a plasma in LTE or to only consist of free–free and free–bound emission. It is shown that at higher plasma temperature (?40 eV), EUV radiation (e.g. photon energy=89 eV) can probe a greater thickness of plasma than X-ray radiation (e.g. photon energy=1243 eV).