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171.
Pivnenko N. S. Vashchenko V. V. Kutulya L. A. Doroshenko A. O. Chepeleva L. V. 《Russian Chemical Bulletin》2001,50(9):1596-1604
The 1Í NMR method in combination with molecular simulation was used to study conformations of Z- and E-isomers of (1R,4R)-cis-2-(4-methoxyphenyl)benzylidene-p-menthan-3-one. In solutions the Z-isomer, unlike the conformationally uniform Å-isomer, is an equilibrium mixture of chair conformers with the substantial predomination of one form with the axially oriented methyl and equatorial isopropyl groups (75—78%). The enone group is more nonplanar in the Z-isomer than in the Å-isomer. For the isopropyl fragment, the equiprobable existence of trans- and two gauche-rotamers for the Z-isomer and a substantial predomination of gauche-forms in the case of the E-isomer were established. 相似文献
172.
V. A. Balkanov I. A. Belolaptikov L. B. Bezrukov N. M. Budnev A. G. Chensky I. A. Danilchenko Zh. -A. M. Dzhilkibaev G. V. Domogatsky A. A. Doroshenko S. V. Fialkovsky 《Physics of Atomic Nuclei》2000,63(6):951-961
We review the present status of the Lake Baikal neutrino experiment and present selected physics results obtained during the
consecutive stages of the stepwise upgrade of the detector: from NT-36 to NT-96. The results cover atmospheric muons, neutrino
events, neutrinos of very high energy, searches for neutrino events from WIMP annihilation, searches for magnetic monopoles,
and environmental studies. We also describe an air Cherenkov array developed for studying the angular resolution of NT-200.
From Yadernaya Fizika, Vol. 63, No. 6, 2000, pp. 1027–1036.
Original English Text Copyright ? 2000 by Balkanov, Belolaptikov, Bezrukov, Budnev, Chensky, Danilchenko, Dzhilkibaev, Domogatsky,
Doroshenko, Fialkovsky, Gaponenko, Garus, Gress, Kiss, Klimov, Klimushin, Koshechkin, Kuznetzov, Kulepov, Kuzmichev, Lovzov,
Laudenskaite, Lubsandorzhiev, Milenin, Mirgazov, Moseiko, Netikov, Osipova, Panfilov, Parfenov, Pavlov, Pliskovsky, Pokhil,
Popova, Rozanov, Sokalski, Spiering, Streicher, Tarashansky, Toht, Thon, Vasiliev, Wischnewski, Yashin.
This article was submitted by the authors in English. 相似文献
173.
Vladimir M. Doroshenko Robert J. Cotter 《Journal of the American Society for Mass Spectrometry》1997,8(11):1141-1146
The higher order fields present in the quadrupole ion trap may have beneficial effects such as increases in mass resolution in the mass-selective instability or resonance ejection modes of operation, but may also result in losses of ions due to nonlinear resonances. In this work, the reduction in ion intensities observed in the mass spectra of polyethylene glycol (PEG 1000) has been utilized to monitor the ion losses resulting from these higher order fields during the rf voltage scans in both the forward and reverse directions. Extensive ion losses were observed in reverse rf voltage scans at q z=0.64 (a z=0), which corresponds to octopole resonance at β z=1/2. The losses depended upon rf voltage scan rate and ion mass being greater for lower scan rates and lower masses. For ions of m/z 877, losses of up to 60% of the stored ions were observed at low scan rates (<1×104 Da/s), but were minimal at higher scan rates. Thus, it is possible to avoid such losses during reverse scans by scanning the region q z=0.64 at rates in excess of 4×104 Da/s. In forward rf voltage scans, ion storage was considerably more reliable, with significant losses observed only at very high scan rates near the region q z=0.78 (hexapole resonance at β z=2/3). 相似文献
174.
O. S. Bezkrovnyi N. V. Babayevskaya P. V. Mateychenko O. M. Vovk A. G. Doroshenko D. S. Sofronov 《Crystal Research and Technology》2014,49(2-3):85-91
(Lu1–xEux)2O3 smooth, crack‐free, transparent films were prepared by the Pechini sol–gel method and a spin‐coating technique. Thermogravimetric analysis, differential thermal analysis and FITR spectroscopy were used to study the chemical processes during annealing of the films. Film structure, morphology and optical properties were investigated. X‐ray diffraction (XRD) analysis reveals the cubic phase of (Lu1–xEux)2O3 films annealed in the 600–1000 °C temperature range. Smooth and crack‐free films with thicknesses of 250–1000 nm were obtained in the 600–800 °C temperature range. The thickness upper limit (1000 nm) of morphological stability of films (Lu1–xEux)2O3 on sapphire substrates has been studied. 相似文献