Boundary voltage perturbations caused by small conductivity inhomogeneities nearly touching the boundary

We establish an asymptotic expansion of the steady-state voltage potentials in the presence of a diametrically small conductivity inhomogeneity that is nearly touching the boundary. Our asymptotic formula extends those already derived for a small inhomogeneity far away from the boundary and is expected to lead to very effective algorithms, aimed at determining location and certain properties of the shape of a small inhomogeneity that is nearly touching the boundary based on boundary measurements. Viability of the asymptotic formula is documented by numerical examples.     

ACFA and measurability

We show that definable sets of finite S₁-rank in algebraically closed fields with an automorphism can be measured.     

Photoinduced Luminescence Blinking and Bleaching in Individual Single‐Walled Carbon Nanotubes

The temporal evolution of photoluminescence in individual single‐walled carbon nanotubes (SWNT) under strong laser irradiation is studied and pronounced blinking and bleaching is observed, caused by photoinduced oxidation that subsequently quenches mobile excitons. The nanotubes are isolated with sodium cholate and spun onto either a glass or mica surface. Their bleaching behavior is investigated for variable laser intensities in air and argon atmosphere. The decay rate for luminescence bleaching generally increases with higher laser intensity, however saturating on mica substrates, which is attributed to limited availability of oxygen in the vicinity of the nanotubes. Step‐like events in the luminescence time traces corresponding to single oxidation events are analyzed regarding relative step height and suggest an exciton diffusion range of about 105 nm.     

X‐ray photoelectron spectroscopic chemical state quantification of mixed nickel metal,oxide and hydroxide systems

Quantitative chemical state X‐ray photoelectron spectroscopic analysis of mixed nickel metal, oxide, hydroxide and oxyhydroxide systems is challenging due to the complexity of the Ni 2p peak shapes resulting from multiplet splitting, shake‐up and plasmon loss structures. Quantification of mixed nickel chemical states and the qualitative determination of low concentrations of Ni(III) species are demonstrated via an approach based on standard spectra from quality reference samples (Ni, NiO, Ni(OH)₂, NiOOH), subtraction of these spectra, and data analysis that integrates information from the Ni 2p spectrum and the O 1s spectra. Quantification of a commercial nickel powder and a thin nickel oxide film grown at 1‐Torr O₂ and 300 °C for 20 min is demonstrated. The effect of uncertain relative sensitivity factors (e.g. Ni 2.67 ± 0.54) is discussed, as is the depth of measurement for thin film analysis based on calculated inelastic mean free paths. Copyright © 2009 John Wiley & Sons, Ltd.