Interfacial segregation in Ag-Au,Au-Pd,and Cu-Ni alloys: I. (100) surfaces

Atomistic simulations of segregation to (100) free surface in Ag–Au, Au–Pd, and Cu–Ni alloy systems have been performed for a wide range of temperatures and compositions within the solid solution region of these alloy phase diagrams. In addition to the surface segregation profiles, surface free energies, enthalpies, and entropies were determined. These simulations were performed within the framework of the free energy simulation method, in which an approximate free energy functional is minimized with respect to atomic coordinates and atomic site occupation. The effects of the relaxation with respect to either the atomic positions or the atomic concentrations are discussed. For all alloy bulk compositions (0.05 C 0.95) and temperatures (400 T(K) 1,100) examined, Ag, Au, and Cu segregates to the surface in the Ag–Au, Au–Pd, and Cu–Ni alloy systems, respectively. The present results are compared with several theories for segregation. The resultant segregation profiles in Au–Pd and Ag–Au alloys are shown to be in good agreement with an empirical segregation theory, while in Cu–Ni alloys the disagreement in Ni-rich alloys is substantial. The width of the segregation profile is limited to approximately three to four atomic planes. The surface thermodynamic properties depend sensitively on the magnitude of the surface segregation, and some of them are shown to vary linearly with the magnitude of the surface segregation.     

黑腔靶X光转换,输运的定量测量

为了测量黑腔靶X光引光效率、转换效率,我们设计了相应的分解靶(泄漏靶)实验,1989～1992年在″神光″装置上共进行了四次漏靶分解实验,利用灵敏度作了绝对标定的平响应X光二极管对漏靶注入孔、引光孔流出的X光角分布进行了测量,测出了x光角分布,得到了黑腔靶X光转换效率为50％～60％,引光效率约6％,为以后辐射驱动内爆研究的理论计算和靶的优化设计提供了重要的数据。     

Parametric normalization for full-energy peak count rates obtained at different geometries

The Effective Interaction Depth (EID) law has been systematically studied and applied to parametric normalization for peak count rates obtained at different source-detector distances (S-D). The errors caused by EID normalization are less than 4% over the full range of S-D (from to several mm) for true coincidence-free -rays. Parametric corrections for the true coincidence (summing) effect are also established, based on simplified decay schemes and P/T ratio determinations. The total response of Ge detector for single-energy -rays (T) is clearly defined with scattering contributions from surroundings included. Errors from summing effect corrections are also less than 4%. The combined EID normalization and summing effect corrections give an error no greater than 5.7% for the worst situations (several mm S-D and cascade-crossover decay scheme), acceptable for most practical K₀ NAA.