Compression curve of BaBiO3

The compression curve of BaBiO₃ was measured by X-ray diffraction method using a diamond anvil cell apparatus up to about 8 GPa. The diffraction pattern did not change in this pressure range, but the bulk modulus suddenly decreased near 4 GPa. The initial value of the bulk modulus, 157 GPa was estimated from the data up to 4 GPa.     

Gold-bead scanning near-field optical microscope with laser-force position control

We have developed a scanning near-field optical microscope with an optically trapped metallic particle that has a small diameter compared to the wavelength of visible light. In this microscope we employed spot illumination to enhance the intensity of light scattered from a probe particle so we could reduce the diameter of the probe particle to 40nm. We detected slight irregularities of the surface of the cover glass near 10-nm depth. Also, we observed gold colloidal particles on the surface of the cover glass.     

Measurement Accuracy in Phase-Shifting Point Diffraction Interferometer with Two Optical Fibers

A phase-shifting point diffraction interferometer (PS/PDI) with point sources of two single mode optical fibers has been developed, which will be appropriate for the surface figure measurement of large aperture optics on a sub-nanometer scale. To reduce the measurement error factors, a fiber optic plate (FOP) is used as a projection plane for interference pattern. Errors caused by imperfection of optical alignment, such as position of point sources and tilt of FOP, are minimized by analyzing the measured phase data with an original method. Measurement accuracy in the PS/ PDI is estimated with the interference pattern produced by the two optical fiber sources. If inhomogeneity of the FOP and a systematic error of the PS/PDI are eliminated, the measurement accuracy of the present system is estimated to be less than 4nm P-V and 0.7nm rms, respectively, at a measurement wavelength of 632.8 nm.     

Effect of Ru crystal orientation on the adhesion characteristics of Cu for ultra-large scale integration interconnects

The adhesion of Cu on Ru substrates with different crystal orientations was evaluated. The crystal orientation of sputter deposited Ru could be changed from (1 0 0) to (0 0 1) by annealing at 650 °C for 20 min. The adhesion of Cu was evaluated by the degree of Cu agglomeration on Ru. Cu films on annealed Ru films with the (0 0 1) crystal orientation showed 28% lower RMS values and 50% lower Ru surface coverage than Cu as-deposited on Ru having the (1 0 0) crystal orientation after annealing at 550 °C for 30 min, which suggest that Cu wettability on the Ru(0 0 1) was better than that on the Ru(1 0 0) plane. The low lattice misfit of 4% between Cu(1 1 1) and Ru(0 0 1) may be the reason for this good adhesion property.     

Modified Vonk's Method to Determine Crystallinity and Crystal Distortion in Polymers

Using a modified method developed from Vonk's method, detailed values of crystallinity and crystal disorder were obtained by wide angle X-ray diffraction (WAXD). In Vonk's method, the crystallinity (w) is determined by extrapolation of the WAXD experimental curve back to zero scattering angle, while the distortion factor (k) is determined by the inclination of the experimental curve at zero scattering angle. In our new method, both w and k are determined at the same time by using the least squares method. In order to show the efficiency of our method, the new fitting procedure was applied to the experimental values of polyethylene and polyethylene terephthalate as measured by Vonk, and the values of w and k determined by our new method were compared with those found by Vonk's method. The new fitting method has the advantage that it uses the whole experimental curve. Moreover, our modified Vonk's method enables us to discuss crystal distortions as arising from first-kind (thermal) disorder and second-kind (paracrystalline) disorder.     

Optical characteristics of one-dimensional photonic crystals composed of high-aspect-ratio Si walls fabricated on V-grooved wafer

We demonstrate optical properties of one-dimensional photonic crystals (PC), which are fabricated using high-aspect-ratio etching on a V-grooved silicon wafer. The measured transmission spectrum has an obvious band gap; the suppression is over 30 dB. The quite small insertion loss of 1.9 dB is achieved by induced coupled plasma (ICP) cryogenic etching and direct coupling to the optical fiber aligned in the V-groove. We also successfully observed peaks originating from a localized cavity mode. Such a microcavity enables control of the light, which qualifies photonic crystal as a fundamental structure of optical functional devices. These results lead to achievement of integrated Si-based photonic circuits.     

Broad-spectrum frequency comb generation and carrier-envelope offset frequency measurement by second-harmonic generation of a mode-locked fiber laser

A frequency comb spanning more than one octave has been achieved by injecting the second-harmonic generation (780 nm) of a mode-locked fiber laser (1.56 microm) into a photonic crystal fiber. We propose and realize a novel interferometric scheme for observing the carrier-envelope offset frequency of the frequency comb. Frequency noise has been observed on the measured carrier-envelope offset frequency, which has been confirmed to be generated in the photonic crystal fiber by comparing the measured beat frequencies between cw lasers and frequency combs before and after the photonic crystal fiber. The mode-locked fiber laser is considered to be an important candidate for the light source used in realizing a compact optical frequency measurement system including applications in the telecommunication bands.