Investigation of ionic liquids under Bi‐ion and Bi‐cluster ions bombardment by ToF‐SIMS

A systematic study of five different imidazolium‐based room temperature ionic liquids, 1‐butyl‐3‐methylimidazolium acetate, 1‐butyl‐3‐methylimidazolium nitrate, 1‐butyl‐3‐methylimidazolium iodide, 1‐butyl‐3‐methylimidazolium hexafluorophosphate and 1‐butyl‐3‐methylimidazolium bis(trifluoromethylsulfonyl)imide were carried out by means of time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) in positive and negative ion mode. The compounds were measured under Bi‐ion and Bi‐cluster ions (Bi_2–7⁺, Bi_{3, 5}²⁺) bombardment, and spectral information and general rules for the fragmentation pattern are presented. Evidence for hydrogen bonding, due to high molecular secondary cluster ions, could be found. Hydrogen bonding strength could be estimated by ToF‐SIMS via correlation of the anionic yield enhancement with solvent parameters. Copyright © 2010 John Wiley & Sons, Ltd.     

Electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using mixed solvents of water/methanol and water/2‐propanol as projectile droplets

The electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) using charged electrospray water droplets realized the atomic and molecular level etching with leaving little damage on the surface. In this work, the binary mixtures of water and alcohols (methanol and 2‐propanol) were examined as the charged electrospray droplets. The increase of desorption efficiency and softer ionization are observed for rhodamine B and bradykinin with higher content of alcohols. The etching rates for SiO₂ and polystyrene 35000 were found to be more or less the same for 100% H₂O and H₂O/MeOH projectiles. However, 60 vol.% 2‐propanol gave much lower etching rates than the water/methanol system for polystyrene 35000. This indicates that there is a marked difference in the energy dissipation processes between methanol and 2‐propanol projectiles for soft‐material target. Copyright © 2014 John Wiley & Sons, Ltd.     

Accurate mass measurement by matrix‐assisted laser desorption/ionisation time‐of‐flight mass spectrometry. II. Measurement of negative radical ions using porphyrin and fullerene standard reference materials

A method for the accurate mass measurement of negative radical ions by matrix‐assisted laser desorption/ionisation time‐of‐flight mass spectrometry (MALDI‐TOFMS) is described. This is an extension to our previously described method for the accurate mass measurement of positive radical ions (Griffiths NW, Wyatt MF, Kean SD, Graham AE, Stein BK, Brenton AG. Rapid Commun. Mass Spectrom. 2010; 24: 1629). The porphyrin standard reference materials (SRMs) developed for positive mode measurements cannot be observed in negative ion mode, so fullerene and fluorinated porphyrin compounds were identified as effective SRMs. The method is of immediate practical use for the accurate mass measurement of functionalised fullerenes, for which negative ion MALDI‐TOFMS is the principal mass spectrometry characterisation technique. This was demonstrated by the accurate mass measurement of six functionalised C₆₀ compounds. Copyright © 2010 John Wiley & Sons, Ltd.     

Depth profiling of polymer samples using Ga+ and C60+ ion beams

In this contribution, we focus on the use of C₆₀⁺ ions for depth profiling of model synthetic polymers: polystyrene (PS) and poly(methylmethacrylate) (PMMA). These polymers were spin coated on silicon wafers, and the obtained samples were depth‐profiled both with Ga⁺ ions and C₆₀⁺ ions. We observed an important yield enhancement for both polymers when C₆₀⁺ ions are used. More specifically, we discuss here the decrease in damage obtained with C₆₀, which is found to be very sensitive to the nature of the polymer. During the C₆₀⁺ sputtering of the PMMA layer, after an initial decrease, a steady state is observed in the secondary ion yield of characteristic fragments. In contrast, for PS, an exponential decrease is directly observed, leading to an initial disappearance cross section close to the value observed for Ga⁺. Though there is a significant loss of characteristic PS signal when sputtering with C₆₀⁺ ions beams, there are still significant enhancements in sputter yields when employing C₆₀⁺ as compared to Ga⁺. Copyright © 2008 John Wiley & Sons, Ltd.     

Matrix-assisted laser desorption/ionization tandem reflectron time-of-flight mass spectrometry of fullerenes

Atandem reflectron time-of-flight mass spectrometer developed in our laboratory provides a unique opportunity to investigate the collision-induced dissociation of fullerene ions formed by matrix-assisted laser desorption/ionization (MALDI). Specifically, this opportunity arises from the ability to utilize high energy collisional activation (normally available only on tandem sector instruments by using continuous ionization techniques) for ions formed by pulsed laser desorption, whereas most MALDI time-of-flight instruments record product ion mass spectra of ions formed by metastable or postsource decay. In this study we investigate the products of mass-selected and collisionally activated C ₆₀ ⁺ and C ₇₀ ⁺ ions by using different target gases over a range of target gas pressures. In general, heavier target gases produce more extensive fragmentation and improve the mass resolution of lower mass ionic products because a greater portion of these ions are formed by single collisions. Additionally, the tandem time-of-flight instrument utilizes a nonlinear (curved-field) reflectron in the second mass analyzer that enables high energy collision-induced dissociation spectra to be recorded without scanning or stepping the reflectron voltage.     

Negative‐ion/positive‐ion coincidence spectroscopy as a tool to identify anionic fragments: The case of core‐excited CHF3

We have studied the dissociation of the trifluoromethane molecule, CHF₃, into negative ionic fragments at the C 1s and F 1s edges. The measurements were performed by detecting coincidences between negative and positive ions. We observed five different negative ions: F^?, H^?, C^?, CF^?, and F₂^?. Their production was confirmed by the analysis of triple coincidence events (negative‐ion/positive‐ion/positive‐ion or NIPIPI coincidences) that were recorded with cleaner signals than those of the negative‐ion/positive‐ion coincidences. The intensities of the most intense NIPIPI coincidence channels were recorded as a function of photon energy across the C 1s and F 1s excitations and ionization thresholds. We also observed dissociation channels involving the formation of one negative ion and three positive ions. Our results demonstrate that negative‐ion/positive‐ion coincidence spectroscopy is a very sensitive method to observe anions, which at inner‐shell edges are up to three orders of magnitude less probable dissociation products than cations.     

Repair of defects created by Ar+ sputtering on graphite surface by annealing as confirmed using ToF‐SIMS and XPS

Defects were created on the surface of highly oriented pyrolytic graphite (HOPG) by sputtering with an Ar⁺ ion beam, then characterized using X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) at 500°C. In the XPS C1s spectrum of the sputtered HOPG, a sp³ carbon peak appeared at 285.3 eV, representing surface defects. In addition, 2 sets of peaks, the C_x⁻ and C_xH⁻ ion series (where x = 1, 2, 3...), were identified in the ToF‐SIMS negative ion spectrum. In the positive ion spectrum, a series of C_xH₂^+• ions indicating defects was observed. Annealing of the sputtered samples under Ar was conducted at different temperatures. The XPS and ToF‐SIMS spectra of the sputtered HOPG after 800°C annealing were observed to be similar to the spectra of the fresh HOPG. The sp³ carbon peak had disappeared from the C1s spectrum, and the normalized intensities of the C_xH⁻ and C_xH₂^+• ions had decreased. These results indicate that defects created by sputtering on the surface of HOPG can be repaired by high‐temperature annealing.     

Analysis of thin films and molecular orientation using cluster SIMS

A study of phenylalanine films of different thicknesses from submonolayer to 55 nm on Si wafers has been made using Bi_n⁺ and C₆₀⁺ cluster primary ions in static SIMS. This shows that the effect of film thickness on ion yield is very similar for all primary ions, with an enhanced molecular yield at approximately 1 monolayer attributed to substrate backscattering. The static SIMS ion yields of phenylalanine at different thicknesses are, in principle, the equivalent of a static SIMS depth profile, without the complication of ion beam damage and roughness resulting from sputtering to the relevant thickness. Analyzing thin films of phenylalanine of different thicknesses allows an interpretation of molecular bonding to, and orientation on, the silicon substrate that is confirmed by XPS. The large crater size for cluster ions has interesting effects on the secondary ion intensities of both the overlayer and the substrate for monolayer and submonolayer quantities. This study expands the capability of SIMS for identification of the chemical structure of molecules at surfaces. © Crown copyright 2010.     

ToF‐SIMS and computation analysis: Fragmentation mechanisms of polystyrene,polystyrene‐d5, and polypentafluorostyrene

We studied the time‐of‐flight secondary ion mass spectrometry fragmentation mechanisms of polystyrenes—phenyl‐fluorinated polystyrene (5FPS), phenyl‐deuterated polystyrene (5DPS), and hydrogenated polystyrene (PS). From the positive ion spectra of 5FPS, we identified some characteristic molecular ion structures with isomeric geometries such as benzylic, benzocyclobutene, benzocyclopentene, cyclopentane, and tropylium systems. These structures were evaluated by the B3LYP‐D/jun‐cc‐pVDZ computation method. The intensities of the C₇H₂F₅⁺ (m/z = 181), CyPent‐C₉H₃F₄⁺ (m/z = 187), CyPent‐C₉H₄F₅⁺ (m/z = 207), and CyPent‐C₉H₂F₅⁺ (m/z = 205) ions were enhanced by resonance stabilization. The positive fluorinated ions from 5FPS tended to rearrange and produce fewer fluorine‐containing molecular ions through the loss of F (m/z = 19), CF (m/z = 31), and CF₂ (m/z = 50) ion fragments. Consequently, the fluorine‐containing polycyclic aromatic ions had much lower intensities than their hydrocarbon counterparts. We propose the fragmentation mechanisms for the formation of C₅H₅⁺, C₆H₅⁺, and C₇H₇⁺ ion fragments, substantiated with detailed analyses of the negative ion spectra. These ions were created through elimination of a pentafluoro‐phenyl anion (C₆F₅⁻) and H⁺, followed by a 1‐electron‐transfer process and then cyclization of the newly generated polyene with carbon‐carbon bond formation. The pendant groups with elements of different electronegativities exerted strong influences on the intensities and fragmentation processes of their corresponding ions.     

Mass spectrometric investigation of polyfluorinated C60. Evidence for the existence of C60F2n (n = 0–30)

Electron-capture negative ion chemical ionization (EC-NICI) and field desorption (FD) mass spectrometric techniques were utilized to examine polyfluorinated C₆₀. Two different samples from the same preparation, one prior to sublimation and the other sublimed material, were investigated. From the raw non-sublimed product in EC-NCI six series of ions corresponding to different numbers of attached oxygen atoms were obtained, which are represented by the formula [C₆₀F_2nO_m]^?, where n ranged from 0 to 30 and m from 0 to 5. The sublimed material in EC-NICI produced the same six series of ions with up to 48 fluorine atoms attached to C₆₀. The field desorption of the same sample produced similar results, but the signal-to-noise ratios of the spectra were low. Both samples, in the two different techniques examined, yielded C₆₀F₆₀ ions with only an even number of fluorine atoms attached. The present investigation, for the first time, provides direct experimental evidence for the existence of higher fluorinated C₆₀ up to C₆₀F₆₀ and multiple oxides of polyfluoro-C₆₀ with up to five oxygen atoms attached.     

Desorption due to charge exchange in low-energy collisions of organofluorine ions at solid surfaces

Collisions of organofluorine ions at a metal surface result in efficient emission of adsorbate species as gas-phase ions. The experiments are done at 120° scattering angle in a hybrid (BQ) mass spectrometer; the primary ions, mass-selected by a magnetic sector (B), are allowed to collide with a target at a selected kinetic energy in the tens of eV range and the emitted ions are mass-analyzed using a quadrupole mass filter (Q). It is proposed that the impinging ions undergo neutralization accompanied by desorption of hydrocarbon ions and that the amount of internal energy deposited in the desorbed ions is strongly dependent on the collision energy and affects their degree of fragmentation. Competing processes include reflection and fragmentation of the colliding particle, along with such ion/adsorbate reactions as hydrogen atom abstraction by the fluorinated ion. Small even-electron ions, such as [CHF₂]⁺ and [C₂H₂F]⁺ are more effective in promoting chemical sputtering of the surface adsorbate as compared to larger ions (e.g. [C₃F₅]⁺) and odd-electron ions (e.g. [C₂F₄]⁺˙ and [C₂HF₂]⁺˙). At low energies some odd-electron fluorinated ions undergo collision without any secondary ions being emitted from the surface. In these cases the parent ions are apparently neutralized, but without sufficient energy transfer to cause hydrocarbon ion desorption. Non-fluorinated organic ions yield fragment ions and ion/surface reaction products under the condition of these experiments, but do not cause significant desorption of hydrocarbon ions.     

Laser desorption mass spectrometry of squaric acid and its salts

The laser desorption mass spectrometry of the oxocarbon squaric acid (3,4-dihydroxy-3-cyclobutene-1,2-dione) and its salts of the form A₂C₄O₄ (A = cation) is described. Both positive and negative ion spectra were obtained. The positive ion spectrum of the acid is characterized by an ion corresponding to loss of CO from [M + H]⁺. The negative ion spectrum shows an intense [M ? H]^? peak in addition to a dimer species. The alkali salt spectra contain [M + A]⁺ in the positive mode and [M ? A]^? and an intense [C₄HO₄]^? in the negative mode. The smaller alkali salts also have an [M + H]⁺ adduct ion. Unlike the alkali squarates, the ammonium salt shows ions corresponding to losses of neutrals from the molecular adduct in the positive ion spectrum and a dimer species in the negative ion spectrum. Molecular weight information was obtained in all cases. A (bis) dicyanomethylene derivative of potassium squarate was also studied. Some field desorption mass spectrometry results are presented for comparison.     

Analysis of ToF‐SIMS spectra of poly(2‐vinylpyridine) and poly(4‐vinylpyridine) with density functional theory calculations

The time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) positive and negative ion spectra of poly(2‐vinylpyridine) (P2VP) and poly(4‐vinylpyridine) (P4VP) were analyzed using density functional theory calculations. Most of the ions from these structural isomers shared the same accurate mass, but had different relative abundance. This could be attributed to the fact that from a thermodynamics perspective, the disparity in the molecular structures can affect the ion stability if we assume that they shared the same mechanistic pathway of formation with similar reaction kinetics. The molecular structures of these ions were assigned, and their stability was evaluated based on calculations using the Kohn‐Sham density functional theory with Becke's 3‐parameter Lee‐Yang‐Parr exchange‐correlation functional and a correlation‐consistent, polarized, valence, double‐zeta basis set for cations and the same basis set with a triple‐zeta for anions. The computational results agreed with the experimental observations that the nitrogen‐containing cations such as C₅H₄N⁺ (m/z = 78), C₈H₇N^+· (m/z = 117), C₈H₈N⁺ (m/z = 118), C₉H₈N⁺ (m/z = 130), C₁₃H₁₁N₂⁺ (m/z = 195), C₁₄H₁₃N₂⁺ (m/z = 209), C₁₅H₁₅N₂⁺ (m/z = 223), and C₂₁H₂₂N₃⁺ (m/z = 316) ions were more favorably formed in P2VP than in P4VP due to higher ion stability because the calculated total energies of these cations were more negative when the nitrogen was situated at the ortho position. Nevertheless, our assumption was invalid in the formation of positive ions such as C₆H₇N⁺˙ (m/z = 93) and C₈H₁₀N⁺ (m/z = 120). Their formation did not necessarily depend on the ion stability. Instead, the transition state chemistry and the matrix effect both played a role. In the negative ion spectra, we found that nitrogen‐containing anions such as C₅H₄N^? (m/z = 78), C₆H₆N^? (m/z = 92), C₇H₆N^? (m/z = 104), C₈H₆N^? (m/z = 116), C₉H₁₀N^? (m/z = 132), C₁₃H₁₁N₂^? (m/z = 195), and C₁₄H₁₃N₂^? (m/z = 209) ions were more favorably formed in P4VP, which is in line with our computational results without exception. We speculate that whether anions would form from P2VP and P4VP is more dependent on the stability of the ions.     

VAMAS interlaboratory study on organic depth profiling

We present the results of a VAMAS (Versailles project on Advanced Materials and Standards) interlaboratory study on organic depth profiling, in which twenty laboratories submitted data from a multilayer organic reference material. Individual layers were identified using a range of different sputtering species (C₆₀ⁿ⁺, Cs⁺, SF₅⁺ and Xe⁺), but in this study only the C₆₀ⁿ⁺ ions were able to provide truly ‘molecular’ depth profiles from the reference samples. The repeatability of profiles carried out on three separate days by participants was shown to be excellent, with a number of laboratories obtaining better than 5% RSD (relative standard deviation) in depth resolution and sputtering yield, and better than 10% RSD in relative secondary ion intensities. Comparability between laboratories was also good in terms of depth resolution and sputtering yield, allowing useful relationships to be found between ion energy, sputtering yield and depth resolution. The study has shown that organic depth profiling results can, with care, be compared on a day‐to‐day basis and between laboratories. The study has also validated three approaches that significantly improve the quality of organic depth profiling: sample cooling, sample rotation and grazing angles of ion incidence. © Crown copyright 2010.     

Estimation of the electron affinities of C60, corannulene,and coronene by using the kinetic method

Novel anions that contain one molecule each of C₆₀ and the polycyclic aromatic hydrocarbon coronene are generated in the gas phase by electron attachment desorption chemical ionization. Collision-induced dissociation reveals that these cluster ions are loosely bonded. Fragmentation of the mass-selected cluster anion yields, as the only products, the intact radical anions of the constituent molecules, namely, the C₆₀ radical anion and the coronene radical anion, in almost identical relative abundances. This result is interpreted as evidence that the cluster ion can be considered as the anion radical of one molecule solvated by the other molecule. The known very high electron affinity of C₆₀ (2.66 eV) and the comparable degree to which C₆₀ and the PAH compete for the electron suggests that dissociation may be controlled by the electron affinity of a portion of the C₆₀ surface, that is, in this case the kinetic method yields information on the local electron affinity of C₆₀. The electron affinity of the bowl-shaped compound corannulene is estimated for the first time to be 0.50 ± 0.10 eV by the kinetic method by using a variety of reference compounds. Unlike coronene, corannulene reacts with C _?? ⁶⁰ in the gas phase to form a covalently bonded, denydrogenated cluster ion. Support for the concept of “local” electron affinity of C₆₀ comes from a theoretical calculation on the electronic structure of C₆₀ anions, which shows evidence for localization of the charge in the C₆₀ molecule. The possibility of electron tunneling in the C₆₀-coronene system is discussed as an alternative explanation for the unusual observation of equal abundances of C₆₀ anions and coronene anions upon dissociation of the corresponding cluster ion.     

Investigation of the fragmentation and oxygen reactivity of endohedral metallofullerenes M@C60

The stability, fragmentation, and chemical reactivity of endohedral metallofullerenes M@C₆₀ (M = Ca, Sr, La, and Gd) were examined with laser desorption/ionization mass spectroscopy. A laser ablation/sublimation procedure was used to generate and purify M@C₆₀ samples, which were then characterized by both time-of-flight and Fourier transform ion cyclotron resonance mass spectrometries. Collisional dissociation of the ionized endohedral fullerenes listed above revealed multiple C₂ loss (either as sequential C₂ loss or larger C_2n eliminations) to generate similar terminal fragmentation products (i.e. MC_44,46), which might be predicted due to the similar ionic radii of the encapsulated metals. The reactivity of the endohedral compounds with oxygenated compounds was found to be dependent on the charge state of the metallofullerene. Singly charged cations of the metallofullerenes (M@C_n⁺) were completely unreactive in the gas phase with oxygenated compounds such as ethylene oxide; however, the corresponding neutral species appear to react readily with oxygenated species. This point was demonstrated in that exposure of solid phase M@C₆₀ to ambient conditions (laboratory air at room temperature) leads to the ultimate destruction of the metallofullerenes concomitant with the formation of metal oxides and carbonates.     

Are cluster ion analysis beams good choices for hydrogen depth profiling using time‐of‐flight secondary ion mass spectrometry?

For more than three decades, time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) has been used for elemental depth profiling. In recent years, cluster primary ion sources (principally, C₆₀⁺, Bi_n⁺, and Au_n⁺) have become widely available, and they can greatly enhance the signal intensity of molecular ions (10–1000 times). Understanding the performance of cluster ion analysis beams used in elemental depth profiling can greatly assist normal ToF‐SIMS users in choosing the optimal analysis beam for depth profiling work. Presently, however, the experimental data are lacking, and such choices are difficult to make. In this paper, hydrogen and deuterium depth profiling were studied using six different analysis beams—25 keV Bi⁺, Bi₃⁺, Bi₅⁺, 50 keV Bi₃²⁺, 10 keV C₆₀⁺, and 20 keV C₆₀²⁺. The effort shows that cluster primary ions do enhance H^? and D^? yields, but the enhancement is only about 1.5–4.0 times when compared to atomic Bi⁺ ions. Because the currents of atomic ion analysis beams are much stronger than the currents of cluster ion analysis beams for most commercial ToF‐SIMS instruments, the atomic ion analysis beams can provide the strongest H^? and D^? signal intensities, and may be the best choices for hydrogen and deuterium depth profiling. In addition, two representative nuclides, ³⁰Si and ¹⁸O, were also studied and yielded results similar to those of H^? and D^?. Copyright © 2011 John Wiley & Sons, Ltd.     

Features of laser desorption/ionization mass spectrometry fragmentation of vitamin B<Subscript>12</Subscript>

A comparative analysis of the laser desorption/ionization of vitamin B₁₂ by matrix-assisted laser desorption/ionization (MALDI) and desorption/ionization on porous silicon (DIOS) was carried out. The mass spectra obtained were interpreted and the pathways for ion formation and decomposition were established. The MALDI fragmentation of the positive vitamin B₁₂ ions is more extensive than the DIOS fragmentation. The most extensive fragmentation was found using the MALDI method for negative vitamin B₁₂ ions, which are lacking when using the DIOS method. __________ Translated from Teoreticheskaya i éksperimental’naya Khimiya, Vol. 43, No. 4, pp. 251–256, July–August, 2007.     

Quadrupole ion trap mass spectrometry of fullerenes

The fullerenes C₆₀ and C₇₀ can be ionized by desorption from a liquid matrix upon bombardment by Cs⁺ ions of 7 keV kinetic energy. The resulting radical cations, when activated in the ion trap by collisions with Xe target, in the presence of helium, undergo extensive dissociation by loss of multiple C₂ units. Large internal energies are deposited into these molecular ions and the dissociation efficiency is in excess of 60%.     

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) of polyisoprenes

Polyisoprenes (PIPs) with average molecular weights from 650 to 800,000 Da have been studied by time-of-flight secondary ion mass Spectrometry (TOF-SIMS) in the static mode. Polymer samples were bombarded by argon primary ions, and positive SIMS spectra were collected. Effects of branching and unsaturation in the polymer structure on ion formation were studied. The pendant methyl group showed little tendency to fracture as a cation. In the low mass region, C_nH _2n–1 ⁺ appeared to be more intense than C_nH _2n+1 ⁺ , attributed to the double bond structure of polyisoprene. Additionally, ion formation varied as a function of polymer molecular weight. Cationized intact oligomers and fragments dominate the high mass region. Oligomer distributions were used to calculate average molecular weights for polyisoprenes. A statistical chain scission mechanism was used to qualitatively explain the formation of five clusters within a unique fragmentation pattern. Detailed studies of the cluster structure pointed out that each cluster contained several species having varied degrees of unsaturation. It is believed that double bond rearrangements occur.