Temperature gradient controlled growth and optical properties of Er:BaY2F8 crystals

Single crystals of Erbium (Er) doped BaY₂F₈ have been obtained by the temperature gradient technique (TGT). No‐seed‐grown crystal of Er:BaY₂F₈, with the dimensions up to several centimeters, was obtained by self‐crystallization. The optimizations of various growth parameters were systemically investigated. The results indicated that the temperature gradient of 6‐7 K/mm and the cooling velocity less than 6 K/h were suitable for the crystal growth. The XRD data and the investigations on the growth striations by a stereo polarization microscope displayed that the [001] direction is the dominating direction for the crystal growth. The crystal grown by TGT often cracks along with the (100) plane, which is caused by the excessive decrease of the temperature during the crystal growth, for there is a rapid change in the thermal expansion curve of the BaY₂F₈ crystal in the temperature range from 800 °C to 900 °C. The spectral properties of Er:BaY₂F₈ single crystals have been studied and the effects of frequency up‐conversion of the crystals are reported. Spectral data suggest that the quality of Er:BaY₂F₈ crystal obtained by TGT method is good and the crystal has the potential application in laser devices. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

High‐temperature infrared and dielectric properties of large sapphire crystal for seeker dome application

In this paper, large‐sized (∅︁230 mm × 210 mm, 27.5 kg) sapphire was successfully grown by SAPMAC (sapphire growth technique with micro‐pulling and shoulder‐expanding at cooled center) method; and hemisphere dome (140 mm diameter, 5 mm thickness) was fabricated from as‐grown boule. Also, its high temperature infrared transmission (2∼7 µm, 20–800°C) and microwave dielectric properties (8–16.5 GHz, 30–1300°C) were investigated. The experimental results show that sapphire crystal exhibits high infrared transmittance (3 μm, 80–86%), essentially negligible dielectric loss (4.9×10^‐5–3.7×10^‐4), but fairly high dielectric constants (ε=9.4–12.5) in the temperature range of 30–1300°C. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Growth behaviour of bulk GaN single crystals grown with various flux ratios using solvent‐thermal method

Bulk GaN single crystals were grown using a solvent‐thermal method. They were grown for 200 h at 600 °C and 800 °C using 8 MPa of N₂ gas and 1–3 mm sized pyramid GaN single crystals. Pure Na, NaN₃ and Ca were used as the flux. The mole fraction of the [flux]/([flux] + [Ga]) was 0.30–0.67. The growth behavior differed according to the flux ratio. The quality of the bulk GaN single crystals was improved by increasing the flux ratio. The bulk GaN single crystals formed by spontaneous nucleation were deposited on the BN crucible wall and bottom during the first step of synthesis. The wurtzite structure of the GaN grown single crystal was confirmed by x‐ray diffration. The chemical composition was analyzed by electron probe microanalysis. The quality and optical properties of the GaN single crystal were examined by Raman spectroscopy and photoluminesence analysis. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Growth and dielectric properties of KTiOPO<Subscript>4</Subscript> and K<Subscript>1 − <Emphasis Type="Italic">x</Emphasis></Subscript>Rb<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript>TiOPO<Subscript>4</Subscript> crystals

Methods of growth of KTiOPO₄ and K_{1 ? x} Rb _x TiOPO₄ crystals of high optical quality have been optimized. The dielectric properties (permittivity and conductivity) of the crystals grown have been investigated at frequencies from 10² to 10⁶ Hz in the temperature range from 100 to 350 K, along the [001] crystallographic direction. It is established that partial substitution of K⁺ ions with Rb⁺ ions leads to a decrease in the permittivity and conductivity.     

Growth and characterization of sulphamic acid single crystals grown by Sanakaranarayanan‐Ramasamy (SR) method

By directional solidification, single crystal of Sulphamic acid (SA) was successfully grown from aqueous solution by Sankaranarayanan‐Ramasamy (SR) method. A vertically designed L‐bend was used to avoid the effect due to spurious nucleation. A vertical bottom‐seeded ampoule was used for the growth of single crystal. A seed crystal was mounted at the bottom of the ampoule. Sulphamic acid crystals of up to 40 mm in diameter and 60 mm in length have been grown with a growth up to 10 mm per day. The grown sulphamic acid single crystal was characterized using X‐ray powder diffraction analysis, Raman, FTIR, and optical transmission studies. The dielectric behaviour was measured in the frequency range of 1 kHz–10 MHz for the temperature ranges from 30 °C to 170 °C. The sulphamic acid single crystal was also grown by conventional method. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Flux growth of straw‐like rutile monocrystals

Millimetric straw‐like rutile monocrystals were grown by the flux growth technique. A suitable mixture of flux (MoO₃, V₂O₅, Li₂CO₃) and amorphous TiO₂ gel was slowly cooled down to 750°C from 1250°C or 1350°C. The best yields of straw‐like rutile were obtained with a nutrient/flux ratio and a cooling rate in the range 0.015‐0.006 and 1.8‐1.9 K h^‐1, respectively. The hollowed crystals were characterized by powder and single‐crystal X‐ray diffraction, scanning electron microscopy, microthermometry, and µ‐Raman spectroscopy. As for skeletal crystal, the formation of axial canals in rutile is attributed to a lack of nutrient due to the viscosity of the melt and the high growth rate along [001]. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Crystal growth of the intermetallic compound Nd2PdSi3

Nd₂PdSi₃ single crystals were grown by a vertical floating zone method with radiation heating at a zone traveling rate of 3 mm/h. The compound exhibits congruent melting behavior at a liquidus temperature of about 1790 °C. The actual crystal composition (35.3 ± 0.5) at.% Nd, (16.2 ± 0.5) at.% Pd, and (48.5 ± 0.5) at.% Si is slightly depleted in Pd and Si with respect to the nominal stoichiometry. Therefore, the gradual accumulation of these elements in the traveling zone led to a decrease of the operating temperature during the growth process. Single crystalline samples exhibit a large anisotropy due to the crystal electric field effect and order ferromagnetically below the Curie temperature T_C = 15.1 K. The [001] orientation was identified as the magnetic easy axis at low temperatures. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Flux growth and low temperature dielectric relaxation in piezoelectric Pb[(Zn1/3Nb2/3)0.91Ti0.09]O3 single crystals

Single crystals of Pb[(Zn_1/3Nb_2/3)_0.91Ti_0.09]O₃ (PZNT 91/9) have been grown by flux method after modifications in temperature profile, flux ratio and addition of excess ZnO/B₂O₃ which resulted in enhanced perovskite yield (more than 95%). Only a few crystals showed the presence of pyrochlore phase/variation in composition. A comparative characterization of these crystals were carried out in respect of piezoelectric charge coefficient d₃₃, dielectric constant, ac conductivity and hysteresis loop after cutting and poling the crystals along [001] direction. The total activation energy for conduction has been found to increase with Ti‐content in the sample. The effect of ZnO on growth behavior has been analyzed. A detailed analysis of PZNT (91:9) has been carried out at low temperature in respect of the various thermodynamic parameters related to the dielectric relaxation mechanism, like optical dielectric constant, static dielectric constant, free energy of activation for dipole relaxation, enthalpy of activation and relaxation time, have been calculated in the vicinity of transition temperature in the lower temperature region. The activation energy for relaxation at ‐10 and ‐49 °C have been found to be 0.09 and 0.02 eV respectively. The results were analyzed and a detailed dielectric analysis and low temperature relaxation behavior of PZNT crystals were interpreted. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

MOVPE growth of GaAs on Ge substrates by inserting a thin low temperature buffer layer

High quality GaAs layers have been grown by low pressure MOVPE on Ge(001) and Ge(001) 9° off oriented in [110] direction by using a thin low temperature (LT) GaAs layer. Investigations of the initial growth step were performed at different V/III ratios and temperatures. To show the good buffer layer quality solar cell structures were grown on off oriented n‐Ge(001) and n‐GaAs(001) substrates. The surface morphology was studied by atomic force microscopy which showed the step‐flow growth mode on 1.2 µm thick GaAs/Ge structures. The crystalline qualities of this structures and the smooth surface morphology were investigated by double crystal X‐ray diffraction (XRD) and atomic force microscopy (AFM). (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Induced growth of Pb0.97La0.02(Zr0.66Sn0.27Ti0.07)O3 antiferroelectric single crystals with a platinum wire

Relaxor antiferroelectric (Pb,La)(Zr,Sn,Ti)O₃ (PLZST) with the composition near the morphotropic phase boundary shows excellent electrical properties. However, the crystal growth of PLZST is limited by the incongruent melting of the materials. Crystal growth of PLZST was induced by a platinum wire in the flux solution with 50 wt% PbO‐PbF₂‐B₂O₃ as a solvent. The obtained PLZST single crystals are optical transparent with light yellow color. The size of the crystals in regular rectangular shape varies from 0.5 mm to 1 mm. The PLZST single crystals exhibit tetragonal phase structure. The element contents of the crystals were measured by inductively coupled plasma atomic emission spectrometry. The results show that the composition of as‐grown crystals is a little bit deviated from the starting composition. The single crystals show two dielectric peaks at 115 °C and 182 °C, corresponding to antiferroelectric‐ferroelectric and ferroelectric‐paraelectric phase transitions. The dielectric data of as‐grown crystals indicate there is typical relaxor behavior near 182 °C. The value of relaxor factor n is 1.49642.     

Growth and characterization of magneto‐optical YFeO3 crystals

The floating zone growth of magneto‐optical crystal YFeO₃ has been investigated. The polycrystalline feed rod was prepared by a pressure of 250MPa and sintering at about 1500°C. A crack‐ free YFeO₃ single crystal has been successfully grown. The crystal preferred to crystallize along <100> direction with about 10° deviation. The X‐ray rocking curve of the crystal has a FWHM of 24 arcsec, confirming the high crystal quality of the sample. The (100) plane was etched by hot phosphoric acid and the dislocation density was about 10⁴/cm². A thin outer layer with Y₂O₃‐rich composition was found at the periphery of as‐grown crystals, which was attributed to the Fe₂O₃ evaporation during growth. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Low‐temperature elastic and dielectric properties of K3Na(SO4)2 crystals

Elastic and dielectric properties of glaserite K₃Na(SO₄)₂ single crystal were examined using the method of composite oscillators, Brillouin light scattering methods and dielectric spectroscopy. Measurements were performed in the temperature range from 18 K to 300 K. Anomalies in the temperature dependencies of Brillouin shift and dielectric permittivity at about 70 K confirmed the earlier predicted phase transition at 75 ± 25 K. Temperature dependences of the resonance frequency of the vibrating composite oscillator, Brillouin shift measured in the [110] direction, components of dielectric permittivity tensor reveal an anomaly at about 50 K. Moreover, thermal hysteresis of the dielectric permittivity suggested the presence of an incommensurate state between T ₁ = 50 K and T ₂ = 70 K. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Effect of different solvents on the habit of meta‐nitroaniline single crystals

The habit of the organic non‐linear optical material meta‐nitroaniline (mNA) crystallized from different organic solvents such as acetone, benzene, ethyl acetate, n‐hexane, methanol and toluene were studied. Solubility of mNA in these solvents at various temperatures in the range between 288 and 323 K was determined by gravimetric method. Crystals were grown by restricted evaporation of solvents method. Solutions with different solvents having different chemical nature and polarity yielded crystals with different habits: one‐dimensional needles, two‐dimensional rhombic platelets and three‐dimensional octahedral. In addition, the mNA crystals show unidirectional growth behaviour along its polar [001] direction irrespective of the solvents used. All the grown crystals were found to be orthorhombic system with point group mm2 and space group Pbc2₁ which was confirmed by powder X‐ray diffraction study. Optical transmittance study showed that the grown mNA single crystals have optical transparency in the wavelength range between 430 and 1550 nm. SHG efficiency of the grown mNA crystal was 3 times grater than KDP. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Thermal conductivity and refractive indices of Nd:GdVO4 crystals

The thermal conductivities of Nd:YAG, M(Y,Gd)VO₄ crystals were measured at 298 K. The value of Nd:GdVO₄ crystal along <001> direction was 11.4 W/mK, which was higher than that of YAG crystal measured to be 10.7 W/mK. The principal refractive indices of Nd:GdVO₄ crystal in the temperature range from 20 °C to 170 °C were determined by auto‐collimation method. Based on the measured values of refractive indices, the Sellmeier equation and expression of temperature dependence of refractive indices have been obtained. The measured results show that the birefringence Δn is 0.22007 at 20 °C and temperature coefficient of birefringence is 4.33 × 10⁻⁶/°C for 1.064 μm. These results prove that the GdVO₄ crystal is a laser crystal with excellent thermal and birefringence properties. (© 2003 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Low temperature epitaxial growth of Ge on CaF2 buffered cube-textured Ni

Quasi-single crystal Ge films were grown on cube textured Ni substrate at a temperature of 350 °C using an insulating buffer layer of CaF₂. A direct deposition of Ge on Ni at 350 °C was shown to alloy with Ni. From x-ray pole figure analysis, it was shown that Ge grew epitaxially with the same orientation as CaF₂ and the dispersions in the out-of-plane and in-plane directions were found to be 1.7±0.1° and 6±1°, respectively. In the out-of-plane direction, Ge[111]6CaF₂[111]6Ni[001]. In addition, the Ge consisted of four equivalent in-plane oriented domains such that two mutually orthogonal directions: Ge〈2?11〉 and Ge〈01?1〉 are parallel to mutually orthogonal directions: Ni〈1?10〉 and Ni〈1?1?0〉, respectively, of the Ni(001) surface. This was shown to originate from the four equivalent in-plane oriented domains of CaF₂ created to minimize the mismatch strain between CaF₂ and Ni in those directions.     

Unidirectional growth of α‐NiSO4·6H2O crystal by Sankaranarayanan–Ramasamy (SR) method

Large cylindrical [001] direction α‐nickel sulphate hexahydrate crystal with 20 mm diameter and 140 mm length was grown from an aqueous solution by uniaxially solution‐crystallization method of Sankaranarayanan–Ramasamy (SR). The grown crystal was examined by X‐ray diffraction, UV‐Vis‐NIR spectroscopy and TGA/DTA analysis methods.     

Investigation of X‐ray Satellite Reflections Attributed to Antiphase Boundaries in Epitaxial (Ga,In)P Layers grown on (001) GaAs Substrates

We report on the analysis of additional X‐ray reflections that probably arise from antiphase domain boundaries within (Ga,In)P/(001) GaAs heteroepitaxial layers. Due to the preferred cation ordering along the crystallographic directions [1‐1 1] and [‐1 1 1] which belong to the [110] zone the original sphalerite‐type structure of (Ga,In)P changes into a CuPt‐like of the cation sublattice. This ordering phenomenon causes a loss of symmetry, i.e. the cubic structure is converted into a rhombohedral one. The antiphase boundaries between ordered domains are assumed to behave similar to lattice planes at X‐ray diffraction. Therefore, additional reflections may occur spatially neighboured to the [001] direction. The presented results of X‐ray experiments are discussed in relation to TEM experiments published in the literature in order to explain the origin of the satellite reflections. In the case of the investigated samples (grown on GaAs substrates misoriented 2° towards the azimuthal [010] direction) the APBs run preferentially in directions tilted up to angles of 20° with respect to growth direction. A preferential occurrence of satellite reflections in <13 2 1> directions was observed coinciding with {13 2 1} "lattice planes" whose normals enclose the same angle to the [001] growth direction as the normals of the average planes characterized by APBs. The appearence of the phenomenon in other directions that are also spatially neighboured to the <13 2 1> directions was determined on the basis of the shift of the reflection positions due to tilting the sample around an axis geometrically included in the scattering plane.     

Growth of ZnO single crystals by an induced nucleation from a high temperature solution of the ZnO‐PbF2 system

To grow ZnO single crystals from a high temperature solution of the ZnO‐PbF₂ system, a gas cooling system was assembled at the bottom of the crucible to induce nucleation in the initial growth stage. The growth experiments were carried out in a homemade vertical Bridgman furnace and Pt crucible of 28 mm in diameter was used. The furnace temperature was set to 1100°C and the flow rate of the oxygen gas was optimized as 3.0 l/min. ZnO crystal up to 5∼8mm in the thickness was obtained with the lowering rate of 0.3 mm/h. XRD patterns showed that the as‐grown crystal was pure ZnO Wurtzite phase. The impurity ions were analyzed by the glow discharge mass spectroscopy (GDMS) as 390.0 ppm and 40.0 ppm for Pb²⁺ and F^‐, respectively. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Growth and characterization of highly c‐axis textured SrTiO3 thin films directly grown on Si(001) substrates by ion beam sputter deposition

Highly c‐axis textured SrTiO₃ (STO) thin films have been directly grown on Si(001) substrates using ion beam sputter deposition technique without any buffer layer. The substrate temperature was varied, while other parameters were fixed in order to study effect of substrate temperature on morphology and texture evolution of STO films. X‐ray diffraction, pole figure analysis, atomic force microscope, and high‐resolution electron microscopy were used to characterize and confirm quality and texture of the STO films. The experimental results show that optimum substrate temperature to achieve highly c‐axis textured films is at 700 °C. The full width at half maximum (FWHM) of 002_STO was found to be 2° and fraction of (011) orientation was as low as 1%. The surface morphology was Volmer‐Weber growth mode with a small roughness ∼1 nm. The lowest leakage current density (5.8 μA/cm² at 2 V) and the highest dielectric constant (ε_STO ∼ 98) were found for highly c‐axis textured films grown at 700 °C. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Growth,composition, ferroelectric and magnetic properties of new multiferroic Pb3.3Mn4.8Ni1.1Ti0.56O15.3 single crystals

Multiferroic single crystals in the novel system Pb‐Mn‐Ni‐Ti‐O have been grown by the high temperature solution growth method. At room temperature the crystals are indexed in the hexagonal space group P6₃cm. The dielectric and magnetic properties along with the temperature dependence of the c‐lattice parameter have been studied in the temperature range 2 K ‐ 500 К. The magnetic measurements reveal a paramagnetic to antiferromagnetic phase transition around 48 K. The dielectric permittivity exhibits a maximum at 430 K, indicating ferroelectric to paraelectric phase transition. The temperature dependent Raman and XRD measurements around 430 K reveal an anomaly and abrupt change of the lattice parameter along the z‐axis respectively, thus confirming the ferroelectric‐to‐paraelectric phase transition.