纳米非晶碳薄膜的制备及其场致电子发射特性

采用微波等离子体增强化学气相沉积(MPECVD)法,在涂有FeCl3的硅衬底上制备出了纳米非晶碳薄膜.通 过SEM、XRD和拉曼光谱分析了薄膜材料的形貌和结构.并研究了薄膜材料的场发射特性.结果表明:薄膜的开启电场仅为0.39 V/μm;当电场强度为1.85 V/μm时,电流密度高达3.06 mA/cm2;且场发射点均匀、密集、稳定.迭代法计算表明薄膜材料的功函数为3.1 eV,发射点密度约为1.7×105个/cm2.这些均表明该薄膜是一种性能优良的场发射阴极材料.     

纳米石墨和纳米碳管薄膜在低电场下的稳定场发射

采用微波等离子体化学气相沉积法(MPECVD)制备出了纳米石墨和纳米碳管混合薄膜材料.通过扫描电镜(SEM)和拉曼光谱(Raman)对薄膜材料的结构和形貌进行了分析.研究了薄膜材料的场发射性能.场发射结果显示:其开启电场为0.7 V/μm1,在较低电场下(3.7 V/μm1)即可获得5.2 mA/cm2的电流密度,此电场下发射点密度可达1.6×107 cm-2,发射点均匀,亮度稳定.迭代法计算结果表明制备的纳米石墨和纳米碳管混合薄膜材料的功函数仅为3.2 eV.这些表明该薄膜材料为优良的场发射冷阴极材料.     

无电镀沉积于硅衬底上铜纳米晶的场发射性能

采用无电镀沉积技术在经过机械抛光的单晶硅衬底上沉积了铜纳米晶.利用X射线衍射数据,估算出所沉积铜纳米晶的平均粒径大约为40nm.对120s无电镀沉积样品的场发射测试表明,该样品的开启场强为～5.5V/μm,在场强达到9.26V/μm时的场发射电流密度可达到62.5μA/cm2.对相应的沉积过程和场发射机理进行了分析.结果表明,无电镀沉积技术有可能成为制备具有较好场发射性能的金属/硅冷阴极的一种可供选择的方法.     

电化学沉淀法制备纳米结构氧化锌的场发射特性

对电化学沉淀法制备的氧化锌纳米棒阵列,通过室温下真空场发射电流密度与外加电压关系的测量,研究其场发射特性.根据测量数据,基于 Fowler-Nordheim 方程,估算了样品场发射效应的增强因子,观察到其取值随外加电压变化具有反常的两阶段性,即当外电场强度在3.3 V/μm 场发射开启值到4.3 V/μm之间时,增强因子值为1339,外加场强大于4.3V/μm 时,增强因子锐减至296;结合样品的光致发光谱和能量散射谱,应用半导体中强电场效应、掺杂半导体中温度对费米能级、载流子浓度和迁移率影响,通过场发射电流密度测量系统的串联电路等效,分析了样品缺陷态对此两阶段性的决定和影响.     

单晶TiO2纳米线束阵列的水热合成及场发射性能研究

采用水热合成技术,以钛酸丁酯、盐酸和去离子水作为前驱物,在透明导电玻璃(FTO)衬底上合成了垂直于衬底牛长的二氧化钛(TiO2)纳米线束阵列.纳米线束呈四方柱状结构,宽度100～200nm,长度约3μm.HRTEM表明每根纳米线束实际上是由20～40根直径约为4～6 nm的细小纳米线聚集在一起而形成的.系统研究了盐酸浓度对纳米线生长的影响,分析了盐酸在晶体生长中的作用.研究了TiO2纳米线束阵列的场致电子发射特性,其场发射开启电场为5.7 V/ μm(对应电流密度10μA/ cm2),阈值电场为9.5 V/ μm,同时表现出较好的场发射稳定性.低的合成温度和好的场发射性能表明TiO2纳米线束阵列在场发射冷阴极器件上具有良好的应用前景.     

纳米金刚石薄膜的掺杂、表/界面调控及性能研究

本文综述了近年来国内外研究者在纳米金刚石薄膜的掺杂、导电性能、场发射性能和电化学性能等方面的工作,涉及化学气相沉积法制备n型纳米金刚石薄膜,离子注入掺杂纳米金刚石晶粒提高薄膜的n型导电性能,金属离子注入制备场发射性能良好的纳米金刚石薄膜,低剂量离子注入和晶粒表面氧终止态获得高迁移率n型电导,纳米金刚石/石墨烯复合结构的调控对其电学及电化学性能的影响,以及硼掺杂金刚石薄膜电极的微结构和电化学性能研究等。综合分析发现,晶粒掺杂和表界面协同调控可以提升薄膜的电学性能、场发射性能及电化学性能,为纳米金刚石薄膜在纳米电子器件、电化学电极等领域的应用提供了理论基础。     

水热生长时间对钼掺杂三氧化钨纳米棒阵列电致变色性能的影响

采用水热法,在不同水热生长时间条件下成功制备了钼掺杂三氧化钨纳米棒阵列.利用扫描电子显微镜(SEM)、能量色散谱仪(EDS能谱)以及X射线衍射(XRD)系统研究了生长时间对于制备得到的纳米棒阵列的微观形貌和组成的影响.结果表明:随着时间的延长,钼掺杂三氧化钨纳米棒阵列的平均尺寸、生长密度和取向性均有一定程度的提高.另外,探讨了不同时间对其电致变色性能的影响规律.当生长时间为6h时,所得钼掺杂的三氧化钨纳米棒阵列具有较大的光学调制(65.3;)以及较高的着色效率(87.3 cm2/C).     

银掺杂TiO2纳米管阵列的制备及其锂电性能

采用银镜反应对阳极氧化法制备的三维有序TiO2纳米管阵列进行Ag掺杂,利用X射线衍射仪(XRD)、扫描电子显微镜(SEM)以及X射线能量色散光谱仪(EDX)研究了复合Ag/TiO2纳米管阵列的微观结构及形貌;并进一步利用恒流充/放电、循环伏安(CV)及交流阻抗(AC)等方法测试其电化学性能.结果表明:复合Ag/TiO2纳米管的首次放电比容量为168 mAh/g,高于纯TiO2纳米管的118 mAh/g,且具有更好的稳定性能及倍率性能;性能改善的原因不仅得益于导电率的提高,而且得益于Ag作为负极材料时具有储锂活性.     

TiO_2纳米管阵列的制备及其光催化性能研究

采用阳极氧化法在钛箔上制备了TiO_2纳米管阵列,利用场发射扫描电子显微镜(FSEM)、X射线衍射仪(XRD)和紫外-可见分光光度计对TiO_2纳米管的形貌、结构和光学性能进行表征,详细考察了阳极氧化工艺参数对纳米管阵列形貌的影响,探讨了氧化钛纳米管阵列的形成机理,并对其光催化活性进行了测试,研究结果表明:在0.5 wt; HF和1 mol/L H3PO_4电解液中,控制氧化电压为20 V,反应60 min后,在钛箔表面可获得垂直导向的TiO_2纳米管阵列,管内径为60~80 nm,管壁厚约10 nm;600 ℃热处理后的TiO_2纳米管阵列薄膜对349.7 nm近紫外光和443.9 nm可见光有较强的吸收能力;煅烧温度对纳米管的晶型结构和光催化活性有显著影响.     

钇掺杂多孔结构氧化锌纳米棒的制备与性能研究

采用两步法在二氧化锡掺氟(SnO2:F,FTO)导电玻璃基板上制备出钇(Y)掺杂多孔结构氧化锌(ZnO)纳米棒,首先利用浸渍-提拉法在FTO导电玻璃基板上制备ZnO晶种层,然后利用水热法在ZnO晶种层上生长Y掺杂ZnO纳米棒.研究了不同浓度Y掺杂ZnO纳米棒的晶相结构、微观形貌、化学组成及光学性能.实验结果表明:所制备的Y掺杂ZnO纳米棒为沿c轴择优取向生长的六方纤锌矿结构,随着Y掺杂浓度的增加,ZnO纳米棒(002)衍射峰强度先增大后减小,纳米棒的平均长度由1.3μm增加到2.6μm.ZnO纳米棒的形貌由锥状结构向柱状结构演化,纳米棒侧面的孔洞分布密度增加.所制备的Y掺杂ZnO纳米棒具有一个较弱的紫外发光峰和一个较强的宽可见发光峰.所制备样品的光学带隙随着Y掺杂浓度的增加而减小,其光学带隙在3.29～3.21 eV之间变化.利用Y掺杂ZnO纳米棒作为量子点敏化太阳能电池的光阳极可极大提高太阳电池的光电转换效率.     

CsI-LiCl共晶材料的坩埚下降法生长与闪烁性能研究

本文采用坩埚下降法,在真空密封的石英坩埚中成功生长出CsI-LiCl与CsI-LiCl:Na共晶闪烁体。通过扫描电子显微镜(SEM)观察晶体微结构表明该共晶中LiCl相与CsI相存在周期性的层状排列,CsI相的厚度在5 μm左右。共晶样品的X射线激发发射谱显示在CsI-LiCl和CsI-LiCl:Na共晶样品存在缺陷发光,在CsI-LiCl样品中还观察到了纯CsI的自陷激子(STE)发光。CsI-LiCl样品在α粒子激发下的多道能谱中观察到明显的全能峰,这一结果证明CsI-LiCl共晶可用于热中子探测的潜力。     

静电纺丝法制备CeO2微纳米纤维及其除氟性能

以聚丙烯腈(PAN)为载体,六水合硝酸铈[Ce(NO₃)₃·6H₂O]为原料,采用静电纺丝法制备了Ce(NO₃)₃/PAN纤维,在空气中热处理得到CeO₂微纳米纤维,通过XRD、BET和SEM对CeO₂微纳米纤维进行表征。采用静态吸附实验探讨了CeO₂微纳米纤维去除水溶液中氟离子的性能,考察了溶液pH值、初始氟离子浓度及共存阴离子等对吸附性能的影响。结果表明,pH=3时,CeO₂微纳米纤维对F^-的吸附性能最佳,CeO₂吸附量随着F^-浓度的增大呈上升趋势。CeO₂微纳米纤维对F^-的吸附等温线遵循Langmuir模型,二级动力学模型能很好地描述CeO₂微纳米纤维对F^-的吸附过程。CeO₂微纳米纤维的除氟性能优良,可为其实际应用提供理论参考。     

X-ray analysis of sideroxol from <Emphasis Type="Italic">Sideritis leptoclada</Emphasis>

Sideroxol (1), a kaurane diterpene which has the ent-7α,18-dihydroxy-15β,16β-epoxykaurane structure (MW = 320.47, C₂₀H₃₂O₃) was obtained from the acetone extract of Sideritis leptoclada plant as well as from some other Sideritis species. It crystallizes in the orthorhombic space group P2₁, 2₁, 2₁ with a = 10.967(3), b = 24.555(5), c = 6.372(4) Å, Dc = 1.240 g cm⁻³, Z = 4, and refines to R = 0.065 for 721 independent reflections. The skeleton consists of three fused six-membered rings and a five-membered ring with fused epoxide. The six membered rings exhibited slightly distorted chair conformation. In addition to sideroxol, two kaurane and five kaurene diterpenes were isolated from the hexane and acetone extracts of the studied plant.     

New zeotype borophosphates with chiral tetrahedral topology: (H)0.5M1.25(H2O)1.5[BP2O8]·H2O (M = Co(II) and Mn(II))

Two new isostructural open‐framework zeotype transition metal borophosphate compounds, (H)_0.5M_1.25(H₂O)_1.5[BP₂O₈]·H₂O (M = Co(II) and Mn(II)) were synthesized by mild hydrothermal method. The structure of compounds were characterized by single‐crystal X‐ray diffraction which have ordered, alternating, vertex‐sharing BO₄, PO₄, and (MO₄)OM(H₂O)₂ groups with hexagonal, P 6₁ 2 2 (No 178) space group and unit cell parameters for Co a = 9.4960(6) Å, c = 15.6230(13) Å, for Mn a = 9.6547(12) Å, c = 15.791(3) Å, Z = 1 for both of them. TGA/DTA analysis, IR spectroscopy were used for characterization. Magnetic susceptibility measurements for both of the compound indicate strong antiferromagnetic interaction between metal centers. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Photoluminescence characteristics of Mg- and Si-doped GaN thin films grown by MOCVD technique

We have studied the optical, structural and surface morphology of doped and undoped GaN thin films. The p- and n-type thin films have been successfully prepared by low-pressure MOCVD technique by doping with Mg and Si, respectively. The different carrier concentrations were obtained in the GaN thin films by varying dopant concentrations. Photoluminescence (PL) studies were carried to find the defect levels in the doped and undoped GaN thin films at low temperature. In the undoped GaN thin films, a low intensity and broad yellow band peak was observed. The donor–acceptor pair (DAP) emission and its phonon replicas were observed in both the Si or Mg lightly doped GaN thin films. The dominance of the blue and the yellow emissions increased in the PL spectra, as the carrier concentration was increased. The XRD and SEM analyses were employed to study the structural and surface morphology of the films, respectively. Both the doped and the undoped films exhibited hexagonal structure and polycrystalline nature. Mg-doped GaN thin films showed columnar structure whereas Si-doped films exhibited spherical shape grains.     

Solubility of Ag2O into the Na2O–B2O3–Al2O3 system

The solubility of Ag₂O was measured for the Na₂O–B₂O₃ and Na₂O–B₂O₃–Al₂O₃ system with the rotating crucible method and static method, respectively, under air atmosphere at temperatures ranging from 1273 to 1423 K. The contamination of melts from crucibles could be avoided by the rotating crucible method, with which it became possible to measure the solubility of Ag₂O for the Na₂O–B₂O₃ system above the melting point of Ag for the first time. It was found that the addition of Na₂O decreases the solubility of Ag₂O while the addition of Al₂O₃ had little effect on the solubility. The effect of Na₂O and Al₂O₃ on the solubility of Ag₂O is expressed by interaction coefficients and is analyzed in terms of the basicity of melts. The solubility of Ag₂O in Na₂O–B₂O₃–Al₂O₃ melts increased with increased temperature. This phenomena was explained by a small enthalpy change in oxidation of silver.     

Considerations on the structure and physical properties of B2O3-SiO2 and GeO2-SiO2 glasses

Data of density, refractive index and thermal expansion coefficient for B₂O₃-SiO₂ and GeO_2-SiO₂ glasses have been analyzed. The volumes of the structural units are the same found for the vitreous B₂O₃, GeO₂ and SiO₂. The volume of any structural unit is constant over the entire composition region of the glass system. The same has been found for the differential refraction and unit refraction of the structural units in these glasses. Different features are observed for the differential expansion of the structural units. There is a considerable change with composition in the differential expansion of BO₃, GeO₄ and SiO₄ units. The effect is attributed to a change in the asymmetry of vibrations with the number of Si-O-B or Si-O-Ge linkages in the matrix. The thermal expansion coefficient is mainly determined by the contribution of B₂O₃ or GeO₂ in the concerned glasses.     

Molecular structure and crystal packing of uncomplexed 1,6-bis(N-cyano-p-methoxy-anilino)-2,4-hexadiyne, C22H18N4O2

The X-ray crystal structure of 1,6-bis(N-cyano-p-methoxy-anilino)-2,4-hexadiyne, C₂₂H₁₈N₄O₂, is determined. The crystal packing is dominated by phenyl stacking interactions. Weak C–H···N hydrogen bonds help align the molecules. C–H··· hydrogen bonding is not apparent.     

Structural and electrical properties of vapour phase grown Cd1 − xFexTe single crystals

Cd_1 − xFe_xTe single crystals were prepared by vapour phase growth method in the composition range of 0 ≤ x ≤ 0.03. Chemical analysis, surface morphology, structural investigations and electrical properties were carried out by EDAX, SEM, XRD, TEM and transport technique, respectively. Microscopic variations between the target and actual compositions were noticed. Morphology studies revealed that dislocation aided growth is active in the present crystals. TEM and XRD studies confirmed that the samples of all compositions crystallized in zinc blende structure, and the lattice parameters varied almost linearly decreases with Fe content. At room temperature, the resistivity of the Cd_1 − xFe_xTe crystals of all compositions (x = 0.01, 0.015, 0.02, 0.025 and 0.03) lies in the range of 3.5-6.5 M Ω, the activation energies lie in the range of 63-133 meV, and the samples were show the ‘p’ type conductivity.     

空位浓度对纤锌矿CdS电子结构和光学性质影响的第一性原理研究

本文基于密度泛函理论的平面波超软赝势方法,采用第一性原理研究了含Cd空位缺陷CdS和含S空位缺陷纤锌矿CdS的几何结构、能带结构、电子态密度及光学性质。通过计算分析可知,含Cd空位缺陷的CdS体系均为p型半导体,含S空位缺陷的CdS体系跃迁方式均由直接跃迁变为间接跃迁。Cd、S空位缺陷的CdS体系的态密度总能量降低。空位CdS体系相较于本征CdS体系的静介电常数均有提高,并随着空位浓度的增大而增大,Cd空位缺陷体系更为明显,极化能力得到显著提升。空位Cd的CdS体系相较于本征CdS体系在红外波段存在明显的吸收,空位S的CdS体系相较于本征CdS体系在可见光波段存在明显的吸收。