白光在LiNbO_3∶Fe晶体中写入的任意折射率分布光波导

在理论分析Li NbO3∶Fe晶体中光致折射率变化分布与写入光的强度分布之间关系的基础上,提出了一种在该晶体中写入具有任意折射率分布光波导的新方法.利用由白光经电寻址空间光调制器得到的强度分布不同的片光辐照晶体,分别写入了折射率呈误差函数分布和平方律分布的光波导结构.采用干涉法测量了晶体中的光致折射率变化,并用推导出的折射率变化分布解析表达式很好地拟合了测量数据.实验结果表明,该方法是可行的.利用白光光源结合高分辨率的空间光调制器有望在多种光折变材料中制备出具有任意折射率分布的高质量光波导.     

白光在LiNbO3∶Fe晶体中写入的任意折射率分布光波导

在理论分析LiNbO3∶Fe晶体中光致折射率变化分布与写入光的强度分布之间关系的基础上，提出了一种在该晶体中写入具有任意折射率分布光波导的新方法.利用由白光经电寻址空间光调制器得到的强度分布不同的片光辐照晶体，分别写入了折射率呈误差函数分布和平方律分布的光波导结构.采用干涉法测量了晶体中的光致折射率变化，并用推导出的折射率变化分布解析表达式很好地拟合了测量数据.实验结果表明，该方法是可行的.利用白光光源结合高分辨率的空间光调制器有望在多种光折变材料中制备出具有任意折射率分布的高质量光波导.     

横向应力对保偏光纤偏振耦合特性的影响

在考虑到各向同性光纤和各向异性光纤在横向应力作用下介电常量变化量差别的条件下,利用弹光效应和折射率椭球得到了外界横向应力与保偏光纤介电常量变化量的关系.采用耦合模理论分析了横向应力作用下保偏光纤偏振耦合特性,数值模拟了横向应力大小、方向以及作用长度对偏振耦合强度的影响,应力作用方向与主轴(未受外力)成45°时,光纤受扰...     

应用于液压传感的光子晶体光纤特性

为实现结构紧凑、高灵敏度的光纤压力(液压)传感器,提出了一种应用于液压传感的边孔结构光子晶体光纤.基于全矢量有限元方法,研究了传统光子晶体光纤和边孔结构光子晶体光纤的有效折射、模式等特性以及在液压情况下的应力和应力特性.根据光弹效应给出了传统光子晶体光纤和边孔结构光子晶体光纤在液压情况下的折射率变化特性.模拟结果表明边孔结构光子晶体光纤可以获得更大的液压传感灵敏度,增大边孔半径可以提高液压传感灵敏度,因此结构优化的边孔结构光子晶体光纤可以实现高灵敏度的光纤压力(液压)压力传感器.     

应用于液压传感的光子晶体光纤特性

为实现结构紧凑、高灵敏度的光纤压力(液压)传感器,提出了一种应用于液压传感的边孔结构光子晶体光纤.基于全矢量有限元方法,研究了传统光子晶体光纤和边孔结构光子晶体光纤的有效折射、模式等特性以及在液压情况下的应力和应力特性.根据光弹效应给出了传统光子晶体光纤和边孔结构光子晶体光纤在液压情况下的折射率变化特性.模拟结果表明边孔结构光子晶体光纤可以获得更大的液压传感灵敏度,增大边孔半径可以提高液压传感灵敏度,因此结构优化的边孔结构光子晶体光纤可以实现高灵敏度的光纤压力(液压)压力传感器.     

温度对气体折射率的非线性影响

对测量群折射率的迈克耳孙白光干涉技术进行了改进,采用光栅线位移传感器提高反射扫描镜的位移精度. 实验确定了空气折射率对温度的非线性曲线拟合方程,其拟合因子的精度达到10-5℃-1.     

基于白光扫描干涉法的光纤折射率分布的测量

提出了一种光纤折射率分布的测量方法,采用白光扫描干涉技术,并在参考镜上构造与光纤样品相同的结构来克服白光相干长度短的限制,优化了光路,提高了干涉条纹间的对比度。采用与白光干涉信号的包络线呈高斯分布的Morlet小波作为小波变换的母小波进行拟合处理,得到光纤与已知折射率的匹配液之间的相对高度。通过计算获得光纤的折射率分布,并对获得的数据采用光纤折射率分布的经典函数进行拟合,得到多模光纤和单模光纤的决定系数分别为0.997 2和0.996 4。最后将实验获得的结果与官方参数进行比较,误差为0.01%,表明该种方法测量的精度较高,完全可以用来测量光纤的折射率。     

横向应力对保偏光纤偏振耦合特性的影响

在考虑到各向同性光纤和各向异性光纤在横向应力作用下介电常量变化量差别的条件下,利用弹光效应和折射率椭球得到了外界横向应力与保偏光纤介电常量变化量的关系.采用耦合模理论分析了横向应力作用下保偏光纤偏振耦合特性,数值模拟了横向应力大小、方向以及作用长度对偏振耦合强度的影响,应力作用方向与主轴（未受外力）成45°时,光纤受扰最敏感|输出消光比随力作用长度呈现周期性变化,力的作用大小不同,交换能量周期也不同|在应力大小部分区域输出消光比和横向应力大小成线性关系,结论与已有实验结果一致.     

白光干涉在保偏光纤测量与对轴中的应用

本文根据白光干涉原理，研究了保偏光纤偏振色散和耦合系数的测量，保偏光纤连接时主轴夹角的调整，并获得了满意的实验结果，还对白光干涉技术在保偏光纤传感和器件方面的应用作了初步的讨论。     

基于纤芯折射率增强的高双折射光子晶体光纤

通过增加光纤纤芯区域折射率实现了一种高双折射光子晶体光纤.采用全矢量有限元和平面波展开方法,系统地研究了这种高双折射光子晶体光纤在不同的高折射率区域参数(比如区域形状、折射率)情况下的光纤特性.模拟结果表明,光子晶体光纤的双折射可以在优化的参数条件下获得很大提高,光子晶体光纤的非线性系数(连同双折射)也可以同时得到提高.     

Direct measurement of group dispersion of optical components using white-light spectral interferometry

We present a simple white-light spectral interferometric technique employing a low-resolution spectrometer for a direct measurement of the group dispersion of optical components over a wide wavelength range. The technique utilizes an unbalanced Mach-Zehnder interferometer with a component under test inserted in one arm and the other arm with adjustable path length. We record a series of spectral interferograms to measure the equalization wavelength as a function of the path length difference. We measure the absolute group refractive index as a function of wavelength for a quartz crystal of known thickness and the relative one for optical fiber. In the latter case we use a microscope objective in front and a lens behind the fiber and subtract their group dispersion, which is measured by a technique of tandem interferometry including also a Michelson interferometer.     

光谱型椭偏仪对各向异性液晶层的测量

探讨了利用普通光谱型椭偏仪对各向异性液晶层进行综合性测量的可行性. 并利用法国Jobin Yvon公司的UVISEL SPME(Spectroscopic Phase Modulated Ellipsometer)光谱型椭偏仪测量了光学各向异性液晶层的折射率n_o和n_e及液晶层厚d，进一步利用椭偏仪在透射方式下测量了平行排列液晶层的光延迟特性Δnd，二者取得了很好的一致性，说明利用光谱型椭偏仪可以实现对光学单轴性液晶层及其他材料的测量，测厚精度为纳米量级. 关键词： 光谱型椭偏仪 各向异性 折射率 相位延迟     

Direct measurement of dispersion of the group refractive indices of quartz crystal by white-light spectral interferometry

We present a white-light spectral interferometric technique employing a low-resolution spectrometer for a direct measurement of the dispersion of the ordinary and extraordinary group refractive indices of a quartz crystal over the wavelength range approximately from 480 to 860 nm. The technique utilizes a dispersive Michelson interferometer with the quartz crystal of known thickness to record a series of spectral interferograms and to measure the equalization wavelength as a function of the displacement of the interferometer mirror from the reference position, which corresponds to a balanced non-dispersive Michelson interferometer. We confirm that the measured group dispersion agrees well with that described by the dispersion equation proposed by Ghosh. We also show that the measured mirror displacement depends, in accordance with the theory, linearly on the theoretical group refractive index and that the slope of the corresponding straight line gives precisely the thickness of the quartz crystal.     

基于飞秒光梳多路同步锁相的多波长干涉实时绝对测距及其非模糊度量程分析

飞秒光梳被广泛用于时间频率技术和精密光谱测量,由其时频特性所衍生的绝对测距技术以可溯源、大尺寸、高精度等优点有望成为未来长度计量的最重要手段.本文提出了一种基于飞秒光梳多路同步锁相的多波长干涉实时绝对测距方法,使多个连续波激光器通过光学锁相环技术同步锁定到飞秒光梳梳模上,通过多路同步相位测量和小数重合算法最终实现绝对距离测量.所提测量方法不仅能保留传统激光干涉测距的高分辨力和精度,而且可溯源至时间频率基准,对高精度长度测量、尤其是对物理复现“米”的定义具有重要计量意义.测距实验证明,四波长干涉测距的非模糊度量程达到44.6 mm,折射率波动导致非模糊度量程变化为纳米量级;多波长干涉测距的非模糊度量程也受制于空气折射率的测量误差,多波长干涉绝对测距的非模糊度量程在实验室环境下可达数米、甚至几十米,并通过2米线性位移实验证明了多波长绝对测距的大量程和线性测量性能.     

光电极值法结合外差干涉法监控膜厚的研究

光电极值法是光学薄膜厚度监测的常用方法,该方法在镀膜前引用块状材料的折射率设计膜系。而在实际镀制过程中,用于镀制光学薄膜的材料折射率会发生改变,从而给膜厚的监控带来误差。为了避免折射率变化的影响,采用外差干涉法测量折射率,将实际测得的薄膜折射率应用光电极值法监控薄膜的设计,从而减少了因材料折射率的变化引起的误差。以750nm截止滤光片的镀制为被测对象进行了实验,对制备的滤光片透射率光谱曲线进行了比较。结果表明,实际的透射率曲线与设计的透射率曲线吻合较好,两次实验曲线平均吻合度均在98%以上,系统稳定性很好,从而说明结合外差干涉法的光电极值监控法可以很好地克服折射率变化引起的误差。     

Spectral-domain tandem interferometry to measure the group dispersion of optical samples

A spectral-domain technique based on tandem interferometry is used for measuring the group dispersion of optical samples over a wide wavelength range. The technique utilizes a tandem configuration of a Michelson interferometer and an unbalanced Mach–Zehnder interferometer with a sample inserted into its test arm. First, the theoretical background of the technique is presented and then experiments with individual interferometers and their tandem configuration are specified. In all the experiments the spectral signals are recorded to measure the equalization wavelength as a function of the path length difference, or equivalently the group dispersion. We measure the group refractive index as a function of wavelength for a glass sample of known thickness and for a quartz crystal as well.     

A refractive index interferometry method based on the X-ray crystallography

The absorption contrast image is very low for those weakly absorbing materials or weak phase object, such as the soft biological tissues, however, the phase item value of refractive index is a thousand larger than the absorption item, therefore the refractive index interferometry method is expected to be a new imaging tool for them. An interferometry method based on the X-ray crystallography is explored to the measurement of refractive index in this paper. The theoretical foundation, the optical design, the crystal transistor performance are the key parts to this interferometry method based on the X-ray crystallography. We give out a special refractive index detection scheme, using a laboratory hard X-ray source, and four single Si crystals. With this instrument, refractive index profile of those weak phase object can be unfolded accurately using this method. This refractive index interferometry method based on the X-ray crystallography will provide a new research tool for those special material properties or biological tissues study.     

用光纤迈克耳孙干涉仪测量折射率

对测量群折射率的白光干涉和光纤迈克耳孙(Michelson)干涉仪技术进行了改进.采用样吕夹片和样品与探测纤端面接触的方法,可以使群折射率的测量过程简单化.根据反射峰宽度的变化,可以调整样品反射界面与光纤的准直性,提高测量精度.     

Direct measurement on transparent plates by using Fizeau interferometry

It is shown that Fizeau interferometry provides an accurate optical method to measure the refractive index and wedge angle of transparent plates used as optical components in different experiments. A near IR external cavity diode laser having spectral resolution up to 10⁻⁷ has been employed to measure the refractive index of the test plates by introducing amplitude modulation technique in the detection system of our phase shifting Fizeau interferometry. Detection of spatial fringes has been performed to find out the wedge angles of the plates by using a He–Ne laser along with the CCD-image sensor.     

Two-dimensional cell parameters measurement of nematic liquid crystal using optical interferometry and Fourier transform fringe analysis technique

We report a method for the measurement of nematic liquid crystal (NLC) cell parameters i.e., switching voltage, birefringence, retardation, dielectric anisotropy, average tilt angle and change in refractive index with applied DC voltage to LC material. The proposed method is based on optical interferometry and Fourier transform fringe analysis technique, in which we obtain 2-dimensional (2D) phase map of the interferograms as a function of applied voltage. Mach-Zehnder interferometer (MZI) was used for the study of cell parameters and interferograms were recorded at different applied DC voltages to NLC cell using CCD camera. From the phase map, 2D-refractive index distribution of the LC cell with applied voltage was reconstructed. Analytical equations are derived based on optical interferometry and then solved to obtain cell parameters. The present method is fast and can give 2D-cell parameters from only two quick interferograms.