Sm富勒烯的价带光电子能谱

用紫外光电子能谱和同步辐射光电子能谱研究了Sm掺杂C₆₀薄膜的价带电子结构.Sm的价电子大部分转移给C₆₀，化学键以离子性为主.对于任何化学配比都没有观察到费米边，所以Sm富勒烯超导相在室温下为半导体性质.获得了很接近单相Sm_2.75C₆₀的样品在费米能级附近的电子态密度分布.固溶相的光电子发射与Sm_2.75C₆₀有明显区别.Sm_xC_{60关键词： 60}的Sm填隙化合物')" href="#">C₆₀的Sm填隙化合物 价带光电子能谱 电子结构     

Yb掺杂C60薄膜的x射线光电子能谱研究

在超高真空系统中制备了C₆₀的Yb填隙化合物薄膜.用x射线光电子能谱研究了Yb和C₆₀结合过程中C 1s，Yb 4f和Yb 4d的变化.利用Yb 4f和C 1s的谱峰强度确定出相纯样品的化学组分接近Yb_2.75C₆₀，这一结果与晶体x射线衍射结果一致.Yb 4f和Yb 4d的峰形与峰位表明化合物中Yb的价态为Yb²⁺.相纯样品（Yb_2.75C₆₀）的C 关键词： 60的Yb填隙化合物薄膜')" href="#">C₆₀的Yb填隙化合物薄膜 x射线光电子能谱 Yb价态     

Yb2.75C60价带光电子能谱

用角积分紫外光电子能谱技术测量了Yb_2.75C₆₀薄膜的价带电子态密度分布.相纯Yb_2.75C₆₀样品通过C1s芯态x射线电子谱峰的位移表征.结果表明Yb_2.75C₆₀是半导体，在费米能级处几乎没有电子态分布.Yb 6s电子态和C₆₀LUMO能带的杂化效应不可忽略，有部分Yb 6s电子分布在Yb-C₆₀杂化能带上. 关键词： 2.75C₆₀')" href="#">Yb_2.75C₆₀ 电子能谱 电子态密度     

Rb掺杂C60单晶的相衍变和电子态

在C₆₀单晶超高真空解理面上制备C₆₀的Rb填隙化合物薄膜.用同步辐射光电子能谱研究了相衍变过程.观察到对应于固溶相、Rb₁C₆₀和Rb₃C₆₀的电子态密度分布.当数纳米厚Rb₃C₆₀薄膜在C₆₀单晶（111）解理面形成后，室温条件下进一步沉积Rb至样品表面不产生fcc到bct或bcc结构相变.C_{60 关键词： 4}C₆₀和Rb₅C₆₀吸附相')" href="#">金属性Rb₄C₆₀和Rb₅C₆₀吸附相 60单晶')" href="#">C₆₀单晶 相衍变 同步辐射光电子能谱     

Yb掺杂C60薄膜的x射线光电子能谱研究

在超高真空系统中制备了C60的Yb填隙化合物薄膜.用x射线光电子能谱研究了Yb和C60结合过程中C1s,Yb4f和Yb4d的变化.利用Yb4f和C1s的谱峰强度确定出相纯样品的化学组分接近Yb2.75C60,这一结果与晶体x射线衍射结果一致.Yb4f和Yb4d的峰形与峰位表明化合物中Yb的价态为Yb2+.相纯样品(Yb2.75C60)的C1s峰位相对于纯C60向低结合能方向移动约0.5eV.C1s结合能减小说明有Yb6s电子转移到C60的最低未充填分子轨道能带上.结合能变化大小及峰宽的具体数值为进一步在薄膜样品上研究Yb2.75C60提供了表征样品的手段.     

Bi2Sr2CaCu2-xSnxO8+δ系列 超导体的XRD和XPS研究

实验研究了Bi₂Sr₂CaCu_2-xSn_xO_8+δ 的X射线衍射(XRD)和光电子能谱(XPS).实验发现随着掺杂(Sn)量的增加,晶格参数a 和c都有所变化,O1s和Cu2p芯能级谱也发生了变化.实验结果表明： 在低掺杂量时,Sn主要 呈二价态;而在高掺杂浓度时呈四价态;掺Sn对超导电性的影响与其他元素的掺杂不同.这 些实验结果支持化学环境在高温超导样品的电子结构中起着重要作用的结论. 关键词： Bi系超导体 掺杂 X射线衍射 光电子能谱     

Rb掺杂C60单晶的相衍变和电子态

在C60单晶超高真空解理面上制备C60的Rb填隙化合物薄膜.用同步辐射光电子能谱研究了相衍变过程.观察到对应于固溶相、Rb1C60和Rb3C60的电子态密度分布.当数纳米厚Rb3C60薄膜在C60单晶(111)解理面形成后,室温条件下进一步沉积Rb至样品表面不产生fcc到bct或bcc结构相变.C60分子的大尺寸提供了表面填隙位置使得样品表面形成Rb4C60和Rb5C60吸附相.价带电子能谱结果表明这两种表面相为金属性.Rb 3d芯态电子能谱测量进一步证实了表面Rb4C60和Rb5C60吸附相的存在.     

Sb掺杂SrTio3透明导电薄膜的光电子能谱研究

用X射线光电子能谱和同步辐射光电子能谱研究了Sb掺杂的钙钛矿型氧化物SrTi1-xSbxO3(x=0.05,0.10,0.15,0.20)薄膜的电子结构.薄膜由紫外脉冲激光淀积在SrTiO3(001)单晶衬底上.该薄膜系列在可见光波段透明,透过率均超过90%.其导电性与掺杂浓度有关,当Sb掺杂浓度x=0.05时,薄膜显示金属型导电性.X射线光电子能谱和同步辐射光电子能谱研究结果表明,Sb掺杂在母化合物SrTiO3的禁带内引入了浅杂质能级和深杂质能级.浅杂质能级上的退局域化电子离化到导带中会产生一定的传导电 关键词： 光电子能谱 光学透过率 脉冲激光沉积薄膜     

R型铁氧体BaFe4-xTi2+xO11的化学组态以及磁性行为的研究

本文通过传统的固相反应法制备了R型六角铁氧体BaFe_4-xTi_2+xO₁₁ (x= 0, 0.25, 0.5, 0.75, 1), 并且对它的原子价态以及磁性行为进行了研究. X 射线光电子能谱(XPS)结果显示了随着掺杂含量的增加, 体系中Fe³⁺离子逐渐减少而Fe²⁺离子逐渐增加. 由于具有非对称结构的阻挫晶格中存在各种关联作用的竞争, 使得BaFe_4-xTi_2+xO₁₁体系表现出了复杂的磁有序行为, 在T₁～250 K和T₂～83 K两处存在磁转变. 对这一系列掺杂样品, 在相变温度T₁之上表现顺磁行为, 而在相变温度T₂前后的磁化强度都表现出低场下随磁场的增加快速增加, 高场下则线性变化且在5×10⁴ Oe时还未达到饱和的行为, 表明这一系列掺杂样品是典型的倾斜反铁磁态(canted antiferromagnetic) 或者亚铁磁态.     

辉光放电等离子体辅助XeCl准分子激光溅射沉积碳氮薄膜

利用直流辉光放电等离子体辅助的脉冲激光沉积技术在Si衬底上生长了碳氮薄膜.通过扫描电子显微镜、X射线衍射、X射线光电子能谱、俄歇电子能谱等多种手段,对薄膜的形貌、成分、晶体结构、价键状态等特性进行了分析和确定.结果表明,沉积薄膜为含有非晶SiN和晶态氮化碳颗粒结构,晶态成分呈多晶态,主要为α-C₃N₄相、β-C₃N₄相,晶粒大小为40—60nm.碳氮之间主要以C-N非极性共价键形式相结合. 关键词： 脉冲激光沉积 直流辉光放电 碳氮薄膜     

多晶样品SmxC60的电子输运性质研究

通过电阻和磁阻的测量，研究了多晶样品Sm_xC₆₀的电子输运性质．实验发现：Sm_xC₆₀的输运机制随ｘ的不同而发生变化．SmC₆₀的电阻率 温度关系可用涨落导致的隧道穿透模型解释，而Sm_2.75C₆₀的输运性质则可由弱局域化和电子-电子相互作用解释．Sm_2.75C₆₀的磁阻数据能用弱局域化和电子-电子相互作用模型很好地拟合，而SmC₆₀的磁阻数据则不能． 关键词：     

Electron attenuation lengths in fullerene and fullerides

Using X-ray photoemission measurements, we have determined the attenuation length of C 1s photoelectrons in C₆₀ film to be 21.5 Å with the incident photon energy of Mg Kα radiation. The inelastic mean free path calculated with the TPP-2M algorithm coincides fairly well with the experimentally determined attenuation length, indicating the validity of the algorithm to fullerene and fullerides. The inelastic mean free paths for some fullerides, i.e. K₃C₆₀, K₆C₆₀, Ba₄C₆₀, Sm_2.75C₆₀ and Sm₆C₆₀ are calculated to help the quantitative analyses of the photoemission spectra for these compounds.     

Raman spectra of samarium-fullerene intercalation compounds

Samarium-fullerene intercalation compounds of nominal composition Sm_xC₆₀ (x=1,2,…,6) have been synthesized by a solid-state reaction method. We obtain a Sm_2.75C₆₀ superconducting phase with orthogonal structure and a Sm₆C₆₀ phase with body-centered cubic structure. The broadening and weakening of Raman peaks of the Sm_xC₆₀ compounds are due to the distortion of C₆₀ and electron-phonon interaction. The Raman measurements reveal that the distortion of C₆₀ decrease in Sm_xC₆₀ (x=3,4,5) exposed to air, although the fulleride solids have transformed into an amorphous state. The Raman results also show that the distortion of C₆₀ is still very large in the Sm₆C₆₀ exposed to air, or the C₆₀ molecules have been destroyed and become some amorphous carbide.     

ESCA study of electronic structure of SmB6

The electronic structure of SmB₆ was investigated by X-ray photoelectron spectroscopy (XPS or ESCA). The spectrum of each core level of Sm in SmB₆ consists of three peaks. Such a splitting was not observed in Sm₂O₃, SmF₃, and SmB₄. The analysis of the results shows that three kinds of Sm ions — Sm²⁺(4f⁶), Sm²⁺(4f⁵5d^0.86s^0.2), and another Sm²⁺ — are present in SmB₆. The last kind of Sm ions is probably localized in a surface region.     

Phase relations of the (Pr1−xSmx)2Fe14B system

The phase relations in the (Pr_1?xSm_x)₂Fe₁₄B system in a whole concentration range have been studied by means of X-ray powder diffraction (XRD), differential thermal analysis (DTA) and scanning electron microscopy (SEM) equipped with energy-dispersive X-ray spectroscopy (EDS). The XRD patterns of the (Pr_1?xSm_x)₂Fe₁₄B samples have been refined by Rietveld method. These results reveal that all the alloys (Pr_1?xSm_x)₂Fe₁₄B are similar to the end member of the investigated system Pr₂Fe₁₄B with tetragonal structure (space group P4₂/mnm). The continuous solid solutions were formed in this system. The normalized lattice parameters and unit cell volumes of (Pr_1?xSm_x)₂Fe₁₄B solid solutions decrease linearly with x ranging from 0 to 1.0. The DTA measurements show that the peritectic temperature of (Pr_1?xSm_x)₂Fe₁₄B increases with increasing Sm content and no metastable phases are detected. Based on the DTA data, SEM–EDS and XRD results, the vertical section of Pr₂Fe₁₄B–Sm₂Fe₁₄B in the Pr–Sm–Fe–B system has been constructed.     

EPR of C60 thermal/photochemical reactions with polystyrene and polymethyl methacrylate

Thermal and photochemical free radical reaction products of C₆₀ with polymethyl methacrylate (PMMA) and polystyrene (PS) in orthodichlorobenzene solution were detected by EPR (electron paramagnetic resonance). Thermal radicals (<100°C) of C₆₀/PMMA and C₆₀/PS samples gave single line first-derivative EPR spectra withg=2.0029. Ultraviolet photolysis of a C₆₀/PMMA solid phase sample gave two radical species; whereas, photolysis of a C_60/PS solid phase sample gave only one free radical. EPR signals were also recorded for UV and thermal C₆₀ reaction with free radical initiator, azobis(isobutyronitrile).